Ultra plus field emission gun scanning electron microscope

Elemental analysis was performed on a PerkinElmer automated model 2400 series II CHNS/O analyzer. TGA of the complexes was carried out at a 10 °C min⁻¹ heating rate using a PerkinElmer Pyris 6 TGA up to 600 °C in a closed perforated aluminum pan under N₂ gas flow. Powder diffraction patterns of the ternary systems and the solid solutions were recorded in the high angle 2θ range of 10–80° using a Bruker AXS D8 diffractometer equipped with a nickel-filtered Cu Kα radiation (λ = 1.5418 Å) at 40 kV, 40 mA at room temperature. The scan speed was 0.5 s per step at an increment of 0.01314. TEM analysis of the samples was carried out using a JEOL 1400 TEM, whereas HRTEM analysis was carried out on a JEOL 2100 HRTEM. Samples were prepared by placing a drop of the particles' dilute solution on Formvar-coated grids (150 mesh) for TEM, and holey carbon grids for HRTEM. The samples were allowed to dry completely at room temperature, viewed at accelerating voltages of 120 kV for TEM, and 200 kV for HRTEM. Images were captured digitally using a Megaview III camera; stored and measured using soft imaging systems iTEM software (TEM) and Gatan camera with Gatan software (HRTEM). SEM and EDX analyses were performed on ZEISS-Auriga Cobra SEM and ZEISS ultra plus field emission gun scanning electron microscope respectively.

Cells were treated for
3 h with 6.25–12.5 μM Os–C(W₅) in 96-well
polypropylene plates before being transferred to poly-l-lysine
coated coverslips. Samples were fixed with 2.5% glutaraldehyde/formaldehyde
and then underwent post fixation with 1% osmium tetroxide. Using 30,
50, 70, 90, and 100% ethanol, the samples were dehydrated and then
dried overnight in hexamethyldisilane. Samples were mounted with carbon
tape onto aluminum stubs, carbon coated, and viewed with an Ultra
plus field emission gun scanning electron microscope (Zeiss; Oberkochen,
Germany).