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Fei quanta 250 feg

Manufactured by Thermo Fisher Scientific
Sourced in United States, France

The FEI Quanta 250 FEG is a scanning electron microscope (SEM) that provides high-resolution imaging and analysis capabilities. It features a field emission gun (FEG) source for enhanced resolution and brightness. The Quanta 250 FEG is designed for a wide range of materials characterization applications.

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73 protocols using fei quanta 250 feg

1

Serial Blockface SEM Imaging Parameters

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The EM data was collected on a 3View ultra-microtome (Gatan, UK) fitted to an FEI Quanta 250 FEG (Thermo Fischer Scientific). The imaging regimes were tailored to the sample being imaged as summarised in Table 2.

Serial Blockface SEM parameters used to collect the data sets presented in this paper.

Table 2
SampleAccelerating voltage (kV)Chamber pressure (Torr)Image frame (pixels)Pixel size (nm)Dwell time (ms)Slice thickness (nm)
Acini3.50.284000 × 400015560
Heart, Purkinje fibre3.80.45(1) 5000 × 5000303.5150
(2) 8192 × 5000
(3) 6750 × 5000
Trichuris, worm head3.80.476000 × 700013.473.360
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2

Triboelectric Nanogenerator Characterization

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Polymer structure was confirmed using Fourier-transform infrared (FTIR, Thermo Nicolet iS50, Thermo Fisher Scientific, Waltham, MA, USA) spectroscopy. Morphology of the fibers was examined using a field emission-scanning electron microscope (FE-SEM, Thermo Fisher FEI QUANTA 250 FEG). The nanofiber’s X-ray diffraction (XRD) patterns were measured using an X-ray diffractometer (Bruker D8 Advance, Mannheim, Germany) with a Cu Kα radiation source. An external pushing force was generated by an electrical pushing machine. VOC and ISC electrical output parameters were evaluated using a digital phosphor oscilloscope (DPO4104, Tektronix, Beaverton, OR, USA) with an input impedance of 40 MΩ. Furthermore, an oscilloscope was coupled to a low-noise current preamplifier (SR570, Stanford Research Systems, Stanford, CA, USA) for ISC measurement. Sensitivity of the TENG was measured using a BIOPAC System, Inc., Goleta, CA, USA MP150 connected to a measurement expertise Piezo Film Lab Amplifier (conditions: Rin of 100 MΩ and gain of 0 dB). These measurements were carried out for healthcare monitoring applications.
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3

Characterizing Polystyrene Micro/Nanoparticles

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Field Emission-Scanning electron microscope (FE-SEM) was used to determine and confirm the size and shape of PS. Aliquots of PS solution (1 mg/L) were kept on a piece of a glass slide, air-dried, sputter-coated with gold, and visualized through an electron microscope (operating voltage: 10.00 kV; working distance range: 9.4–10.7 mm) (Thermo Fisher FEI Quanta 250 FEG). To elucidate the charge on the MPs (1 and 12 µm), Zeta potential was evaluated at 0th h for all three differently functionalized MPs dispersed in lake water (90 Plus Particle Size Analyzer; software: Particle Size Analyzer, Brookhaven Instruments Corp., USA).
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4

Scanning Electron Microscopy of Au Nanospikes

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The scanning electron microscopy (SEM) is carried out by using a high performance scanning electron microscope (FEI Quanta 250 FEG, Thermo Fisher Scientific). Images are acquired at 20kV, with a magnification of 30,000 × and 100,000 × inside a vacuum chamber maintained at a pressure of 10−4Pa. The top view of the Au nanospike covered substrate is captured with the electron gun placed normal to the substrate, while the side view of the substrate is captured by tilting the substrate at 40°.
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5

SEM Analysis of Fracture Surface

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For the SEM investigations a FEI Quanta 250 FEG (Thermo Fisher Scientific, Hillsboro, OR) was used under high vacuum condition and a variable high tension from 5 to 10 kV. The micrographs were recorded with the Everhart-Thornley-Detector in secondary electron (SE) mode. The fracture surface was sputtercoated with a 10 nm thin layer of gold in order to provide sufficient electrical conductivity. The EDS measurements were performed for 60 s, with 20 kV high tension and a Spotsize of 4,5 with a 10 mm2 Apollo X Silicon Drift Detector by EDAX Ametek, NJ. USA, and Genesis Software V 6.53 from 21 September, 2018.
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6

Characterization of Synthesized Particles

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Morphology of the obtained particles was observed by scanning electron microscopy (SEM) on a Thermo Fisher Scientific FEI Quanta 250 FEG. Particle images were obtained operating in high vacuum mode (10−4 Pa to 30−3 Pa) on Au–Pt coated samples using secondary electrons detector (Everhart Thornley Detector, ETD) and acceleration voltage of 7 to 10 kV. Crystalline phases were determined by powder X-ray diffraction on a Philips X'Pert diffractometer (2θ range 15–100°) in the Bragg–Brentano geometry using Cu Kα radiation. The samples were placed on Si sample holders. Patterns were visualized using the X'Pert program HighScore.48 Infrared spectra were obtained from KBr pellets using FTIR Bruker Vector 22 in the wave range of 4000–450 cm−1 (50 scans acquisition, resolution 4 cm−1).
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7

Scanning Electron Microscope Imaging

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SEM investigations were performed on a FEI Quanta 250 FEG (Thermo Fisher Scientific, Hillsboro, OR) under high vacuum conditions and 20 kV high tension. The micrographs were recorded in secondary electron (SE) mode with the Everhart–Thornley detector. The disc surfaces of the material were sputter coated with a gold layer (10 nm) to provide adequate electrical conductivity. The energy-dispersive X-ray spectroscopy (EDX) data collection measurements took 60 s each at 20 kV high tension and a Spotsize of 4.5 with a 30 mm² Octane Elect Plus Silicon Drift Detector (EDAX Ametek, NJ, USA) and the APEX Standard Software (V1.3.1, 07/2019) was used.
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8

Evaluation of BG Particle Dispersion

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The morphology of each sample was observed using SEM (Thermo Scientific, FEI QUANTA 250 FEG, Hillsboro, OR, USA) to evaluate the particle dispersion of BG. The samples were cryo-fractured in liquid nitrogen. They were placed in adhesive carbon tabs (Agar, Stansted, UK) and observed at a low acceleration voltage (2 kV). Laboratory-developed software for image analysis was used to quantify the inter-particular distances and dispersion quality. The reported values of the layer thickness of C-HA formed onto the surface were the average of five different measurements made at different locations within the same layer.
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9

SEM Analysis of Material Discs

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SEM studies were performed under high vacuum conditions and 20 kV high voltage using an FEI Quanta 250 FEG (Thermo Fisher Scientific, Hillsboro, OR, USA). The micrographs were recorded with the Everhart–Thornley detector in secondary electron mode. To ensure sufficient electrical conductivity, the surfaces of the material discs were sputter-coated with a 10 nm thin gold layer. Energy dispersive X-ray spectroscopy (EDX) measurements were performed using a 30 mm2 Octane Elect Plus silicon drift detector from EDAX Ametek, (Berwyn, NJ, USA) and APEX Standard Software V1.3.1. The following settings were used: 60 s duration, 20 kV high voltage, and a spot size of 4.5.
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10

SEM Fracture Surface Characterization

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For the SEM investigations a FEI Quanta 250 FEG (Thermo Fisher Scientific, Hillsboro, OR) was used under high vacuum conditions and 20 kV high tension. The micrographs were recorded with the Everhart-Thornley-Detector in secondary electron (SE) mode. The fracture surface was sputtercoated with a 10 nm thin layer of gold in order to provide sufficient electrical conductivity. The conditions used in the energy-dispersive X-ray spectroscopy (EDX) experiments were as follows: 60 s, 20 kV high tension and a Spotsize of 4.5 with a 30 mm² Octane Elect Plus Silicon Drift Detector by EDAX Ametek, (NJ, USA) and APEX Standard Software V1.3.1 from 6th July 2019.
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