Jsm 7800f field emission sem

The X-ray diffraction (XRD) patterns of the NCP were obtained in a 2θ range of 0–90° on a high-resolution X-ray diffractometer. Transmission electron microscopy (TEM) was performed using a JEOL JEM-2100 TEM (JEOL, Tokyo, Japan). Raman measurements were taken using a micro-Raman system (LabRAM HR800, HORIBA Taiwan Inc., Hsinchu, Taiwan) with a helium–neon laser as the excitation source, operating at a 633 nm wavelength and equipped with a 40× objective lens. Scanning electron microscopy (SEM) was conducted using a JEOL JSM-7800 F field-emission SEM (JEOL, Tokyo, Japan). The thickness of the r-GO was measured using a non-contact Fizeau laser interferometer (ZYGO Verifire™ ATZ, AMETEK Taiwan Corp., LTD, Hsinchu, Taiwan).

Samples were mounted onto a conductive holder and coated with 5 nm Pt to provide conductivity for the glass substrate. Imaging was undertaken on a JEOL JSM-7800F field emission SEM (JEOL, Tokyo, Japan) with an electron energy of 20 kV and current density of 200 pA. Images were acquired in secondary electron scanning mode. The chemical analyses of the cross sections were performed using an Oxford Instruments Ultim energy-dispersive X-ray spectroscopy (EDS) detector with an AZTEC software (Ver 5.0) analysis package (Oxford Instruments Plc, Abingdon, UK), at a 10 mm working distance with the samples angled towards the detector to improve the signal.

Prior to imaging the samples were lyophilized (FreeZone benchtop freeze dryer, Labconco™, Fisher Scientific, Loughborough, UK), then sputter coated with a 10 nm layer of gold using a Quorum 150R ES. A JEOL JSM-7800F field emission SEM (JEOL, Welwyn Garden City, UK) operating at 10–15 kV was used to obtain SEM images.