A Bruker M4 TORNADO™ Micro-XRF equipped with a rhodium target X-ray tube operating at 50 kV and 500 nA and an XFlash® silicon drift X-ray detector was used for elemental mapping of the polished slice of the Toarcian concretion samples. Maps were created using a 25 µm spot size on a 25 µm raster with dwell time of 5 ms per pixel.
M4 tornado micro xrf
Manufactured by Bruker
Sourced in United States
The M4 TORNADO™ Micro-XRF is a versatile laboratory instrument designed for non-destructive elemental analysis of solid samples. It utilizes X-ray fluorescence (XRF) technology to detect and quantify the elements present in a sample, providing information about its chemical composition.
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Lab products found in correlation
2 protocols using m4 tornado micro xrf
1
Elemental Mapping of Toarcian Concretions
2
Micro-XRF Elemental Mapping of Rocks
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Elemental maps at 20 µm/pixel were collected with a M4 Tornado micro-XRF (Bruker, USA) of each sample to show variations in the rock mineralogy and texture. The samples were placed under vacuum and irradiated at 50 kV with a current of 200 µA.
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