Multimode nanoscope 5 system
The Multimode Nanoscope V system is a high-performance atomic force microscope (AFM) designed for advanced nanoscale characterization. It provides precise topographical and material property measurements on a wide range of samples. The system features a modular design, allowing for the integration of multiple imaging and spectroscopy modes to meet the needs of various research and industrial applications.
Lab products found in correlation
2 protocols using multimode nanoscope 5 system
Topographical Mapping of Nanoparticles using AFM
Atomic Force Microscopy of PEG Samples
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