Freeze-dried microspheres were prepared for SEM observation by sputtering the surface with gold using Balzers SCD 030 metalizer and obtaining layer thickness between 15 and 20 nm. Surface and morphology of microspheres were observed using Philips SEM 505 model (Rochester, USA), and processed by an image digitalizer program (Soft Imaging System ADDA II (SIS)).
Sem 505 model
Manufactured by Philips
Sourced in United States
The SEM 505 is a scanning electron microscope (SEM) model produced by Philips. It is a versatile instrument designed for high-resolution imaging and analysis of a wide range of samples. The SEM 505 uses an electron beam to scan the surface of a specimen, providing detailed information about its topography, composition, and other characteristics.
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5 protocols using sem 505 model
1
SEM Characterization of Freeze-dried Microspheres
2
SEM Analysis of Nanoparticle Morphologies
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SEM studies were performed using freeze-dried samples made by sputtering their surfaces with gold (Balzers SCD 030 metalizer) with a layer thickness between 15 and 20 nm.
Nanoparticle distribution and morphologies were observed using Philips SEM 505 model (Rochester, USA), and processed by an image digitalizer digitizer program (Soft Imaging System ADDA II (SIS)).
Nanoparticle distribution and morphologies were observed using Philips SEM 505 model (Rochester, USA), and processed by an image digitalizer digitizer program (Soft Imaging System ADDA II (SIS)).
3
Scanning Electron Microscopy of Microparticles
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SEM analysis of the freeze-dried microparticles was carried out. Samples were prepared by sputtering the surface with gold using an SCD 030 metalizer (Balzers, Liechtenstein), obtaining a layer thickness between 15 and 20 nm. The microparticle surface and morphology were observed using a Philips SEM 505 model (Rochester, USA), and processed by the SIS ADDA II digitizer program (Soft Imaging System, Lakewood, USA).
4
SEM Imaging of Sputtered Film Surfaces
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Samples were placed in glass slides and dried by the critic point technique. After that, the surface was sputtered with gold using a metalizer (BalzersSCD 030), obtaining a layer thickness in the range of 15 to 20 nm. Film surfaces and morphologies were observed by SEM (Philips SEM 505 model, Rochester, NY, USA). The images were processed by an image digitizer program (Soft Imaging System ADDA II).
5
Preparation and SEM Imaging of Samples
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Samples were firstly dried by the critic point technique. After that, the surface was sputtered with gold using a metalizer (Balzers SCD 030), obtaining a layer thickness between 15 and 20 nm. Film surfaces and morphologies were observed by SEM (Philips SEM 505 model, Rochester, NY, USA), and the images were processed by an image digitizer program (Soft Imaging System ADDA II).
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