Escalab xi x ray photoelectron spectrometer xps

X-ray diffraction (XRD) analysis was performed using an X-ray diffractometer (Rigaku, Japan). The analyses were performed in the scanning range of 2θ = 10–60° and at a scanning speed of 2.0° min⁻¹. Electron microscopes were used to carry out the morphological studies. A high-resolution transmission electron microscope (HRTEM JEOL, JEMCXII, Japan) was used to visualize the physical attributes of nanocomposites and their components at an operating voltage of 200 kV after coating the sample on a carbon-coated copper grid with 400 mesh (Ted-Pella Inc.). A Thermo Fisher Scientific (UK) ESCALAB Xi+ X-ray photoelectron spectrometer (XPS) was used in the study of the elemental state of the nanoparticles.

Transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images were collected on an FEI Titan G2 60-300 TEM operating at 300 kV. High angle annular dark-field scanning TEM (HAADF-STEM) images and STEM energy-dispersive spectroscopy (STEM-EDS) maps were collected on an FEI Talos F200X S/TEM at an accelerating voltage of 200 kV. All the samples for TEM analysis were drop-cast from a nanoparticle/hexane suspension onto 400-mesh molybdenum (Mo) grids with carbon/formvar film. Before the TEM measurements, all samples were treated with a plasma cleaner. A Bruker D8 Advance X-ray diffractometer using Cu Kα radiation (λ = 0.15418 nm) was employed to record the powder X-ray diffraction patterns of the samples. The chemical compositions of the samples were analyzed on a Thermo Scientific ESCALAB Xi X-ray photoelectron spectrometer (XPS). The absorption spectra of the samples from the ultraviolet (UV) to near-infrared (NIR) region were recorded on a Hitachi U-4100 UV-vis-NIR spectrophotometer.