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Axs new d8 advance

Manufactured by Bruker

The Bruker AXS New D8 Advance is an X-ray diffractometer designed for materials analysis. It is capable of performing X-ray diffraction measurements on a wide range of samples, including powders, thin films, and single crystals. The instrument offers high-resolution, high-throughput data collection, and a flexible configuration to accommodate various sample types and measurement requirements.

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2 protocols using axs new d8 advance

1

Comprehensive Material Characterization Protocol

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Transmission electron microscopy (TEM) images were recorded by a JEOL JEM-2100 operating at 200 kV. High-Resolution Transmission Electron Microscopy (HRTEM) images were collected by a JEOL-F200 and JEOL JEM-3010. Energy Dispersive X-ray Spectroscopy (EDS) measurement and mapping were performed using JEOL JEM-ARM200F. Scanning electron microscopy (SEM) images were recorded using Carl Zeiss SIGMA operating at 5 kV. X-ray diffraction (XRD) was conducted using Bruker-AXS New D8-Advance. X-ray photoelectron spectroscopy (XPS) measurements were performed using ThermoFisher Scientific K-alpha. Absorption and transmission spectra were collected with a JASCO V-770 UV-VIS-NIR spectrometer. Photoluminescence (PL) spectra were obtained using EDINBURGH FS5. The PLQY was measured using a fluorimeter equipped with an integrating sphere. Time-resolved photoluminescence decay data were collected using a HORIBA Fluorolog-3 with a single photon-counting photomultiplier tube (PMT) under a 374 nm pulsed laser diode.
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2

Synthesis and Characterization of Ti3C2Tx MXene

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The Ti3C2Tx MXene was synthesized by adopting a previously reported method [22] (link) (Supporting information). The synthesized Ti3C2Tx MXene was characterized by Field-emission scanning electron microscopy (FE-SEM), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and Fouriertransform infrared spectroscopy (FT-IR) and. FE-SEM was performed on Carl Zeiss SIGMA Field emission scanning electron microscope. XRD patterns were recorded on a Bruker-AXS New D8-Advance X-ray diffractometer using CuKα radiation of wavelength λ = 0.15418 nm at 40 kV and 40 mA. XPS was performed on the Thermo Fisher Scientific K-alpha+ X-ray photoelectron spectroscope, and the deconvolution of the spectra was performed using XPSPEAK 41 software. FT-IR spectra were recorded on Bruker ALPHA II FT-IR Spectrometer using the Attenuated Total Reflection (ATR) module. All the electrochemical measurements were performed using a CHI 660E electrochemical workstation (CH Instruments, Inc). A standard three-electrode cell, comprising of custom made 2 mm diameter Au-PCB working electrode, an Ag/AgCl (3M NaCl) reference electrode and a counter electrode (Platinum spiral wire) were used for electroanalysis. Phosphate buffered saline (PBS, 0.1 M) of pH 7.4 was used as the supporting electrolyte in electrochemical experiments unless otherwise noted.
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