Ls 55 perkin elmer fluorescence spectrometer

The sensors were characterized for their chemical and physical properties using field emission scanning electron microscopy (FE-SEM), Atomic Force Microscopy (AFM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), photoluminescence (PL) emission spectra, and laser confocal fluorescent microscopy. Raman spectra was recorded on (LabRAM HR Raman) spectrometer with a solid state laser at room temperature with the excitation laser wavelength of 514 nm. Photoluminescence (PL) spectra were recorded by a (LS-55 Perkin Elmer Fluorescence Spectrometer) ranging from 350 nm to 700 nm. Carl Zeiss Supra 55VP was used for SEM. PHI Quantera II VG X-ray photoelectron spectroscopy was used for XPS. Olympus FV500 confocal microscope was used for laser fluorescent microscopy. Electrical characterizations were carried out using Applent AT-826 LCR meter with 0.6Vrms sinusoidal output.

Absorption and PL spectra were recorded on a Perkin-Elmer Lambda 950 spectrometer and a LS55 Perkin-Elmer Fluorescence spectrometer, respectively, at 298 K.