Tm3030 microscope
The TM3030 is a tabletop scanning electron microscope (SEM) manufactured by Hitachi. It is designed for high-resolution imaging of samples at the micro- and nanoscale. The TM3030 uses an electron beam to scan the surface of a sample, generating detailed images that can reveal the topography, composition, and other characteristics of the specimen.
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5 protocols using tm3030 microscope
SEM Imaging of Microneedle Structures
Structural Characterization of Ti-Ta Alloys
The structures of the Ti–Ta alloys were investigated by high-resolution scanning tunneling microscopy (STM). All determinations were performed in air with a Hitachi TM3030 microscope that had been transversely calibrated by imaging atomically accurate oriented pyrolytic graphite. The tips were obtained by chopping a 0.20 mm Pt0.8Ir0.2 wire. The data were acquired in constant current operation with specific tunneling currents of 0.13–0.3 nA and a specimen polarization of 0.4–1.0 V. No tip-induced shifts were noted.
X-ray diffraction (XRD) determinations were made using an Empyrean diffractometer (Malvern-Panalytical). The device worked with a Cu Kα anode (1.5406 Å) in the range of 2θ = 0–64° with a step size of 0.04° at a power of 45 kV and 40 mA in Bragg–Brentano geometry. The samples have been rotated while collecting data in order to achieve better data capture. The obtained patterns were simulated in order to determine the presence of the crystalline phase, the lattice parameter, and the diameter of the grain with the assistance of Malvern-Panalytical’s HighScore Plus software.
Comprehensive Material Characterization
Extruded PCL Matrix Surface Analysis
Characterization of CLC-Soluplus® Nanoparticles
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