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Talos s200 microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Talos S200 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a high-brightness electron source, advanced optics, and a range of detection systems to capture detailed information about the surface structure and composition of samples.

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2 protocols using talos s200 microscope

1

Comprehensive Characterization of SPEx-MIONPs

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The characterization of SPEx-MIONPs involved a comprehensive approach utilizing various techniques [43 (link),44 (link),45 (link)]. Utilizing a Zeiss EVO scanning electron microscope (Pleasanton, CA, USA), scanning electron microscopy (SEM) was performed to examine the morphology and size of the nanoparticles. For a more detailed analysis of morphology and size, transmission electron microscopy (TEM) was conducted using a Talos S200 microscope (FEI, Hillsboro, OR, USA). Fourier transform infrared spectroscopy (FTIR, Nicolet iS50 FITR Spectrometer, ThermoFisher Scientific, Madison, WI, USA) played a crucial role in obtaining information about the structure of SPEx-MIONPs, enabling the identification of different bioactive functional groups and Fe-O bonds. X-ray diffraction (XRD) patterns, measured on a Bruker D8 Advance A25 diffractometer with a Cu anode (Bruker, sourced from Madrid, Spain), were utilized to confirm the oxide phase and crystallographic structure in the range of 2θ = [15–70°].
This advanced characterization aimed to validate and provide profound insights into the structural and morphological features of SPEx-MIONPs. The combination of SEM, TEM, FTIR, and XRD techniques ensured a comprehensive understanding of the nanoparticles’ properties, contributing to a thorough assessment of their structural integrity and potential applications.
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2

Crystalline Characteristics of Nanoparticles

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A TEM study was conducted to examine the crystalline characteristics of the size of nanoparticles. The observations were made at 200 kV through a TEM (Talos S200 microscope, FEI, Hillsboro, OR, USA). Images of GS-NPs and CS-NPs were evaluated through Image-J 1.53q free software [42 (link)].
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