Quanta 200f

The microstructure of both alloys was investigated using scanning electron microscope (SEM) FEI Quanta 200F (Hillsboro, OR, USA), equipped with EDAX energy-dispersive X-ray spectroscope (EDS) and EDAX electron backscatter diffraction (EBSD) camera (EDAX, Pleasanton, CA, USA), and transmission electron microscope (TEM) Jeol 2200FS (Tokyo, Japan) equipped with Gatan EDS. Samples for SEM were prepared by mechanical polishing with decreasing particle size down to 50 nm. Samples prepared for EBSD were subsequently ion-polished using Leica EM RES102 (Wetzlar, Germany) ion-beam milling system. Samples for TEM were mechanically thinned and subsequently electrochemically polished using Struers Tenupol 5 (Cleveland, OH, USA) in a solution of perchloric acid and methanol. The crystallographic texture was measured by X-ray diffractometer (XRD) PANalytical XPert MRD (Malvern, UK). Cu_K radiation and polycapillary in the primary beam were employed during the measurements. Pole figures from 6 reflections, ( $0002$ ), $10\overline{1}0$ , ( $10\overline{1}1$ ), ( $10\overline{12}$ ), ( $10\overline{1}3$ ), and ( $11\overline{2}0$ ), were measured. Inverse pole figures were calculated using the MTEX toolbox implemented in the Matlab 2020a software [24 (link)].