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Carbon formvar copper grid

Manufactured by Agar Scientific
Sourced in United Kingdom

Carbon formvar copper grids are a type of specimen support film used in transmission electron microscopy (TEM). They consist of a thin layer of carbon deposited onto a formvar film, which is then mounted on a copper grid. The primary function of these grids is to provide a stable and uniform support for samples during TEM analysis.

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5 protocols using carbon formvar copper grid

1

Ultrastructural Analysis of U87 Cells

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It was performed on the microscopy platform IBiSA at the Institut Curie, Orsay, France. U87 cells were plated on microscopic glass slides. The samples were incubated with 1 mM GdBN during 1 hour. The slides were then rinsed with PBS 1X and fixed with a mixture of 2.5% glutaraldehyde and 4% paraformaldehyde diluted in PBS 1X. After rinsing with PBS 1X, the cells were dehydrated using ethanol in gradient concentrations and embedded step by step in Epon resin. After resin polymerisation, the samples were cut using an ultramicrotome in 100 nm-thick slices. The ultrathin sections were deposited on carbon-formvar copper grids (Agar scientific) and observed under Z-loos mode (10 eV window) in a JEOL 2200FS electron microscope operated at 200 kV. Measurements were performed for close to 20 U87 cells of 4 different slices. Additional Electron Energy Loss Spectroscopy (EELS) measurements were performed using an omega-filter.
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2

Quantifying Bacterial Piliation by Microscopy

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To analyse percentages of piliated cells, each HI strain was back-diluted and grown to OD600 0.1–0.5 in PY broth at 29°C 200 rpm. Cells were then stained with 2.0% phosphotungstic acid (PTA) on carbon formvar copper grids (Agar Scientific) and analysed for the presence/absence of a pilus structure, as described previously [26] (link).
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3

Visualizing C. difficile Flagella

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Electron microscopy was performed to examine the presence of flagella on the cell surface of the C. difficile strains. C. difficile cells from mid-exponential cultures were diluted in sterile water and then adsorbed onto carbon formvar copper grids (Agar Scientific Ltd., UK) for 5 min. After air-drying overnight, the grid was quickly washed once with sterile distilled water for 10 s. The air-dried grid was visualized using a JOEL JEM1010 transmission electron microscope operating at 80 kV.
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4

Visualizing Silver Nanoparticles via SEM and STEM

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SEM micrographs for free and encapsulated AgNP were obtained using a Hitachi SU-6600 field emission SEM (Hitachi, Maidenhead, UK) at an accelerating voltage of 25 kV and working distance of 8 mm. For SEM analysis, a 5 µL drop-cast of each sample was made onto a 5 × 5 mm pure silicon wafer substrate (Ted Pella Inc., Redding California, USA) 24 h prior to obtaining the micrographs and allowed to air dry. For STEM analysis, 3 µL of each sample was dropcast onto a carbon formvar copper grid (Agar Scientific Ltd., Stanstead, UK) 24 h prior obtaining and allowed to air dry.
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5

Characterization of Silver Nanoparticles by SEM

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SEM micrographs for free and encapsulated AgNP were obtained using a Hitachi SU-6600 field emission SEM (Hitachi, Maidenhead, UK) at an accelerating voltage of 25 kV and working distance of 8 mm. For SEM analysis, a 5 μL drop-cast of each sample was made onto a 5 × 5 mm pure silicon wafer substrate (Ted Pella Inc., Redding California, USA) 24 h prior to obtaining the micrographs and allowed to air dry. For STEM analysis, 3 μL of each sample was drop-cast onto a carbon formvar copper grid (Agar Scientific Ltd., Stanstead, UK) 24 h prior obtaining and allowed to air dry.
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