Atomic force microscopy (AFM) is a technique for studying surface topography of thin film samples. By using AFM three-dimensional information of the measured surface can be obtained with a resolution up to the scale of the atomic lattice. In the present study, all AFM measurements were carried out using an Agilent 5500 atomic force microscope in an ambient atmosphere. Atomic force microscopy study was carried out in tapping mode using an Agilent 5500 atomic force microscope in the ambient atmosphere. The approximate resonance frequency of the cantilever was 280 kHz and force constant was around 60 N m−1.
Agilent 5500 atomic force microscope
Manufactured by Agilent Technologies
Sourced in United States
The Agilent 5500 Atomic Force Microscope (AFM) is a high-resolution imaging and analysis instrument designed for investigating surface topography and material properties at the nanoscale. The 5500 AFM utilizes a microfabricated cantilever with a sharp tip to scan the surface of a sample, allowing for the measurement of surface features with angstrom-level resolution.
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Lab products found in correlation
5 protocols using agilent 5500 atomic force microscope
1
Atomic Force Microscopy of Thin Films
2
AFM Characterization of Bis-N-MPyC Films
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The surface topography of the bis-N-MPyC films adsorbed on the clean gold surfaces was assessed with AFM. The measurements were performed with an Agilent 5500 atomic force microscope (Agilent Technologies, Palo Alto, CA, USA). Silicon tips with a nominal spring constant of 20 nm−1 were used in tapping mode at a frequency of ~300 kHz.
3
Graphene Oxide Characterization Protocol
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Graphene oxide (GO) was supplied by Nanografi, Germany, as an aqueous suspension at a concentration of 10 mg∙mL−1. Before use, the material was visualized using SEM and AFM techniques, and the stability of the suspension was assessed by measuring the zeta potential. The GO dispersion was diluted to a concentration of 20 μg∙mL−1 and sonicated for 1 min using an ultrasonic bath. It was then deposited on a silicon wafer for SEM measurements and freshly cleaved mica for AFM measurements. The samples were left to dry overnight at room temperature. The morphology of the samples was examined using a scanning electron microscope (SEM) Quanta FEG 250 (FEI, Oregon, USA) operating at an accelerating voltage of 30 kV in high vacuum mode. AFM imaging was performed using an Agilent 5500 atomic force microscope (Agilent Technologies, CA, USA) in tapping mode. The zeta potential was measured at 25 °C using a Litesizer 500 (Anton Paar, Graz, Austria), and the zeta potential values were calculated using the Smoluchowski equation.
4
Characterization of HA-MWCNT Membranes
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The morphologies of the multi-walled carbon nanotubes, the HA-MWCNT and the fabricated membranes were recorded on Quattro field emission scanning electron microscope (FESEM, Waltham, MA, USA) fitted with an energy dispersive X-ray spectrometer (Thermo ScientificTM, Waltham, MA, USA). The specimens were coated by gold sputtering prior to analysis. X-ray diffraction patterns were obtained on a Rigaku Miniflex-II X-ray diffractometer using CuKα radiation in the range of 2θ 5°–80°. The FTIR spectra of the materials and the fabricated membranes were measured on NicoletTM iS5 FTIR spectrometer in the range of wavenumber 400–4000 cm−1. The surface wettability of the fabricated membranes was measured on DSA-25 drop-shaped contact angle analyzer (KRUSS Scientific, Hamburg, Germany) using a drop size of 5 µL. The surface topography and roughness of the membrane specimens were recorded on Agilent 5500 atomic force microscope (Agilent Technologies, Santa Clara, CA, USA). Micrometric ASAP 2020 (Brussels, Belgium) was used to measure the BET surface area and pore size distribution. High-purity N2 (99.999) gas was used under the liquid nitrogen condition.
5
Characterization and Sensing of AgNPs
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UV-visible spectrophotometer-1800 (Shimadzu, Japan) was used for the characterization and sensing application of AgNPs. The shape and average size of AgNPs were dogged through Agilent 5500 atomic force microscope (AFM). Crystalline nature of synthesized NPs was studied by XRD analysis using X-ray diffractometer (Shimadzu, XRD-6000). FTIR spectrum was recorded utilizing KBr discs method by using FTIR Bruker-EQUINOX-55 at encompassing conditions.
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