For Scanning Electron Microscopy (SEM), GBS cells were air dried, desiccated overnight and visualized with Field Emission Gun Scanning Electron Microscope (JEOL, USA) at an accelerating voltage of 5 kV. For Transmission Electron Microscopy (TEM), MV samples were applied to Formvar/Carbon film coated 200-mesh copper grids (Pacific Grid-Tech) and negatively stained with 2.5% uranyl acetate followed by visualization under Transmission Electron Microscope (FEI Technai, USA) (120 kV). For atomic force microscope (AFM), bacterial suspension was loaded onto poly-L-lysine coated coverslips and visualized under an atomic force microscope (Asylum Research, USA) under contact mode at a scanning rate of 1 Hz using silicon nitride cantilevers.
Atomic force microscope
Manufactured by Oxford Instruments
Sourced in United States
An atomic force microscope (AFM) is a high-resolution scanning probe microscopy technique used to study the surface properties of materials at the nanoscale. It works by using a sharp tip, mounted on a flexible cantilever, which is scanned across the sample's surface. The interactions between the tip and the sample's surface are measured and used to generate a detailed topographical image of the surface.
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4 protocols using atomic force microscope
1
Microscopic Characterization of GBS and MV
2
Morphological Analysis of GO/TPU Composites
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A Hitachi S-4800 scanning electron microscope, operated at an acceleration voltage of 15 kV, was used to observe the morphology of the GO and GO/TPU composites. An atomic force microscope (Asylum Research, USA), operated in contact mode, was used to determine the thickness of GO. Fluorescent and bright-field optical images were obtained by an Olympus TH4-200 microscope. A digital camera (Nikon D750) was used to take photos and record videos.
3
Atomic Force Microscopy Analysis of Tendon
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Atomic force microscope (Asylum Research, Santa Barbara, CA, USA) was used to analyze 15 µm sections of the tendon tissue from different groups. Micromorphological imaging of the tendon tissue was performed using a silicon probe (PPP‐NCLR‐20, Nanosensors, Neuchatel, Switzerland) with a force constant of 42 N/m and a resonance frequency of 161 kHz after the hydrated sections were naturally dried. All measurements were repeated for three positions of each tissue sample and the values were averaged.
4
Multimodal Characterization of Mxene-Cellulose Composites
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XRD [Bruker D8 Advance with Cu-Kα radiation (λ = 1.541874 Å], scanning electron microscopy (JEOL 7600F), a Spectrum GX FTIR spectrometer (PerkinElmer Inc.), transmission electron microscopy (JEOL 2010), and an atomic force microscope (Asylum Research) were used to characterize the structure, morphology, and composition of Mxene, cellulose, and their composites. The static force and strain generated by the actuators upon NIR light irradiation were measured on a universal a mechanical analyzer (DMA Q800). The wavelength range of the NIR lamp used in this study was from 650 to 1050 nm. For experiments on information encryption and display demonstration, local heating was performed by exposing selective MXCC shapes to NIR light; the other MXCC area was covered by a mask.
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