V570 uv visible nir spectrophotometer

Transmission electron microscopy (TEM) images and energy-dispersive X-ray (EDX) spectra of the samples were recorded with a FEI Tecnai G2 20 equipped with an energy-dispersive X-ray detector in operation at 100μkV. UV-vis spectra of the Au/TiO₂ core-shell structures were collected with a Jasco V570 UV/Visible/NIR spectrophotometer (Jasco, Inc., Easton, MD). SERS spectra were obtained with a SENTERRA confocal Raman system (Bruker Optics, Billerica, MA) with a 20× long WD objective and irradiated with 785 nm later (100 mW, 5 seconds integration time). To measure the intensity of the SERS peaks, the background signal from the glass container shown in Fig. S1 is subtracted from all of the obtained spectra. No further post-processing step is applied to the SERS spectra.

UV-vis spectra are recorded with a Jasco V570 UV/Visible/NIR spectrophotometer (Jasco, Inc., Easton, MD). Transmission electron microscopy (TEM) images of the samples were collected with a FEI Tecnai G2 20 in operation voltage at 100 kV Scanning electron microscopy images are measured with a FEI NOVA nanoSEM field emission SEM, (FEI Co., Hillsboro, OR) operating at 5.0 KV. Zeta potential measurements were performed with a Zetasizer (Nano ZS, ZEN3600, Malvern, UK).