The structural characterization of AuNSs and AuNCs was conducted by scanning electron microscopy (SEM, JSM-6500, JEOL, Japan) to assess the shapes and sizes. Furthermore, the LSPR absorption spectra of the AuNSs and AuNCs dispersed in water were measured using a Varian Carry 300 UV-Vis spectrophotometer (Agilent, USA).
Jsm 6500
Manufactured by JEOL
Sourced in Japan
The JSM-6500 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution images of small-scale samples. The JSM-6500 utilizes a field emission electron gun to generate a focused electron beam that scans the surface of the sample, allowing for detailed observation of surface features and topography.
Automatically generated - may contain errors
Lab products found in correlation
Varian carry 300 uv vis spectrophotometer, by Agilent Technologies (2 mentions)
X pert pro, by Malvern Panalytical (2 mentions)
Ihr550, by Horiba (2 mentions)
Jel 2100f, by JEOL (2 mentions)
X pert pro mpd, by Malvern Panalytical (1 mentions)
Pyris 1, by PerkinElmer (1 mentions)
V 650, by Jasco (1 mentions)
Spectrum one, by Horiba (1 mentions)
Tga sdta851, by PerkinElmer (1 mentions)
Di 3100, by Veeco (1 mentions)
Thermogravimetric analyzer, by Mettler Toledo (1 mentions)
Nrs 5100, by Jasco (1 mentions)
Nicolet is5, by Thermo Fisher Scientific (1 mentions)
H 8100, by Hitachi (1 mentions)
Easyscan 2, by Nanosurf (1 mentions)
Tm3000, by Hitachi (1 mentions)
Ft ir 6700, by Jasco (1 mentions)
D2 phaser, by Bruker (1 mentions)
Dsc 4000 analyzer, by PerkinElmer (1 mentions)
16 protocols using jsm 6500
1
Structural and Optical Characterization of Gold Nanostructures
2
Structural and Thermal Analysis of IBX Hybrid Films
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The structure of the prepared IBX hybrid thin films was determined using Fourier transform infrared spectroscopy (Perkin–Elmer Spectrum One), Raman spectroscopy (HORIBA iHR550), and an X-ray diffractometer (PANalytical X’Pert PRO MPD) by using CuKα radiation. The thermal properties of the IBX hybrid materials were measured using a TA Instruments Thermogravimetric Analyzer (Mettler Toledo TGA/SDTA851) and a differential scanning calorimeter (Perkin–Elmer Pyris 1) with heating rates of 20 and 10 °C min−1. The transmittances of the hybrid films coated onto quartz substrates were analyzed using ultraviolet–visible spectroscopy (Jasco V650). The surface morphologies of the thin films were examined using ultrahigh-resolution field emission scanning electron microscopy (FE-SEM, JEOL JSM-6500) and a student module of atomic force microscopy (AFM, Veeco DI3100).
3
Characterization of Bioactive Glass Compositions
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Glasses with compositions of 46.1SiO2·24.4Na2O·26.9MO·2.6P2O5 (mol%, M = Ca, Mg, or Sr, denoted by BGM) were prepared by melt quenching. Glass batches were prepared by mixing SiO2 (99.0%), Na2CO3 (99.5%), CaCO3 (99.5%), MgO (99.0%), SrCO3 (98.0%), and NaH2PO4 (99.0%). All the reagents were purchased from Kishida Chemical Co. The batches were melted in a platinum crucible at 1500°C for 30 min and quenched by pressing with two stainless steel plates. The glasses were examined using laser Raman spectroscopy in between 220 and 1300 cm−1 (NRS‐5100, JASCO). The resulting glasses were pulverized using an automatic alumina mortar, and the powders were stored in a desiccator. The resulting powders were observed by field emission gun electron microscopy (SEM, JSM‐6500, JEOL) with an accelerating voltage of 15 kV after coating the samples with an amorphous osmium layer using an osmium coater (Neoc CS, Meiwafosis Co. Ltd.). Particles diameter were measured using the ImageJ software (NIH).
4
Characterization of ZnO NPs and Butterfly Wings
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The morphologies of ZnO NPs and butterfly wings were characterized by scanning electron microscope (SEM; JEOL JSM6500). The crystal characteristics were carried out by X-ray diffraction (XRD; Panalytical X'pert PRO). The reflectance spectrum was detected by a spectrophotometer (Jobin-Yvon H10). To study the lasing behavior, the samples were optically excited by a Q-switched 4th harmonic Nd: YAG laser (266 nm, 3–5 ns pulse, 10 Hz) and measured with a Jobin Yvon iHR550 imaging spectrometer system. The laser beam was focused to a diameter of about 500 μm. All the experiments were performed at room temperature.
5
Characterizing Adsorbent Materials via SEM-EDX and FTIR
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A JSM-6500 scanning electron microscope (SEM; JEOL, Japan) and energy-dispersive X-ray spectroscopy (EDX) was used to characterize the morphological structure and elemental composition of the adsorbents. The microscope was operated at 3–15 kV to obtain the micrographs and EDX spectrum. Fourier transform infrared (FTIR) spectroscopy (Nicolet iS5, Thermo Fisher Scientific, US) was performed using an attenuated total reflection detector to assess functional groups present on the material in a wavelength range of 400–4000 cm−1 using KBr pellet samples.
6
Characterizing AuNRs@mSiO2 Nanostructures
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We used transmission electron microscope (TEM, JEL-2100F, JEOL, Japan) and scanning electron microscope (SEM, JSM-6500, JEOL, Japan) to characterize the AuNRs@mSiO2. The TEM images were analyzed based on a custom MATLAB script previously reported with some subroutine implemented in the image processing toolbox of MATLAB. Furthermore, a Varian Carry 300 UV-vis spectrometer (Agilent Technologies) was used to characterize the ensemble extinction spectrum of the AuNRs@mSiO2.
7
Fracture Surface Analysis via SEM
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After fatigue testing, the fracture surfaces of the specimens were examined using a JEOL-JSM 6500 scanning electron microscope (SEM) to identify the location of crack initiation. For this purpose, overview images of the fracture surfaces were taken, followed by imaging of the crack initiation points at 50×, 200×, 500×, and 1000× magnification. Both secondary electron contrast (SE) and backscattered electron (BSE) images were taken. X-ray microanalysis (energy dispersive X-ray spectroscopy (EDS)) was performed to determine the chemical composition of inclusions.
8
Characterization of AuNRs@mSiO2 Nanostructures
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The AuNRs@mSiO2 solution was diluted with 18.2 MΩ pure water to the proper concentration and then sonicated for 15 min at room temperature. The samples were prepared by spin-casting the solution on the precleaned glass slide and covered with a 22 mm × 22 mm No 1.5 coverslip. The concentration of AuNRs@mSiO2 on the glass surface was controlled to be ∼1 μm−2 to facilitate single-particle characterization and to minimize interparticle LSPR coupling. Structural characterization was performed using a transmission electron microscope (TEM; H-8100, HITACHI, JAPAN) and a scanning electron microscope (SEM; JSM-6500, JEOL, JAPAN).
9
Characterization of Gold Nanorods
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The shapes and sizes of the AuNRs were determined by scanning electron microscopy (SEM, JSM-6500, JEOL, Japan). The LSPR extinction spectra of the AuNRs dispersed in water were measured using a Varian Carry 300 UV–Vis spectrophotometer (Agilent, USA).
10
Characterization of MoS2 Thin Films
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All measurements were conducted in room temperature. An atomic force microscopy (AFM; Veeco D3000 NS49) was used to measure the thickness of the as-grown MoS2 layer on SiO2 substrate. The fabricated structure of the devices was confirmed by field emission scanning electron microscopy (FE-SEM; JEOL JSM6500). The electrical and optical characteristics (I–V curves) of the device were analyzed with the assistance of a conventional probe station (Lakeshore, TTPX) equipped with a power supply (Ophit, Nova II), source meter (Keithley, 2636 A) and an optical system, including a He-Ne laser (JDS Uniphase, Novette 1507), an optical beam shutter (Thorlabs, SH1), a Xenon lamp (Newport, 66921), and a monochromator (Acton, Spectrapro-500).
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