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Picoplus

Manufactured by Agilent Technologies
Sourced in United States, Germany

The PicoPlus is a high-precision laboratory instrument designed for analyzing and characterizing a wide range of materials and samples. It is a versatile tool that can be used for various applications, such as surface analysis, material characterization, and nanoscale imaging. The PicoPlus utilizes advanced technology to provide accurate and reliable data, making it a valuable asset in research and development laboratories.

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7 protocols using picoplus

1

Atomic Force Microscopy of OLR Colloids

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AFM
observations were made with a Pico
Plus instrument (Agilent Tech., Tempe, USA). The AFM samples were
prepared by slowly dispersing the OLR spherical colloids on a quartz
slide, followed by drying at room temperature for 24 h.
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2

Topographic Characterization of Nanostructures

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SEM gives a 2D image while AFM can provide a 3D topographic picture of prepared nano-systems. Agilent Pico Plus was used for this purpose. The AFM probe has a very sharp tip, often less than 100 Å diameter, at the end of a small cantilever beam. The probe is attached to a piezoelectric scanner tube. Inter-atomic forces between the probe tip and the sample surface cause the cantilever to deflect as the sample’s surface topography or other properties change. A laser light reflected from the back of the cantilever measures the deflection of the cantilever. Based on the type of application, different operation modes of AFM are used like the contact mode, semi contact mode and tapping mode (Suresh, 2015 ). However, for this study, all the images were taken in tapping mode at ambient conditions.
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3

Analyzing Au Nanoparticle Arrays by AFM

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The topography
of the prepared arrays of Au nanoparticles was measured by using atomic
force microscopy (PicoPlus from Molecular Imaging, Agilent Technologies,
Germany) with tapping-mode tips PPP-NCHR-50 (Nanosensors, Switzerland).
The obtained images were processed in open-source software Gwyddion
(version 2.47 from gwyddion.net).
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4

Atomic Force Microscopy of Amyloid Fibrils

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All imaging experiments were
carried out at room temperature in air with a Dimension 3000, Veeco,
Woodbury, NY, and a PicoPlus, Agilent atomic force microscope. Images
were acquired in the tapping mode with silicon (Si) cantilevers (spring
constant of 20–100 N/m) and operated below their resonance
frequency (typically 230–410 kHz). The images were flattened.
The contrast and brightness were adjusted for optimum viewing conditions.
Amyloid samples produced in solution were deposited on the surface
of freshly cleaved mica (Good Fellow) for 5 min (HEWL) and 30 min
(Aβ(1–40)). The mica pieces were washed 3 times with
200 μL of DI water and dried in a flow of N2 gas
at room temperature. The samples with surface-directed fibrils were
taken out from DI water and dried with a flow N2 gas prior
to imaging.
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5

Characterization of Co Oxide Morphology

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The morphology of the samples was characterized
with atomic force microscopy (Agilent PicoPlus) in a N2 atmosphere using the tapping mode. Silicon AFM tips with a cantilever
oscillating frequency of ∼190 kHz (μmasch) were used.
For each sample, different regions of the samples (at distances of
∼1 mm) were imaged to ensure that the observed morphology was
representative of the sample morphology. The measured images allowed
us to obtain the Co oxide coverage and roughness. Since the films
are composed of tightly packed islands, the film roughness obtained
by AFM depends on the tip sharpness and may be underestimated.
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6

Surface Characterization by XPS, SEM, and AFM

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XPS (Kratos AXIS 165 electron spectrometer, Japan) was employed to acquire quantitative information on the chemical species of the surface. XPS spectra were recorded with a Kratos AXIS 165 electron spectrometer (Japan) using monochromated Al Kα X-ray irradiation generated at 350 ​W. The standard take-off angle used for analysis was 45°, which produced a maximum analysis depth in the range of 3–5 ​nm. Low-resolution survey spectra were recorded in 0.5 ​eV steps with a 187.85 ​eV analyzer pass energy from 0 to 1400 ​eV. SEM images of the samples were recorded using a scanning electron microscope (Philips XL-30, Holland). The surface topography of each sample was determined using a D3000 AFM microscope with a Nanoscope IV controller (Agilent PicoPlus). The scanning area was 1.5 ​× ​1.5 ​μm to determine roughness on the nanoscale. Root mean square (RMS) roughness values were obtained as Rq using the instrument software NanoScope Analysis.
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7

Nanoparticle Array Structural Analysis

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Atomic force microscopy (PicoPlus from Molecular Imaging, Agilent Technologies) was used to investigate the morphology of nanoparticle arrays in the tapping mode. The average diameter was determined by analyzing the grain distribution of nanoparticle arrays using the free Gwyddion software. Additionally, scanning electron microscopy (Zeiss Supra 40 VP SEM) was employed to acquire complementary images.
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