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99 protocols using spm 9700

1

Characterization of Cationic Nanoparticles

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The measurements of mean diameter and particle size distribution were performed by dynamic light scattering in a ZetaPlus (Brookhaven Instruments Co., Holtsville, NY, USA), equipped with a 90Plus/BI-MAS apparatus, at a wavelength of 659 nm with a scattering angle of 90°. The zeta potential of the particles was measured by laser Doppler anemometry using the same equipment. All analyses were performed at 25 °C. Experimental values are given as the mean ± SD for the experiments carried out in triplicate for each sample.
The shape and topographical images of the samples were observed on atomic force microscopy (AFM) images (SPM-9700, Shimadzu, Tokyo, Japan) using a silicon tip probe (Nanoworld, Neuchatel, Switzerland,). The dispersions were freshly diluted with purified water at a ratio of 1:25 (v/v), dropped on a cover slip, dried under a desiccator for 24 h, and then analyzed using an AFM (SPM-9700, Shimadzu, Tokyo, Japan) at room temperature by scanning with a cantilever (non-contact) at 1 Hz.
The physical stability study was performed with cationic nanoparticles with or without BJ venom. Analysis was performed for 45 days, evaluating the mean size, zeta potential and polydispersity index. The particles were stored in a freezer at 5 °C ± 2 °C; before analysis, the samples were stabilized at 25 °C ± 2 °C.
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Atomic Force Microscopy Enamel Surface Analysis

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AFM images of the enamel surface after 14 days of pH cycling were captured with an Atomic Force Microscopy (SPM9700; Shimadzu, Kyoto, Japan), which was equipped with an AFM silicon probe (Shimadzu, Kyoto, Japan) and a laser scanner (30 μm × 30 μm × 5 μm). The scanning size rate was 10 µm × 10 µm and 1 Hz, respectively. For each sample, five different fields were randomly selected, and the surface roughness (Ra) of each field was analyzed by the Shimadzu SPM-9700 software (Shimadzu, Kyoto, Japan). Then the average surface roughness of each sample and each group was calculated.
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3

Visualizing DNA using High-Throughput AFM

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For AFM imaging using an SPM-9700 (Shimadzu, Kyoto, Japan) with a High-Throughput Scanner (Shimadzu, Kyoto, Japan), 0.3 μM DNA was dissolved in 10 mM Tris–HCl buffer (pH 7.5) including 10 μM spermidine or in 0.05% TnT Quick Master Mix (in vitro gene expressions reaction mixture). The DNA solutions were transferred onto a freshly cleaved mica surface and then incubated for 10–30 min at room temperature (24 °C). Subsequently, the samples were rinsed with ultra-pure water, dried with nitrogen gas and imaged by AFM. All measurements were performed in air using the tapping mode. The cantilever, OMCL-AC200TS-C3 (Olympus, Tokyo, Japan), was 200 μm long with a spring constant of 9–20 N/m. The scanning rate was 2 Hz and images were captured using the height mode in a 512 × 512 pixel format. The obtained images were plane-fitted and flattened by the computer program supplied with the imaging module.
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4

Comprehensive Microstructural Analysis of MoS2 Nanofibres

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The microstructure of the MoS2 NFs was examined using field-emission SEM (FE-SEM; Crossbeam 540, ZEISS, Ulm, Germany) and TEM (JEM-ARM200F, JEOL, Tokyo, Japan). TEM samples were prepared by drying a droplet of the MoS2 NF suspension on a Lacey carbon grid. For AFM (SPM-9700 from Shimadzu, Kyoto, Japan), NFs were deposited on a Si substrate by spin-coating. XPS measurements were carried out on a Quantera-Ⅱ system from ULVAC-PHI (Chigasaki, Kanagawa, Japan). TGA (TGA92-18, Setaram, Caluire, France) was used to determine the weight of functional groups under an N2 atmosphere at a heating rate of 10 °C/min. A UV–visible analysis of dispersibility was conducted (Cary-5000, Agilent, Santa Clara, CA, USA). Raman spectra were measured using a micro-Raman spectrometer (RAMANtouch, Nanophoton, Bundang-gu, Republic of Korea). XRD patterns were obtained (JP/SmartLab, Rigaku, Tokyo, Japan) at a power of 9 kW.
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5

Sericin-Based Ophthalmic Formulations with Nanoparticles

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The 1% sericin solution and nanoparticles (MHN) were prepared using a bead mill method reported by previous study [21 (link),22 (link),23 (link),24 (link)]. The sericin ophthalmic formulations (Sericin/MH fixed combination) containing MHP (P-Ser) or MHN (N-Ser) were prepared by mixing the sericin solution and MH formulations (MHP and MHN). Figure 1 shows the scheme in the preparation process of N-SER. The final concentrations in the P-Ser and N-Ser were as follows: sericin 1%, MH 0.01%, MC 0.5%, BAC 0.005%, mannitol 0.5%, pH8.5, isotonization, sterilized). The size of the MH particles N-Ser was determined by both a laser diffraction particle size analyzer SALD-7100 (Shimadzu Corp., Kyoto, Japan) and dynamic light scattering NANOSIGHT LM10 (Quantum Design Japan, Tokyo, Japan). The Atomic Force Microscope (AFM) images of MHNand N-Ser were provided by an SPM-9700 (Shimadzu Corp., Kyoto, Japan) [21 (link),22 (link)].
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6

Characterizing Graphene Surface Modification

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Atomic force microscopy (AFM) and Raman spectroscopy analyses were performed to confirm the modification of the chelating agents on the graphene surface. For pristine graphene, graphene devices were prepared using the above process without modifying the chelating agents, and the AFM (SPM-9700, Shimadzu, Kyoto, Japan) and Raman spectra were measured (NRS-4500, JASCO, Tokyo, Japan). A laser with an excitation wavelength of 523 nm was used for the Raman measurements.
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7

Characterizing mRNA-Decorated MICA Nanoparticles

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MgCl2 solution (10 mM) was added onto MICA, followed by the addition of PEG-mRNA solution with a final mRNA concentration of 5.55 ng/μL. After a 1 min incubation, MICA was washed once with distilled water. AFM observations were conducted in the tapping mode under the air phase mode using SPM9700 (Shimadzu Co., Kyoto, Japan) with a micro cantilever OMCL-AC240TS-C2 (70 kHz resonance frequency and 2 N/m spring constant; Olympus Co., Tokyo, Japan). Obtained AFM images were processed by flattening them to remove the background using software. Height, long axis, and short axis were calculated by measuring 100 individual particles.
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8

Characterization of WSe2 and WS2

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Raman and photoluminescence characterizations of WSe2 and WS2 were obtained by confocal Raman spectroscopy (LabRAM HR800) with a 532-nm laser wavelength. AFM (Shimadzu SPM-9700) was used to measure surface topology. The SHG experimental system mainly includes a femtosecond laser (Coherent Mirra 900F), electron multiplying charge-coupled device (Andor Newton 970), and spectrometer (Andor 500i). Scanning electron microscopy (SEM; SU8010) and transmission electron microscopy (TEM; Thermo Fisher Scientific Tecnai F20) were used to observe the structure of the devices.
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9

Spectroscopic Characterization of Organic Compounds

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The 1H and 13C NMR spectra were recorded in solutions on a BrukerAV600 (600 MHz) spectrometer. The 1H and the 13C NMR chemical shifts were reported as δ values (ppm) relative to external Me4Si. The coupling constants (J) were given in hertz. High resolution FAB mass spectra were recorded on a JMS-700 MStation spectrometer. FAB MS spectra were measured with 3-nitrobenzyl alcohol (NBA) as the matrix. Analytical thin layer chromatography (TLC) was performed on silica gel 60 F254 Merck. Column chromatography was performed on KANTOSi60N (neutral). Absorption and reflectance spectra were recorded on a SHIMADZU UV-3600. IR spectra were performed by SHIMADZU IRPrestige-21 spectrophotometer. AFM measurements were tested by SHIMADZU SPM-9700. The elemental analyses were recorded on a Yanaco CHN recorder MT-6. THF was distilled from sodium benzophenon ketyl. Toluene was distilled from CaH2. Other solvents and reagents were of reagent quality, purchased commercially, and used without further purification.
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10

Characterization of ZnTPPS/C10S/LDH Transparent Film

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The XRD analysis of each transparent film was performed on a MiniFlex II powder X-ray diffractometer (Rigaku, Tokyo, Japan) equipped with an Ni-filtered Cu-Kα radiation source (30 kV, 15 mA; scan rate: 1°/min; sampling step: 0.02°). Infrared spectroscopy studies were performed on each transparent film using the attenuated total reflection (ATR) method on an FT/IR 6100 spectrometer (JASCO, Tokyo, Japan). The amount of ZnTPPS incorporated in the transparent ZnTPPS/C10S/LDH film was determined from the absorption spectrum of its dimethyl sulfoxide (DMSO) solution, which was prepared by dissolving the residual ZnTPPS collected by evaporation in DMSO. The PL spectra of the transparent ZnTPPS/C10S/LDH film were measured using a spectrofluorometer (FP-6600, JASCO, Tokyo, Japan) at 25 ℃ under ambient conditions. The AFM images were acquired using a scanning probe microscope (SPM-9700, Shimadzu, Kyoto, Japan).
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