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S 4800 field emission scanning electron microscope

Manufactured by JEOL

The S-4800 is a field emission scanning electron microscope manufactured by JEOL. It is designed to provide high-resolution imaging of samples by scanning them with a focused beam of electrons. The S-4800 can achieve high magnification and resolution, making it a versatile tool for materials science, nanotechnology, and other applications that require detailed analysis of surface structures and compositions.

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5 protocols using s 4800 field emission scanning electron microscope

1

Comprehensive Materials Characterization Methods

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The X-ray powder
diffraction patterns
of the products were recorded on a Bruker D8 ADVANCE X-ray diffractometer
equipped with Cu Kα radiation (λ = 0.154060 nm), at a
scanning rate of 0.2° s–1 and 2θ ranging
from 10° to 80°. SEM images were obtained on Hitachi S-4800
field emission scanning electron microscope, operated at 5 kV. TEM/HRTEM
images and SAED pattern of the samples were obtained from a JEOL-2011
transmission electron microscope working at an accelerating voltage
of 200 kV. The room temperature hysteresis loops of the products were
measured using a superconducting quantum interference device operating
at room temperature (300 K) with an applied field up to 1.0 T. UV–vis
absorption spectra were recorded using a Metash 6100 UV–vis
absorption spectrophotometer (Shanghai). The OD of bacteria was measured
using UV-2000 spectrophotometer.
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2

Comprehensive Characterization of GaOOH Nanorods

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The crystal structure of samples was analyzed by a Bruker D8 DISCOVER X-ray diffractometer (XRD). UV-Raman spectra were recorded on a Jobin-Yvon T64000 triple-stage spectrograph with spectral resolution of 2 cm−1. The thermal behavior of the GaOOH nanorod was investigated by thermal gravimetric analyzer (Pyris1 TGA). For the morphological and microstructural analysis, a Hitachi S-4800 field-emission scanning electron microscope (SEM) equipped and a JEOL JEM-2100 transmission electron microscopy (TEM) were utilized. The ultraviolet-visible (UV-vis) absorption spectra were taken using a Hitachi U-3900 UV-vis spectrophotometer. The chemical composition of samples was characterized by a Thermo Scientific K-Alpha X-ray photoelectron spectroscopy (XPS).
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3

Characterization of Photophysical Properties

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All the materials
were bought from commercial sources for use. We recorded the UV–vis
measurements to test the absorption properties of the samples (Agilent
Cary 300) and X-ray diffraction to test the crystal of the samples
(D/MAX 2500, Cu Kα radiation, λ = 1.5405 Å). We characterized
the morphology by transmission electron microscopy (TEM) measurements
(Tecnai G2 F20 S-TWIN transmission electron microscope) and scanning
electron microscopy (SEM) measurements (JEOL S-4800 field-emission
scanning electron microscope). Time-resolved photoluminescence measurements
were performed on a fluorescence spectrometer (FLS980, excitation
source: 560 nm). The obtained decay curves were fitted with exponential
functions (χ2 = 0.9–1.1).
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4

Particle Characterization via Electron Microscopy

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Particle morphology, compositional measurements, and elemental analysis were performed with a Hitachi S-4800 field emission scanning electron microscope, combined with its EDS module, and a JEOL 2010 field emission gun transmission electron microscope.
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5

Particle Characterization via Electron Microscopy

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Particle morphology, compositional measurements, and elemental analysis were performed with a Hitachi S-4800 field emission scanning electron microscope, combined with its EDS module, and a JEOL 2010 field emission gun transmission electron microscope.
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