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Silicon nitride scanasyst air probe

Manufactured by Bruker
Sourced in United States

The Silicon nitride SCANASYST-AIR probe is a type of scanning probe used for atomic force microscopy (AFM) applications. It is designed with a silicon nitride cantilever and tip, which are key components for obtaining high-resolution images and data during sample analysis.

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2 protocols using silicon nitride scanasyst air probe

1

Atomic Force Microscopy of Cellulose Pulp

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A Bruker Dimension Icon AFM system (Billerica, MA, USA) with a Bruker silicon nitride SCANASYST-AIR probe, which had symmetric pyramid geometry with a nominal tip radius of 2 nm, was used to obtain the images. The suspensions of cellulose pulp, pulp-O, and pulp-O-Br were obtained after homogenization using 15 passes at 1000 bar. The solutions were diluted and dropped onto mica wafers, which were dried at ambient temperature and atmosphere and then mounted on magnetic holders with a double-sided adhesive tape. The images were acquired under the peak-force tapping mode, using the manufacturer’s ScanAsyst automatic optimization algorithm. Post-processing of the pictures was performed using Bruker NanoScope Analysis v. 1.6 software (Billerica, MA, USA).
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2

Morphological Characterization of A-L Liposomes

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The morphology of the A-L liposomes was examined by transmission electron microscopy (TEM) and atomic force microscopy (AFM). For TEM analysis, 10 μL of the liposomal formulation was uniformly loaded on a carbon-coated copper grid for 1 min, after which the films were negatively stained with 10 μL of 1% phosphotungstic acid solution for 1 min. Excess sample and stain were blotted with filter paper, and the copper grid was dried for imaging using a HITACHI H-7500 transmission electron microscope (Hitachi, Tokyo, Japan) at 50,000× magnification. To acquire AFM topographic images, the A-L sample solution was dropped on to the surface of mica and dried under nitrogen gas for 2 h. The samples were observed with a Bioscope Resolve atomic force microscope (Bruker Nano Surfaces, Santa Barbara, CA, USA) in PeakForce quantitative nanomechanical imaging mode. The A-L suspension was imaged with a scan rate of 1 Hz. A Bruker silicon-nitride ScanAsyst Air probe with a spring constant of 0.4 N/m was used. All images were processed with the NanoScope Analysis software (Nanoscope Analysis, Bruker-AXS, Santa Barbara, CA, USA) and the Young’s modulus of A-L was calculated by fitting the retract curve using the Derjaguin–Muller–Toropov model.31
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