diffraction (XRD) measurements were performed on a Bruker D8 Advance
X-ray diffractometer using Cu Kα radiation to identify the ZSM-5
zeolite crystalline phase. The working voltage and current were 40
kV and 40 mA. The scanning rate and range (2θ) were 5 °/min
and 5–60°. Scanning electron microscope (SEM) images of
ZSM-5 crystal seed and film morphology were inspected with a JSM-7500F
cold field emission scanning electron microscope (JEOL, Japan). The
acceleration voltage and working current were 5 kV and 20 mA. All
samples were coated with gold before measurements. The particle size
distribution of the ZSM-5 crystal seed was collected by dynamic light
scattering (DLS) mode of Nano ZSE Zetasizer (Malvern, U.K.). The N2 adsorption–desorption isotherms at 77 K were measured
by ASAP 2460 surface area and porosity analyzer (Micromeritics), with
the aim to confirm the pore distribution of the ZSM-5 film. Before
the analysis, the film capillary sample was degassed in vacuum at
200 °C for 12 h.