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Carl gemini sem 500

Manufactured by Zeiss
Sourced in Germany

The Carl Zeiss Gemini SEM 500 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a Gemini electron column, which provides stable and precise electron beam control for superior image quality. The Gemini SEM 500 offers advanced analytical capabilities, including energy-dispersive X-ray spectroscopy (EDS) and backscattered electron (BSE) detection.

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2 protocols using carl gemini sem 500

1

Surface Characterization of Ti6Al4V Discs

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In the present study, MG63 cells were cultured both directly and indirectly in contact with discs made of Ti6Al4V grade 5, 10 mm in diameter. Discs were manufactured by New Ancorvis S.r.l. (Bargellino di Calderara di Reno, Italy) and subjected to different surface treatments performed by Al Ti Color S.r.l, (Piazzola sul Brenta, Italy). Specifically, disc no. 1 did not undergo any treatment, disc no. 2 was polished with electroerosion, disc no. 3 was subjected to sandblasting and double acid etching, the surface of disc no. 4 was a new Al Ti Color surface, and disc no. 5 underwent color anodizing (Figure 1). Investigators were made aware of the surface treatment only at the end of the study. Scanning electron microscopy (SEM) was performed for the instrumented implants in order to evaluate any type of modifications. The samples were cleaned with water spray, and surface topography was evaluated using SEM (Carl Zeiss Gemini SEM 500; Carl Zeiss, Oberkochen, Germany) operating at 10 kV with a working distance of 9 mm.
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2

SEM Analysis of Implant Surface Topography

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Scanning electron microscopy (SEM) was performed for the instrumented implants in order to evaluate any type of modifications. The samples were cleaned with water spray, and surface topography was evaluated using SEM (Carl Zeiss Gemini SEM 500; Carl Zeiss, Oberkochen, Germany) operating at 10 kV with a working distance of 9 mm. All pictures were taken at ×500 and ×5,000 magnification. The surface of an untreated implant served as a control. The area of interest was chosen 1 mm below the implant shoulder, which was the reference point. Moreover, photographs of the implants were taken using a stereomicroscope, then planimetrically analysed with dedicated software (ImageJ v1.46, NIH, Bethesda, MD, USA). The RGB scale was used to assess the altered surface roughness according to the colour value and to compare the control with the tested surfaces. A value of 60-90 RGB (green scale) was considered a sign of a plain and altered surface. However, yellow and red values with an RGB of 110 to 180 were interpreted as signs of a rough and non-altered surface (Figure 4).
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