D8 discovery system

Wide-angle X-ray Diffraction measurements were performed using X-ray diffraction (WXRD, D8 discovery system, Bruker, Karlsruhe, Germany). The X-ray wavelength was 1.54 Å and the sample-to-detector distance was 85.0 mm. The WAXD patterns were recorded by a vant 500 two-dimensional (2D) detector. Each pattern was acquired with the 2θ ranging from 5 to 32° and the exposure time was 100 s. Small-angle X-ray scattering measurements (SAXS, Nanostar, Bruker, Germany) were conducted, and the sample-to-detector distance was fixed as 2508 mm. SAXS images were recorded with a Pilatus 100 K detector of Dectris, Baden, Swiss, and the exposure time was 300 s. 2D SAXS and WAXD patterns were conversed by Fit2D software into one-dimensional data (1D). The 1D SAXS data were Lorentz-corrected by multiplying the intensity value by q². The 1D WAXD curves were fitted according to Gaussian functions to obtain the crystallinities.
The phase content can be estimated by the following equation based on an interactive peak-fit-procedure [26 (link)]: $X_{meso}=A_{meso}/\left(A_{meso}+A_{\gamma }+A_{amorp}\right)$
$X_{\gamma }=A_{\gamma }/\left(A_{meso}+A_{\gamma }+A_{amorp}\right)$
where, $A_{meso}$ , $A_{\gamma }$ and $A_{amorp}$ are the fitted areas of mesophase, γ-phase and amorphous region, respectively.