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Nanoscope 5 multimode scanning probe

Manufactured by Bruker
Sourced in United States

The Nanoscope V MultiMode scanning probe is a versatile, high-performance atomic force microscope (AFM) system designed for advanced surface imaging and analysis. It features a robust, flexible design that enables a wide range of imaging modes and sample environments. The Nanoscope V provides precise topographical and material property measurements at the nanoscale.

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2 protocols using nanoscope 5 multimode scanning probe

1

In-solution Atomic Force Microscopy

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In-solution AFM experiments
were performed with a Nanoscope V MultiMode scanning probe microscope
(Bruker, Santa Barbara, CA) equipped with a closed-loop “vertical
engage” J-scanner and a sealed tapping fluid cell. Images were
acquired with silicon cantilevers (VISTAprobes) with spring constants
of ∼0.1 N/m, scan rates of ∼2 Hz, and drive frequencies
ranging from ∼8 to 10 kHz. AFM images were processed and analyzed
using MATLAB and its image processing toolbox (Mathworks, Natick,
MA), as previously described.83 (link)
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2

Nanoscale Topography Characterization

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QCM-D crystals and self-standing CNF films were imaged in air using a Nanoscope V MultiMode scanning probe microscope (Bruker Corporation, Massachusetts, USA). Images were recorded in tapping mode. Silicon cantilevers (NSC15/AIBS, MicroMasch, Tallinn, Estonia) with driving frequencies around 270-340 kHz were used. According to the manufacturer, the radius of the tip was less than 10 nm. The surface of each sample was imaged in at least three different places.
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