The morphologies of PPMs were observed by electron microscopy (FESEM, SU-8010), atomic force microscopy (AFM, SPM-9700), Ultra-Depth 3D Microscope (VHX-1000C) and Cryogenic scanning electron microscopy (Cryo-SEM, FEI Quanta 450). Fourier transform infrared spectroscopy (FT-IR) were obtained by a BRUKER Vertex 80 FT-IR (Germany). The interfacial tension of droplets and contact angle of films were measured by a contact angle meter (DATAPPHYSICS, OCA20). Element analyses (C, N, S, and H) were analyzed by an element analyzer (PerkinElmer, Optima 5300-DV). UV-Vis-NIR was conducted on a spectrophotometer (Lambda 750 S). Raman microscopy (LabRam HR Evolution) was recorded at 532 nm. X-ray photon spectroscopy (XPS) was recorded on ESCALAB Xi+ instrument (Thermo Fischer, Al Ka irradiation, 12.5 kV working voltage). For depth-dependent XPS measurements, PPM2.25 was etched using argon-ions (3000 eV) for different time. Differential scanning calorimeter (DSC) was done with DSC2500. Inductively coupled plasma emission (ICP-OES) was conducted with a PerkinElmer 8300 spectrometer. pH values were measured by a digital pH meter (SARTORIUS, pB-10).
Su8010
Manufactured by Thermo Fisher Scientific
Sourced in Japan
The SU8010 is a field emission scanning electron microscope (FE-SEM) produced by Thermo Fisher Scientific. It is designed for high-resolution imaging and analysis of a wide range of samples. The SU8010 provides detailed surface topography and compositional information at the nanometer scale.
Automatically generated - may contain errors
Lab products found in correlation
Tecnai g2 f20, by Thermo Fisher Scientific (6 mentions)
D8 advance, by Bruker (4 mentions)
Escalab 250xi, by Thermo Fisher Scientific (4 mentions)
K alpha, by Thermo Fisher Scientific (4 mentions)
Nicolet is50, by Thermo Fisher Scientific (3 mentions)
Tecnai f20, by Thermo Fisher Scientific (2 mentions)
Escalab xi instrument, by Thermo Fisher Scientific (1 mentions)
Vertex 80 ftir, by Bruker (1 mentions)
Optima 5300 dv, by PerkinElmer (1 mentions)
Quanta 450, by Thermo Fisher Scientific (1 mentions)
Pb 10, by Sartorius (1 mentions)
Quantera 2, by Physical Electronics (1 mentions)
Labram hr800, by Horiba (1 mentions)
Tga dsc1, by Mettler Toledo (1 mentions)
Cobalt nitrate, by Sinopharm (1 mentions)
Pyrrole, by Sinopharm (1 mentions)
Potassium chloride (kcl), by Sinopharm (1 mentions)
Polyvinylpyrrolidone pvp, by Sinopharm (1 mentions)
Sodium hydrogen phosphate na2hpo4, by Sinopharm (1 mentions)
Sodium dihydrogen phosphate nah2po4, by Sinopharm (1 mentions)
15 protocols using su8010
1
Comprehensive Characterization of Polymeric Particles
2
Comprehensive Structural and Chemical Analysis of G-TiO2 Nanotubes
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The morphologies of the samples were determined by scanning electron microscopy (SEM, Hitachi, SU-8010) and transmission electron microscopy (TEM, FEI, Tecnai G2 F20, 80–300 kV) equipped with an energy-dispersive X-ray spectroscopy (EDS). The structures of the samples were characterized by X-ray diffraction (XRD) employing an X-ray diffractometer (D8 Advance, Bruker Inc., 40 kV, 40 mA, a nickel-filtered Cu Kα radiation) and Raman spectroscopy (Horiba Jobin–Yvon, LabRAM HR800). XPS measurements were taken using a Physical Electronics spectrometer (Quantera II, ULVAC-PHI, Inc.) with an Al Kα source (1486.7 eV) to probe the chemical composition. The carbon content of G-TiO2 NTs was quantitatively determined with the aid of a thermogravimetry analyzer (METTLER TOLEDO TGA/DSC1). The conductivity of the samples was measured by using a four-probe resistance measuring system (Guangzhou 4-probe Tech Co. Ltd., RTS-4).
3
Synthesis of Cobalt Nitrate-based Hybrid Materials
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Cobalt nitrate (Co(NO3)3·6H2O) (≥98.5%), pyrrole (≥98%), polyvinylpyrrolidone (PVP) (Mw: 55 000), ammonium persulfate (APS), terbutylhydroquinone (TBHQ) (≥98%), ethanol (C2H5OH) (≥99.7%), N,N-dimethylformamide (DMF) (≥99.5%), sodium hydrogen phosphate (Na2HPO4) (≥99.0%), sodium dihydrogen phosphate (NaH2PO4) (≥99.0%), potassium chloride (KCl) (≥99.0%) were purchased from Sinopharm Chemical Reagent Co., Ltd (Shanghai, China). Sodium p-toluenesulfonate (C7H7SO3Na) (≥99.5%), concentrated sulfuric acid (H2SO4) (≥98.0%) were provided by Damao Chemical Reagent b (Tianjin, China). The deionized water was from a Millipore Autopure system (18.20 MΩ, Millipore Ltd, USA).
The morphology of various materials was observed via scanning electron microscopy (SEM, SU8010, Japan) and transmission electron microscopy (TEM, FEI Talos F200X, USA). The crystal phases were characterized by X-ray diffraction (XRD, Bruker Advance, Germany). The FT-IR spectra was obtained with a Fourier transform infrared spectroscopy (FT-IR, Bruker TENSOR 27, Germany). The Raman spectra was analyzed by Raman spectroscopy (Renishaw, U.K.) with a laser excitation of 532 nm. The X-ray photoelectron spectroscopy data were performed by X-ray photoelectron spectroscopy (XPS, Thermoelectricity Instruments, USA). The CHI 630E electrochemical workstation (Shanghai, China) was used to collect all electrochemical data.
The morphology of various materials was observed via scanning electron microscopy (SEM, SU8010, Japan) and transmission electron microscopy (TEM, FEI Talos F200X, USA). The crystal phases were characterized by X-ray diffraction (XRD, Bruker Advance, Germany). The FT-IR spectra was obtained with a Fourier transform infrared spectroscopy (FT-IR, Bruker TENSOR 27, Germany). The Raman spectra was analyzed by Raman spectroscopy (Renishaw, U.K.) with a laser excitation of 532 nm. The X-ray photoelectron spectroscopy data were performed by X-ray photoelectron spectroscopy (XPS, Thermoelectricity Instruments, USA). The CHI 630E electrochemical workstation (Shanghai, China) was used to collect all electrochemical data.
4
Comprehensive Material Characterization
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All as-synthetized electrodes were characterized by XRD (performed by Bruker D8 Advance instrument) and Raman spectroscopy (performed using Horiba LabRAB HR800 instrument). The sample morphologies were studied using SEM performed by Hitachi SU8010 instrument and TEM (performed by FEI Tecnai F30 instrument). XPS spectra were collected by the ESCALAB 250Xi instrument manufactured by ThermoFisher using Al Kα radiation.
5
Structural Characterization of Single-Atom Fe Catalysts
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The morphology was studied via a field emission scanning electron microscope (FESEM, SU8010, Japan) and a field emission transmission electron microscope (FETEM, FEI Tecnai G2 F20 S-TWIN TMP, Hongkong). The dispersion of single Fe atoms was characterized by atomic-resolution high-angle annular dark-field scanning transmission electron microscopy on a JEOL JEM-ARM200F instrument equipped with a probe spherical aberration corrector. The iron concentrations of the samples were determined via inductively coupled plasma atomic emission spectroscopy. The EXAFS spectra (Fe K-edge) were collected at 1W1B station in the Beijing Synchrotron Radiation Facility (BSRF). The storage rings of BSRF were operated at 2.5 GeV with a maximum current of 250 mA. Using an Si (111) double-crystal monochromator, data collection was carried out in transmission mode using the ionization chamber for the Fe foil and in fluorescence excitation mode using a Lytle detector for FeSA–N–C. All spectra were collected in ambient conditions. The composition of the catalysts was characterized by XRD patterns (D8 Advance, Bruker) and Raman spectroscopy (HR evolution, Horiba Jobin Yvon, France).
6
Nanomaterials Characterization by SEM, TEM
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The morphology characterization, elemental mapping, and size distribution of nanomaterials were characterized by SEM (SU8010), TEM (FEI Tecnai G2 F20), and Nanophox Zetasizer (ZEN3600). Prior to imaging, sample surfaces were sprayed with platinum to improve electroconductibility. Acceleration voltage and magnification of SEM measurement were selected ranging at 5–10 kV and 10–200 k folds, respectively. These parameters of TEM were set ≈100–200 kV and 10–100 k folds, respectively.
7
Comprehensive Characterization of Materials
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The phase composition and crystallization of the products were recorded using a diffractometer (XRD, Bruker AXS-D8) with Cu Kα radiation at a scanning step of 0.03° s−1 over the 2θ range from 10° to 80°. The morphologies of the samples were observed by field emission scanning electron microscopy (FE-SEM, SU-8010, Japan), while the information on lattice and fringe were investigated by high-resolution transmission electron microscopy (HRTEM, FEI Tecnai G2 F20). X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe II XPS) was used to analyze the composition and valence states (a Monochromated Al Kα X-ray source, 1486.6 eV).
8
Comprehensive Characterization of Exfoliated 2D Materials
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A UV–vis–NIR absorption spectrometer (Agilent Cary 5000, USA) was used to characterize the exfoliated 2D materials in dispersion. Optical microscopy (Carl Zeiss Axio Imager 2, Germany), AFM (tapping mode, Oxford Instruments, UK), SEM (Hitachi SU8010, 15 kV, Japan), TEM (FEI Tecnai G2 F30, 300 kV, USA) and a laser particle size analyzer (Malvern Zetasizer Nano-ZS90, UK) were used to characterize the morphology and structure of the exfoliated 2D materials, including their lateral size, thickness, crystal quality, etc. Raman spectroscopy (514 nm laser with a power density of 1 mW cm−2, Horiba LabRAM ER, Japan) was used to examine the quality of the bulk and exfoliated 2D materials. XPS (monochromatic Al Kα X-rays, 1486.6 eV, PHI VersaProbe II, Japan) and FTIR (Thermo Scientific Nicolet iS 50, USA) were used to examine the chemistry of the bulk and exfoliated 2D h-BN. In addition, XPS and powder XRD (with monochromatic Cu Kα radiation λ = 0.15418 nm, Bruker D8 Advance, Germany) were used to examine the purity and crystallinity of the exfoliated 2D materials collected from the supernatant.
9
Comprehensive Structural and Chemical Analysis
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The crystal structures of composites characterized by a Bruker D8 Advance XRD using Cu-Kα radiation (λ = 1.5406 Å) with 2θ range of 15 to 75°. The morphology of as-obtained products was evaluated by SEM (SU8010) and TEM (FEI Tecnai F20). The chemical state and composition of the active materials are obtained using XPS (Thermo Scientific K-Alpha). Raman spectra were recorded on a Renishaw inVia Reflex Raman with a range of 1,000 to 2,000 cm−1. The nitrogen adsorption–desorption isotherms were collected at 77 K by Brunauer–Emmett–Teller (Quantachrome Instruments). The content of SeS2 is evaluated by TGA (SDT Q600).
10
Particle Characterization by SEM and TEM
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SEM (Hitachi, SU8010) and TEM (FEI Tecnai, G2 20) were used to characterize the morphology of the particles. Before SEM observation, a thin layer of golden nanoparticles was deposited on the particle surface. Before TEM observation, the particles were embedded in epoxy resin (SPI-PON 812), cured at 60 °C for 24 h, cut into thin sections (thickness: ~100 nm). In addition, the sections obtained from PTMAEMC-PSDVB HL-HBPs were stained with phosphotungstic acid solution (2 wt% in water, pH = 6.5, ordered from Zhongjingkeyi (China)) for 2 min.
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