Nanoscope 5 multimode afm
The Nanoscope V Multimode AFM is a scanning probe microscope that uses atomic force microscopy (AFM) technology to capture high-resolution images and measurements of surface topography and other sample properties. It provides nanometer-scale resolution and can be used to analyze a wide range of materials, including polymers, ceramics, and biological samples.
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2 protocols using nanoscope 5 multimode afm
Measuring Endothelial Glycocalyx Thickness
Topographical Analysis of PCL Films
In order to extract topographical information of S-layer coated samples, a Nanoscope V multimode AFM (Veeco, Santa Barbara, USA) was employed. Before use, the fluid cell was washed overnight with 2% SDS, rinsed thoroughly with ultrapure water, and dried with nitrogen. Topography images were recorded in tapping mode, at 1 Hz in 100 mM NaCl aqueous solution and at room temperature. The final setpoint was carefully controlled to avoid coating damaging. Silicon nitride (Si3N4) cantilevers of 0.32 N m−1 with sharpened tips (DNPS, Veeco) and gold-coated reflective back sides were cleaned in ethanol before use.
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