Varigatr
The VariGATR is a laboratory instrument designed for the analysis and characterization of various materials. It is capable of performing variable angle spectroscopic ellipsometry measurements, which can provide information about the optical properties and thickness of thin films and coatings. The VariGATR is a versatile tool that can be used in a wide range of research and development applications.
Lab products found in correlation
8 protocols using varigatr
FTIR Characterization of Thin Films
Multitechnique Surface Characterization
micrographs are
obtained using a Zeiss Ultra 60. Atomic force microscopy is performed
using a Bruker Dimension Icon. Water contact angle measurements are
taken with a Kruss DSA100E. Surface infrared spectroscopy measurements
are made using a Thermo-Fischer Nicolet iS50 FTIR equipped with variable
angle reflectance accessory by Harrick VariGATR and a germanium crystal.
The film thickness is measured with ellipsometry with a JA Woollam
M-20000 DI ellipsometer.
Antibody Immobilization on Functionalized ZnO Surface
Characterization of Functionalized PEEK Surfaces
All the spectra were recorded in the frequency range of 1,000-4,000 cm -1 at a resolution of 4 cm -1 and analyzed using Spectrum Express software (PerkinElmer). Static contact angle analysis was performed in an air atmosphere using a contact angle measurement instrument (DropMaster DM-501, Kyowa Interface Science, Saitama, Japan) for four types of PEEK surfaces: bare, MePRX-VBn-coated, UV light-irradiated, and UV light-irradiated MePRX-VBn-coated PEEK surfaces. All samples were washed with DMSO and ethanol and then dried at 60°C. A single water droplet (5 μL) was placed on each surface and monitored using a charge-coupled device camera at 23°C. The captured images were analyzed using FAMAS version 5.0.0 software (Kyowa Interface Science).
Multilayer Polymer Characterization
on a JA Woollam M-20000 DI ellipsometer using a Cauchy model for the
polymer layer. Infrared spectroscopy measurements were performed on
a Thermo-Fisher Nicolet iS50 FTIR equipped with a variable angle reflectance
accessory by Harrick VariGATR and a germanium crystal. X-ray photoelectron
spectroscopy (XPS) measurements were taken on a Thermo-Fisher K-Alpha
Plus XPS/UPS instrument with a monochromatic Al X-ray Source (1.486
eV). Survey spectra (1350 to −10 eV) were taken with 1 eV steps;
high resolution O 1s, N 1s, C 1s, and Si 2p spectra were taken with
0.1 eV steps.
FTIR Analysis of Coated Titanium Surfaces
Infrared Spectroscopy of MoS2 Nanosheets
Characterizing Protein Binding on Mo Surface
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