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Spectrum bx 2 ft ir spectrometer

Manufactured by PerkinElmer
Sourced in United Kingdom

The Spectrum BX II FT-IR spectrometer is a lab equipment designed for infrared spectroscopy analysis. It is capable of measuring the absorption and transmission of infrared radiation through a sample. The core function of this instrument is to provide data on the molecular composition and structure of materials.

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3 protocols using spectrum bx 2 ft ir spectrometer

1

FT-IR Characterization of Photocrosslinked Polymers

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Fourier Transform Infrared Spectroscopy (FT-IR) measurements of photocross-linked polymer samples were performed on a Spectrum BX II FT-IR spectrometer (Perkin Elmer, Llantrisant, UK). The spectra were acquired from 10 scans. The range of the wavenumber was (400–4000) cm−1.
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2

Thermal Decomposition of Nanoparticles

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The phase transformations that occurred during thermal decomposition were investigated by thermogravimetric (TG) and differential thermal analysis (DTA) using a Q600 SDT (TA Instruments, New Castle, DE, USA) simultaneous thermal analyzer, in air up to 1000 °C, at 10 °C /min heating rate and alumina standards. The formation and decomposition of functional groups was studied with a Spectrum BX II FT-IR spectrometer (Perkin Elmer, Waltham, MA, USA) on KBr pellets containing 1% (w/w) sample. The X-ray diffraction patterns were recorded using a D8 Advance diffractometer (Bruker, Karlsruhe, Germany), operating at room temperature, 40 kV and 40 mA with CuKα radiation (λ = 1.540,60 Å). The shape and clustering of nanoparticles were studied on samples deposited from suspension onto carbon coated copper grids using a HD-2700 (Hitachi, Tokyo, Japan) transmission electron microscope (TEM) with digital image recording system. The magnetic measurements were performed using a cryogen-free vibrating-sample magnetometer (Cryogenic Limited, London, UK). The hysteresis loops were recorded in magnetic fields between −2 to 2 T, at room temperature, while the magnetization versus magnetic field measurements were performed to find MS up to 10 T, on samples embedded in epoxy resin to prevent nanoparticle movement.
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3

1H NMR and IR Characterization of Cross-linked Polymers

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A Varian Gemini 400 spectrometer (Palo Alto, CA, USA) was used to register the 1H NMR spectra CDCl3 was used as the solvent. For internal calibration the solvent signal corresponding to CDCl3 was used: δ(1H) = 7.26 ppm.
A Perkin-Elmer (Llantrisant, UK) Spectrum BX II FT-IR spectrometer was used to record IR spectra of cross-linked polymers. The spectra were performed in KBr pellets and acquired from 10 scans. The range of wavenumber was (400–4000) cm−1.
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