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Sem inspect s

Manufactured by Thermo Fisher Scientific
Sourced in United States, Netherlands

The SEM-Inspect S is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It provides advanced capabilities for surface and materials characterization.

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12 protocols using sem inspect s

1

Eltrombopag Disrupts Cryptococcus Cellular Structure

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Example 3

Effects of Eltrombopag on the Cellular Ultrastructure of Cryptococcus

To study the effects of eltrombopag on the cellular structure of Cryptococcus, C. neoformans H99 or C. deuterogattii 8265 was cultured in RPMI 1640 medium containing 0.06 or 0 mg/L eltrombopag at 37° C. for 48 hours, and the cell morphology was examined by scanning electron microscopy (FEI Inspect S SEM, USA).

FIG. 3A and FIG. 3B are the images of C. neoformans H99 and C. deuterogattii R265 cells after incubation for 48 hours in the presence or absence of eltrombopag. According to FIGS. 3A-3B, both of the eltrombopag-treated Cryptococcus species produced a small number of incomplete buds on the cell surface. This phenomenon was not observed in cryptococcal cells without eltrombopag treatment. The results indicate that eltrombopag can inhibit the growth of Cryptococcus by affecting the development of normal cellular structures (such as the cell membrane or cell wall).

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2

SEM and EDX Analysis of Samples

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Selected samples were analyzed with a scanning electron microscope (SEM) with energy dispersive X-ray spectroscopy (EDX). Samples were fixed on carbon tape and coated with gold prior to analysis. A FEI Inspect S SEM was used for image capturing. Point analysis (elemental point composition) was performed on selected substrates (3-5 particles, 15-30 points) with an EDX detector (Oxford Instruments).
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3

Scanning Electron Microscopy of Fillers

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Scanning electron microscopy was performed on the fillers and the samples using an FEI Inspect microscope (SEM-Inspect S, FEI Company, Hillsboro, OR, USA), S model, functional in high-vacuum and low-vacuum, with an accelerating voltage between 200 V and 30 kV (discs). The microscope had a 4096 × 3536 pixel image-processing capability CCD-IR infrared inspection camera in addition to a backscatter electron detector. The images were typically taken at magnifications of 500–1000 times.
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4

Whitening Gel Effects on Composite Biomaterials

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The morphology of the surface of the experimental composite biomaterials before and after application of the three experimental whitening gels (G28®, G29®, G30®, UBB-ICCRR, Cluj-Napoca, Romania) and the commercial gel (Opalescence 15%—GC, Ultradent, South Jordan, UT, USA) was monitored by electronic scanning microscopy (SEM-Inspect S, FEI Company, Hillsboro, OR, USA).
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5

Scanning Electron Microscopy of Tooth Enamel

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Tooth enamel was studied using scanning electron microscopy (SEM Inspect™ S, FEI, Hillsboro, OR, USA) after the shear bond test, bracket debonding, and polishing, the surface morphology of the. This electron microscope generates the image of a sample surface scanning with a focused electron beam. The electrons interact with the enamel atoms and thus produce various signals that provide information regarding the surface topography and chemical composition of the tooth. The specimens were removed from the artificial saliva they were stored in, patted dry with filter paper and analyzed in a low vacuum, 4.5 spot and 25.00 kV, 100× magnifications.
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6

SEM Imaging of Fillers and Samples

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The scanning electron microscopy of the fillers and the samples (discs) was carried out using an FEI Inspect microscope (SEM-Inspect S, FEI Company, Hillsboro, OR, USA), S model, functional in high-vacuum and low-vacuum, tan accelerating voltage between 200V and 30kV. The microscope is equipped with CCD-IR infrared inspection camera and backscatter electron detector, with image processing up to 4096×3536 pixels. Typically, the images were collected with a magnification of 500 and 1000 times.
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7

Surface Analysis of Giomer Materials

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The surface structure of the representative sample for each investigated giomer material, before and after storage in distilled water after a 30-day period, was performed with a scanning electron microscope (SEM-Inspect S, FEI) at a magnification of ×5000.
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8

Characterization of Dental Composite FRCs

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FRC disks of Accolade SRO (A2), Filtek Supreme XT (A3), ELS (Extra Low Shrinkage; A3 op), PermaFlo (A1), StarFlow (A2), and Wave (A3) measuring 8 mm diameter and 1 mm (±0.01) thickness were obtained by curing with an XL3000 photocuring source (3M Dental Products, St Paul, MN, USA) for 60 s. The FRC samples were polished using #800 and #1200 carbide paper. The specimen surfaces were evaluated by SEM (SEM Inspect S, FEI, Eindhoven, Netherlands) at an operating voltage of 15 kV and a magnification of 10.000×.
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9

Morphological Analysis of MiniBars™ FRBC

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The sample morphology of the fly ash, MiniBars™, MiniBars™ FRBC and the structure of the fractured surfaces of MiniBars™ FRBC specimens were investigated using a stereomicroscope (Stemi 2000-C, Carl Zeiss AG, Oberkochen, Germany), as well as SEM (SEM Inspect S, FEI, Eindhoven, The Netherlands). The fly ash, the wood fibers and the surfaces of MiniBars™ FRBC specimens after the FS test were also evaluated using a stereomicroscope (Stemi 2000-C, Carl Zeiss AG).
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10

Investigating Nanohydroxyapatite Characterization

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TEM (H-7650 120 kV automatic microscope, Hitachi, Japan) was used at 80 kV high voltage and 20× magnification to investigate the size and morphology of nHAP. Morphology of the EMs was investigated by scanning electron microscopy (SEM Inspect S, FEI, Eindhoven, Netherlands) using high vacuum, 15 kW, 1000× magnification and 10.7–13.9 mm working distance. The diameter of nHAP from the TEM image and the fiber diameter from SEM image were evaluated using Image J software (U.S. National Institutes of Health, Bethesda, MD, USA). After collecting the data, the mean diameter and standard deviation (SD) were calculated and the graphs were generated.
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