The ultraviolet-visible-near infrared (UV-vis-NIR) absorption spectra of Au@PDA NPs and Au@PDA-RGD NPs were measured using a HITACHI UH4150 UV-vis-NIR spectrophotometer. The shape and morphology of Au@PDA NPs and Au@PDA-RGD NPs were obtained by TEM images using a Tecnai G220 transmission electron microscope. The powder X-ray diffraction (XRD) patterns of the products were carried out on a Bruker D8 advanced powder X-ray diffractometer with graphite monochromatized Cu Kα radiation. The particle size (diameter, nm) and zeta potential (potential, mV) were measured using a Zetasizer-Nano ZS from Malvern Instruments. Thermogravimetric analysis (TGA) was performed on a thermo gravimetric analyzer (Q500) under an air atmosphere at a heating rate of 10°C min−1 from 25 to 900°C. The photothermal heating effect of Au@PDA-RGD NPs was investigated using the CW diode laser (808 nm) and an infrared thermal imaging camera (Testo 865, IRS, Germany). The intracellular uptake of Au@PDA-RGD NPs was evaluated using Bio-TEM (JEM-1200EX). The quantitatively determine the uptake of Au in HepG2 cells was measured by inductively coupled plasma mass spectrometry (ICP-MS).
D8 advanced x ray powder diffractometer
Manufactured by Bruker
The D8-Advanced X-ray powder diffractometer is a laboratory instrument used for the analysis of crystalline materials. It employs X-ray diffraction techniques to identify and characterize the structural properties of a wide range of solid samples.
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Lab products found in correlation
Uh4150 uv vis nir spectrophotometer, by Hitachi (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Equinox 55, by Bruker (1 mentions)
Zetasizer nano, by Malvern Panalytical (1 mentions)
Cary 60 uv vis spectrophotometer, by Agilent Technologies (1 mentions)
Tensor 27 fourier transform infrared spectrometer, by Bruker (1 mentions)
Escalab 250 spectrometer, by Thermo Fisher Scientific (1 mentions)
Quanta 200, by Thermo Fisher Scientific (1 mentions)
5 protocols using d8 advanced x ray powder diffractometer
1
Characterization of Multifunctional Au@PDA-RGD NPs
2
Characterizing Urea, BC, and BCU Granules
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The chemical structures of the BCU granule (C:N=1.5), unmodified urea and BC were characterised using Fourier Transform Infrared Spectroscopy (FTIR), 13 C Solid State nuclear magnetic resonance (NMR) spectroscopy and powder X-ray diffraction (PXRD).
The FTIR spectra of very finely powdered samples were obtained in the wave length range of 400 to 4000 cm -1 with a FTIR spectrophotometer using the Attenuated Total Reflectance (ATR) technique. ATR spectra were acquired using a golden gate single bounce diamond ATR mounted in a nitrogen purged Bruker Equinox 55 FTIR spectrometer, equipped with a liquid nitrogen cooled mercury cadmium telluride (MCT) detector. The samples were kept in good optical contact on the diamond surface with a consistent application of low pressure. A background spectrum of a blank diamond was used to generate transmission spectra. Solid State 13 C NMR spectra were determined using a Bruker 100 ( 13 C) MHz spectrometer with cross polarisation-magic angle spinning (CP/MAS). Mineralogical and structural characteristics of urea, BC and BCU granules were determined by X-ray diffraction analysis of powdered samples using a Bruker D8 Advanced Powder X-ray Diffractometer at a scanning speed of 2°θ min -1 .
The FTIR spectra of very finely powdered samples were obtained in the wave length range of 400 to 4000 cm -1 with a FTIR spectrophotometer using the Attenuated Total Reflectance (ATR) technique. ATR spectra were acquired using a golden gate single bounce diamond ATR mounted in a nitrogen purged Bruker Equinox 55 FTIR spectrometer, equipped with a liquid nitrogen cooled mercury cadmium telluride (MCT) detector. The samples were kept in good optical contact on the diamond surface with a consistent application of low pressure. A background spectrum of a blank diamond was used to generate transmission spectra. Solid State 13 C NMR spectra were determined using a Bruker 100 ( 13 C) MHz spectrometer with cross polarisation-magic angle spinning (CP/MAS). Mineralogical and structural characteristics of urea, BC and BCU granules were determined by X-ray diffraction analysis of powdered samples using a Bruker D8 Advanced Powder X-ray Diffractometer at a scanning speed of 2°θ min -1 .
3
Structural and Spectroscopic Characterization of Novel Materials
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Powder X-ray diffraction (PXRD) data were collected on a Bruker D8-Advanced X-ray powder diffractometer (parallel X-ray, capillary-loaded) using a Cu Kα (λ = 1.5418 Å) radiation source. Samples were mounted in 0.5 mm glass capillaries and data collected for between 2θ of 2° to 52.94° with Phi rotation at 20 rotations per min at 1 second exposure per step at 5001 steps. The data were then converted into xye format and background-subtracted using WinPlotr 2000 software.48 Simulated powder X-ray diffraction patterns were generated from the single crystal X-ray data using Mercury 3.9.49
Scanning electron microscopy (SEM) images were collected using a Philips XL30 field emission scanning electron microscope (FESEM). Samples were dry loaded onto an adhesive carbon tab and sputter coated with 5 nm platinum thin film.
UV/Visible (UV/Vis) spectra were recorded at 30 °C on an Agilent Cary 60 UV/Vis spectrophotometer. Samples were diluted to 4 mL prior to each measurement.
Zeta potential measurements were recorded on a Malvern Zetasizer nano using a disposable folded cell capillary (DTS1070). Protein samples were dissolved in a HmIM solution (160 mM, pH 11) or MQ water (≈pH 7) with measurements recorded with the following parameters; Dispersant RI: 1.33, viscosity (Cp): 0.887, Dispersant dielectric constant 78.5, f(Ka): 1.5 (Smoluchowski approximation).
Scanning electron microscopy (SEM) images were collected using a Philips XL30 field emission scanning electron microscope (FESEM). Samples were dry loaded onto an adhesive carbon tab and sputter coated with 5 nm platinum thin film.
UV/Visible (UV/Vis) spectra were recorded at 30 °C on an Agilent Cary 60 UV/Vis spectrophotometer. Samples were diluted to 4 mL prior to each measurement.
Zeta potential measurements were recorded on a Malvern Zetasizer nano using a disposable folded cell capillary (DTS1070). Protein samples were dissolved in a HmIM solution (160 mM, pH 11) or MQ water (≈pH 7) with measurements recorded with the following parameters; Dispersant RI: 1.33, viscosity (Cp): 0.887, Dispersant dielectric constant 78.5, f(Ka): 1.5 (Smoluchowski approximation).
4
Comprehensive Characterization of Nanomaterials
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High-resolution transmission electron microscopy (HR-TEM) images were acquired on a Tecnai JEM-2100 (Japan Electronics Co., Ltd., Tokyo, Japan) equipped with a charge coupled device (CCD) camera (Gatan Bioscan, Pleasanton, CA, USA) at 100 kV with a point resolution higher than 0.19 nm. Fourier transform infrared (FTIR) spectra were recorded using a Bruker Tensor–27 Fourier-transform infrared spectrometer (spectral range between 4000 and 450 cm−1, Bruker Co., Billerica, MA, USA). Solution samples were dried by freeze drying. Thirteen samples were obtained and were measured at room temperature in the solid state using a single reflection diamond attenuated total reflectance. X-Ray diffraction (XRD) patterns were characterized using a Bruker D8 advanced X-ray powder diffractometer with Cu-Ka radiation (λ = 1.5418 Å). Scanning electron microscopy (SEM) images were performed on FEI Quanta 200 with accelerating voltage 20 kV. The X-ray photoelectron spectroscopy (XPS) were carried out by a Thermo Fisher Scientific ESCALAB 250 spectrometer (ThermoScientific Co., Waltham, MA, USA) with a pass energy of 20 eV and a power of 60W (=5 mA × 12 kV) under the Al Kα line (1486.6 eV).
5
In-Situ Synchrotron Powder XRD Studies
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Ex situ XRD study was carried out using a Bruker D8 Advanced X-ray powder diffractometer (Cu K-α), using a secondary beam monochromator. To protect samples from air, a special holder was covered with Kapton film, which was placed above the diffraction plane in order to obviate any possibility of the polymer’s influence on the XRD patterns. In situ synchrotron radiation powder XRD (SRPXD) was carried out at the MAX-II Beamline I711 facility (Lund, Sweden). The high-resolution diffractometer uses Debye–Scherrer geometry with monochromators (λ = 0.99242 Å) and an MAR 165 CCD detector [30 (link)].
For in situ studies, a high-pressure sample holder with pressure adjustment options was employed (Figure 10 ) [31 (link)]. Loaded inside sapphire capillaries, the sample could be heated with a tungsten coil, controlled via an external PID regulator. The actual temperature of the sample was measured with the thermocouple placed in the powder bed. FIT2D (V 12.077) software was employed to record the area detector data, integrating peaks and exporting patterns in the format of 2θ-Intensity [32 (link)].
For in situ studies, a high-pressure sample holder with pressure adjustment options was employed (
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