Samples from different stages of composting (polyester/cotton blends, polyester/spandex blends, recycled cotton, and recycled spandex) were collected, dried, and finely crushed, then analyzed by XRD. XRD was carried out using an X-ray diffractometer (Panalytical EMPYREAN model) with a copper-length anticathode. Operating with CuKα radiation (λ = 1.5406 Å). The current was adjusted to 30 mA and the voltage was increased to 40 kV. Data acquisition is carried out by a control unit for angles of 2 theta (2θ) between 5 and 60°.
Empyrean model
Manufactured by Malvern Panalytical
Sourced in United Kingdom
The Empyrean model is a high-performance X-ray diffraction (XRD) system designed for materials analysis. It offers advanced features for conducting precise and reliable structural characterization of a wide range of materials, including thin films, powders, and single crystals. The Empyrean model provides accurate data collection and analysis capabilities to support materials research and development across various industries.
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Lab products found in correlation
X pert highscore plus software, by Malvern Panalytical (4 mentions)
Talos electron microscope, by Thermo Fisher Scientific (1 mentions)
Merlin system, by Zeiss (1 mentions)
Q600 simultaneous tga dsc, by TA Instruments (1 mentions)
Tecnai f30 tem, by Thermo Fisher Scientific (1 mentions)
Jxa 8100, by JEOL (1 mentions)
S 4800, by Hitachi (1 mentions)
Mpms 5, by Quantum Design (1 mentions)
Ppms 9, by Quantum Design (1 mentions)
12 protocols using empyrean model
1
Textile Waste Characterization via XRD
2
Polymorphic Analysis of Oleogels
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An X-ray diffractometer (PANalytical Empyrean model, Almelo, The Netherlands) was used to measure the polymorphic types of the oleogel samples following the Cj 2-95 method [19 ]. The oleogel samples were kept at ambient temperature overnight and loaded at that temperature to the instrument. The measurement was completed with a Cu source X-ray tube (λ = 1.54056 Å, 40 kV and 40 mA) and angular scans (2θ) from 2.0 to 50° at 2°/min scan rate. X’Pert HighScore Plus software (Malvern Panalytical Ltd., Royston, UK) was used for data analysis [13 (link)].
3
Structural Analysis of Ti-based Powders
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The phase constitution and the crystallographic structure of the Ti-based powders were analyzed by the X-ray powder diffraction (XRD) with Cu Kα radiation (Panalytical, Empyrean model, Almelo, Netherlands). The conditions of the XRD measurements were as follows: voltage 45 kV, anode current 40 mA, 2theta range 30°–90°, time per step 60.214 s, step size 0.0245°, λ = 1.54 Å.
The XRD data were used to calculate the average crystallite size and the lattice strain using the Williamson-Hall plot and the Panalytical HighScore 3.0a (Panalytical, Almelo, Netherlands) software. All computations, based on the XRD data, were made after subtracting the background and the peak fittings. The refinement of the diffraction data was performed using the Rietveld refinement technique with the Maud 2.91 software (by Luca Luttorotti, Univ. of Trento, Italy). The instrumental peak broadening was evaluated using an Si reference sample. The Marquardt Least Squares based on the Levenberg-Marquardt algorithm was used in order to minimize the difference between the experimental and the calculated patterns. The refinement analyses were carried out using space groups and crystallographic information from the Crystallography Open Database (β-Ti: COD 9012924).
The XRD data were used to calculate the average crystallite size and the lattice strain using the Williamson-Hall plot and the Panalytical HighScore 3.0a (Panalytical, Almelo, Netherlands) software. All computations, based on the XRD data, were made after subtracting the background and the peak fittings. The refinement of the diffraction data was performed using the Rietveld refinement technique with the Maud 2.91 software (by Luca Luttorotti, Univ. of Trento, Italy). The instrumental peak broadening was evaluated using an Si reference sample. The Marquardt Least Squares based on the Levenberg-Marquardt algorithm was used in order to minimize the difference between the experimental and the calculated patterns. The refinement analyses were carried out using space groups and crystallographic information from the Crystallography Open Database (β-Ti: COD 9012924).
4
X-ray Diffraction Analysis of Crystalline Materials
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The XRD analyzes were performed in PANalytical Empyrean model (PANalytical, Malvern, UK) equipped with ceramic X-ray tubes (Co anode) (Kα1 = 1.789010 Å), Kβ Fe filter, PIXCEL3D-Medpix3 1 × 1 detector with a voltage of 40 kV, current of 35 mA, step size 0.0263° in 2θ, scanning from 3.00° to 95.00° in 2θ, time/step of 59.92 s. Data acquisition was made with the X’Pert Data Collector software, version 5.1, and the data treatment with the X’Pert HighScore Plus software, version 4.7 (Malvern Panalytical, Malvern, UK).
The comparison of the diffractogram with the standards of the ICDD-PDF (International Center for Diffraction Data—Powder Diffraction File) database helped identify Qi and Qt. The crystallinity index was calculated [28 (link)] using the following Equation (8).
where ICR is the crystallinity index; Imax is maximum intensity, and I0 is the initial intensity base of the values of the 2θ positions of the characteristic peak curve.
The comparison of the diffractogram with the standards of the ICDD-PDF (International Center for Diffraction Data—Powder Diffraction File) database helped identify Qi and Qt. The crystallinity index was calculated [28 (link)] using the following Equation (8).
where ICR is the crystallinity index; Imax is maximum intensity, and I0 is the initial intensity base of the values of the 2θ positions of the characteristic peak curve.
5
Oleogel Crystalline Polymorph Analysis
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Polarized light microscopy images of the oleogels were taken with an Olympus CX31 polarized light microscope (PLM, Olympus Optical Co., Japan) and an attached CCD color camera (Canon) at room temperature 11) .
To determine the crystalline polymorph type, the oleogel samples were analyzed with a PANalytical Empyrean model (The Netherlands) X-ray diffractometer according to method Cj 2-95 12) . Samples loaded at ambient temperature (23±2 ℃) to the holder by plastering the previously prepared oleogel sample into the sample holder by a spatula, and then angular scans (2θ) were performed from 2.0° to 50° by 2°/min scan rate. There was a Cu source X-ray tube (λ＝1.54056 Å, 40 kV and 40 mA) . Data analysis was com-pleted with X Pert HighScore Plus software (Malvern Panalytical Ltd., Royston, UK) 13) .
To determine the crystalline polymorph type, the oleogel samples were analyzed with a PANalytical Empyrean model (The Netherlands) X-ray diffractometer according to method Cj 2-95 12) . Samples loaded at ambient temperature (23±2 ℃) to the holder by plastering the previously prepared oleogel sample into the sample holder by a spatula, and then angular scans (2θ) were performed from 2.0° to 50° by 2°/min scan rate. There was a Cu source X-ray tube (λ＝1.54056 Å, 40 kV and 40 mA) . Data analysis was com-pleted with X Pert HighScore Plus software (Malvern Panalytical Ltd., Royston, UK) 13) .
6
Characterization of Oleogel X-ray Diffraction
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X-ray diffraction (XRD) patterns of the oleogels were assessed with a PANalytical Empyrean model (The Netherlands) X-ray diffractometer. Radiation was applied at a scanning rate of 0.02/0.6 (sec) within a 2.0-50°( 2θ) range under 45 kV and 40 mA CuKα (λ = 1.54056 Å). Data analysis was completed with X'Pert HighScore Plus software (Malvern Panalytical Ltd., Royston, UK) (Yilmaz et al., 2015) .
7
Polymorphism Analysis of Oleogel Samples
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PANalytical Empyrean model (The Netherlands) X-ray diffractometer and Cj 2-95 method were used to assess the polymorphic forms of the oleogel samples 16) . The oleogel samples were kept at ambient temperature overnight and loaded at ambient temperature to the instrument s sample holder with a spatula. A Cu source X-ray tube (λ＝1.54056 Å, 40 kV and 40 mA) was produced angular scans (2θ) from 2.0° to 50° by 2°/min scan rate to test the samples. The X Pert HighScore Plus software (Malvern Panalytical Ltd., Royston, UK) of the instrument was used for data analysis.
8
Characterization of Annealed Nanotubes
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We report the properties of the annealed thin films. Their morphologies and thicknesses were investigated by scanning electron microscopy (SEM) from Zeiss and Bruker and atomic force microscopy (AFM) from Bruker. Chemical analysis of thin films were performed by SEM combined with energy dispersive X-ray spectroscopy (SEM-EDS) on a Zeiss Merlin system (beam energy: 15 keV). X-ray diffraction spectra were recorded in the glancing incidence mode on a Malvern Panalytical (Empyrean model) diffractometer with incidence angle of 0.8°. The morphologies of the annealed nanotubes were investigated by both SEM and transmission electron microscopy (TEM), chemical element distribution was examined by scanning transmission electron microscopy (STEM) combined with energy dispersive X-ray spectroscopy (STEM-EDS). The TEM and STEM experiments were carried out using an FEI Talos electron microscope operated at 200 kV. The thicknesses of the NTs were extracted from EDS elemental 2D maps of Ga and Ni using the software Velox, as previously discussed.48 (link) The diffraction pattern was simulated using the software JEMS, for the Ni : Fe crystal structure with atomic ratio 75 : 25.
9
Characterization of Graphene Oxide Nanomaterials
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Graphene oxide and Graphene Oxide-Ag Nanoparticles were characterized via FTIR, TGA, UV-Vis, Z-potential, Raman spectroscopy, XRD, SEM-EDX, and TEM analysis. Fourier transform infrared spectroscopy spectra were recorded in a Bruker Alpha II (Bruker, Germany) in a range of 4000–600 cm−1 with a spectral resolution of 2 cm−1. Thermogravimetric analysis was performed in a Q600 Simultaneous TGA/DSC (TA Instruments, New Castle, DE, USA) for a temperature range from 25 to 600 °C and a heating rate of 10 °C/min under a Nitrogen atmosphere (gas flow: 100 mL/min). UV-Vis spectra were recorded using a UV-Vis spectrophotometer (Mettler Toledo V 670, United States) in a range of 300–700 nm. Raman spectra were recorded in the range of 100–3000 cm−1 with a laser of 532 nm and an objective 100x/0.75 NIR using an XPlora Raman Horiba confocal (Horiba Scientific, Japan). XRD spectra were recorded using a Malvern-Panalytical-Empyrean model (45kV, 40mA) (Malvern Panalytical, United Kingdom) in the range of 5°–80°. SEM-EDX analyses were carried out in an FE-MEB LYRA3 (Tescan, Czech Republic) attached with an energy-dispersive X-ray spectroscopy system for elemental analysis. Transmission electron microscopy (TEM) images were collected on a Tecnai F30 TEM (FEI Company, Fremont, CA, USA).
10
Synthesis and Characterization of TlFe3Te3 Single Crystals
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Single crystals of TlFe3Te3 were grown using a self-flux method. A mixture with a ratio of Tl:Fe:Te = 1:3:3 was placed in an alumina crucible, sealed in an evacuated quartz tube, heated at 923 K for 5 days. The product was a black powder from which needle-like single crystals with a typical dimension of ~0.4 × 0.4 × 4 mm3 could be isolated. Powder XRD measurements on crushed single crystals were carried out at room temperature on a PANalytical x-ray diffractometer (Model EMPYREAN) with a monochromatic Cu Kα1 radiation to identify the phase purity and the crystal structure. The composition was confirmed by an electron probe micro-analyzer (EPMA) (Jeol JXA-8100). The magnetic measurements were performed on a Quantum Design Magnetic Property Measurement System (SQUID-VSM, MPMS-5) and the resistivity measurements were carried out on a Physical Property Measurement System (PPMS-9).
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