Tg 209 f1
The TG 209 F1 is a thermogravimetric analyzer (TGA) from Netzsch. It is designed to measure the change in the mass of a sample as a function of temperature or time in a controlled atmosphere. The instrument can be used to analyze a variety of materials, including polymers, ceramics, and metals.
Lab products found in correlation
80 protocols using tg 209 f1
Thermogravimetric Analysis of CMC Blends
Characterization of PLA Films by FTIR
Thermal and Spectroscopic Analysis of RPET and MRPET
TG measurements were performed using the NETZSCH TG 209F1 (Netzsch GmbH, Krakow, Poland) Libra apparatus. RPET and modified RPET (MRPET) samples were tested. The mass of RPET was 4.70 mg and that of modified RPET was 4.84 mg. The test was carried out in the temperature range of 30–65 °C, at a rate of 10 K/min, in an oxidizing atmosphere (15 cm3/min).
In the FTIR study, the FTIR Spectrometer Nicolet iS5 (ThermoScientific, Waltham, MA, USA) was used. The spectrometer was equipped with an ATR iD7 (ThermoScientific, Waltham, MA, USA) diamond attachment. Measurements were made using the spectral range of 4000–400 cm−1 with 32 scans.
Thermogravimetric Analysis of Samples
TG 209 F1
(Netzsch, Germany) instrument. About 5 ∼10 mg of the sample
was put in an alumina crucible and heated from ambient temperature
to 700 °C. The heating rate was set as 10 °C·min–1 (nitrogen atmosphere, flow rate of 20 mL·min–1).
Characterization of FeS Nanostructures
Comprehensive Characterization of TATB Explosive
Thermogravimetric Analysis of Cured Materials
Comprehensive Characterization of Synthesized Composites
Thermogravimetric Analysis under Reconstituted Air
(TGA) curves were recorded under a reconstituted air atmosphere (20%
O2 and 80% N2) with a heating rate of 10 K·min–1 (TG 209 F1, Netzsch).
Thermal and Mechanical Characterization of Films
DSC analysis of the samples was carried out using a DSC 204 F1 (Erich NETZSCH GmbH & Co, Selb, Germany) heat flow differential scanning calorimeter in a temperature range from 30 to 250 °C in an argon atmosphere; the heating rate was 10 °C·min−1.
A DMA 242 C setup (Erich NETZSCH GmbH & Co, Selb, Germany) was used to measure the temperature dependence of the dynamic mechanical characteristics of the films during stretching (Young’s modulus E’, loss modulus E”, and mechanical loss tangent tgδ). The measurements were carried out at a frequency of 1 Hz and a heating rate of 5 °C·min−1. The temperatures of the relaxation transitions were determined from the positions of the maxima or from inflexions of the curves for dynamic parameters.
The X-ray diffraction analysis was performed using a Miniflex 600 (Rigaku Technologies, Inc., Tokyo, Japan) diffractometer (U = 40 kV, J = 15 mA, and a range of angles 2θ from 5 to 50).
Cross-sectional images of the films were taken on a Scios scanning electron microscope (Field Electron and Ion Company, Hillsboro, OR, USA) with a FEG electron source.
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