Quattro s environmental scanning electron microscope

Atomic force microscopy (AFM) images were collected by Dimension 3000 AFM (Digital instruments) in light tapping mode. The X-ray diffraction (XRD) measurements of the samples were recorded on a Bruker D8-Advance X-ray powder diffractometer using Cu Kα radiation (λ = 1.5406 Å) with scattering angles (2θ) of 5–25°. The Raman spectra were obtained using a Renishaw inVia confocal Raman spectrometer mounted on a Leica microscope with a 50X objective and a 785 nm wavelength diode laser was employed as the illumination source. SEM images were obtained using Thermo Scientific Quattro S Environmental Scanning Electron Microscope (ESEM).

The X-ray diffraction (XRD) measurements of the samples were recorded on a Bruker D8-Advance X-ray powder diffractometer using Cu Kα radiation (λ = 1.5406 Å) with scattering angles (2θ) of 5-25°. Fourier transform infrared spectra were obtained using a Nicolet iS10 spectrometer in the range of 400- 4000 cm⁻¹ at resolution of 0.48 cm⁻¹ with averaging 100 scans. The Raman spectra were obtained using a Renishaw inVia confocal Raman spectrometer mounted on a Leica microscope with a 50X objective and a 785 nm wavelength diode laser was employed as the illumination source. The N₂ adsorption/desorption isotherms were acquired using Quantachrome Nova 2000E with liquid nitrogen. The surface area was calculated with Brunauer–Emmett–Teller (BET) equation, and the pore size distribution were calculated by Barrett–Joyner–Halenda (BJH) method. SEM images were obtained using Thermo Scientific Quattro S Environmental Scanning Electron Microscope (ESEM). Transmission images were obtained using a JEOL JEM-2100F field emission instrument (TEM).