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Nanoscope 5 multimode afm

Manufactured by Veeco
Sourced in Germany, United States

The Nanoscope V Multimode AFM is a scanning probe microscope that uses atomic force microscopy (AFM) technology to capture high-resolution images and measurements of surface topography and other sample properties. It provides nanometer-scale resolution and can be used to analyze a wide range of materials, including polymers, ceramics, and biological samples.

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2 protocols using nanoscope 5 multimode afm

1

Measuring Endothelial Glycocalyx Thickness

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For determination of the eGC thickness, the AFM nanoindentation technique was used as described previously [11 (link),25 (link),38 (link)]. Briefly, cells were analyzed in HEPES-buffer (140 mM NaCl, 5 mM KCl, 1 mM CaCl2, 1 mM MgCl2, 5 mM glucose, 10 mM HEPES) supplemented with or without 1% FCS, respectively, or albumin 45 µg/mL at 37 °C in a fluid chamber with a Nanoscope V Multimode AFM (Veeco, Mannheim, Germany). The addition of slight amounts of plasma protein to the buffer is necessary for eGC preservation in vitro, as the work of our group [16 (link)] and others [27 (link)] has repeatedly demonstrated. Based on a significant amount of preliminary laboratory work with FCS and albumin, we could conclude that those are comparable in this respect. Incubation time of all AFM experiments was 60 min or as otherwise stated in the figure legend. A triangular cantilever (Novascan Technologies, Boone, NC, USA) with a mounted spherical tip (diameter 10 µm) and a spring constant of 10 pN/nm was used to periodically indent the cells. A laser beam was used to quantify the cantilever deflection. Knowing the force acting on the cantilever, the piezo displacement, and the deflection sensitivity, the thickness of the eGC could be calculated.
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2

Topographical Analysis of PCL Films

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For the topographical analysis of PCL-derivative micrometric films, an AFM instrument Nanowizard I (JPK Instruments, Germany) was operated in air, using contact imaging mode at constant loading forces and rates. Cantilevers were calibrated before each experiment by means of thermal tune method. Silicon-nitride probes (DNP-10, Bruker, USA) with a nominal spring constant of 0.12 N m−1 were used in the experiments. All images were processed by JPK data analysis software.
In order to extract topographical information of S-layer coated samples, a Nanoscope V multimode AFM (Veeco, Santa Barbara, USA) was employed. Before use, the fluid cell was washed overnight with 2% SDS, rinsed thoroughly with ultrapure water, and dried with nitrogen. Topography images were recorded in tapping mode, at 1 Hz in 100 mM NaCl aqueous solution and at room temperature. The final setpoint was carefully controlled to avoid coating damaging. Silicon nitride (Si3N4) cantilevers of 0.32 N m−1 with sharpened tips (DNPS, Veeco) and gold-coated reflective back sides were cleaned in ethanol before use.
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