Axis ultra dld spectrometer

Surface wettability was evaluated by measuring static water contact angle (WCA) (FTA-125, First Ten Angstroms, Newark, CA, USA). WCAs of at least six 5 μL droplets were measured for each sample. The surface chemical compositions of the substrates were characterized by X-ray photoelectron spectroscopy (XPS) analysis (AXIS Ultra DLD spectrometer, Kratos Analytical Inc., Manchester, UK) with a monochromated Al K—source at a power of 45 W. Each atom specimen was analyzed at the emission angle of 0° as measured from the surface normal. Data were processed using CasaXPS processing software (version 2.3.15, Casa Software Ltd., Teignmouth, UK). Binding energies were referenced to the aliphatic hydrocarbon peak at 285.0 eV.

The absorption spectra
from colloidal suspensions of nanoplatelets were acquired on Cary300
spectrophotometer. The photoluminescence spectra were collected instead
on a Cary Eclipse spectrofluorometer. Low magnification transmission
electron microscopy (TEM) and selected-area electron diffraction (SAED)
images were acquired on a JEOL JEM-1011 microscope equipped with a
thermionic gun at an accelerating voltage of 100 kV. The samples were
prepared by depositing a diluted suspension of nanoparticles on a
200-mesh carbon-coated copper grids. Energy dispersive X-ray spectroscopy
(EDS) measurements were performed at 25 kV on a JEOL JSM-6490LA scanning
electron microscope (SEM). X-ray photoelectron spectroscopy XPS measurements
were performed with a Kratos Axis Ultra DLD spectrometer. For XPS
analysis, high-resolution spectra were acquired at a pass energy of
10 eV using a monochromatic Al Kα source (15 kV, 20 mA). The
thickness of iridescent areas of the nanoplatelet films was quantified
using a ZETA-20 true color 3D optical profilometer, after the sample
surface was softly scratched with a tip of a pair of plastic tweezers.
All the crystal structure models presented in this work have been
built using VESTA, ver. 3.4.6.^{83 (link)}

Powder XRD measurements were taken on a Rigaku model Ultima IV diffractometer with Cu-Kα X-ray source. SEM images were collected on a FEI Nova Nano 230 scanning electron microscope. TEM equipped with EDS and SAED was conducted on a Tecnai G² F20 electron microscope. XPS was measured by a Kratos Axis Ultra DLD spectrometer. Inductively coupled plasma atomic emission spectrometer (ICP-AES) was performed on PerkinElmer Optima 83000. X-ray absorption fine structure spectra (Ni K-edge/Yb L-edge) were collected at BL14W beamline in Shanghai Synchrotron Radiation Facility (SSRF). The storage rings of SSRF were operated with a stable current of 200 mA at 3.5 GeV. With Si(111) double-crystal monochromator, the data collection was taken in Transmission mode using Lytle detector under ambient conditions.

The morphology of Ti₃C₂T_x/Ag was obtained using TEM (JEOL‐2010F). XRD experiments were conducted on specimens using an X‐ray diffractometer (Bruker D8 Advance, Bruker AXS) operating at 40 kV and 40 mA. Nickel‐filtered Cu Kα radiation (λ = 0.154 nm) was used in the incident beam. The water contact angle was measured by an optical contact angle measuring device (POWEREACH JC2000). An XPS analysis was carried out with a Kratos Axis Ultra DLD spectrometer using monochromatic Al Kα X‐rays at a base pressure of 1 × 10⁻⁷ Pa. Survey scans were conducted between 1100 and 0 eV and revealed the overall elemental compositions of the sample; additionally, regional scans for specific elements were performed. The peak energies were calibrated by placing the major C 1s peak at 284.6 eV.

The SEM measurements were performed on a scanning electron microscope (FESEM, JSM-7610F, 10 kV). The TEM and HR-TEM measurements were taken with a JEOL JEM-F200 microscope. The samples were prepared by dropping ethanol dispersion of samples onto carbon-coated copper TEM grids using pipettes and dried under ambient condition. The X-ray photoelectron spectroscopy (XPS) measurements were conducted on a Kratos Axis Ultra DLD spectrometer. The electron paramagnetic resonance (EPR) spectroscopy was probed by a Bruker E580 spectrometer at room temperature (295 K).

A FEI TF-20 instrument operating at 200 kV (FEI, Hillsboro, TX, USA) was used to obtain high resolution transmission microscopy (HRTEM) information. FTIR spectra were collected from 20 scans with a resolution of 4 cm⁻¹ by a Magna-IR560 unit (Nicolet Co., Madison, WI, USA). UV-vis. spectroscopy was performed on a UV-2550 spectrophotometer (Shimadzu, Kyoto, Japan) though a quartz cell with a 1 cm optical path. An LS-55 fluorescence spectrometer (PerkinElmer, Waltham, MA, USA) recorded the fluorescence. X-ray photoelectron spectroscopy (XPS) data for the N-CQDs powder deposited on copper substrates were measured by an AXIS Ultra DLD spectrometer (Kratos, Manchester, UK) with a monochromatized Al Kα X-ray source (1486.6 eV) for determining the composition and chemical bonding configurations.