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Nanolab g3

Manufactured by Thermo Fisher Scientific

The Nanolab G3 is a high-performance laboratory instrument designed for nanoscale imaging and analysis. It provides advanced capabilities for visualizing and characterizing materials at the nanometer scale. The Nanolab G3 utilizes state-of-the-art electron microscopy technology to deliver reliable and precise data, enabling researchers to gain deeper insights into the structure and properties of their samples.

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6 protocols using nanolab g3

1

Scanning Electron Microscopy Analysis of Precipitates

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Precipitates
from different experiments were attached to carbon stickers and coated
with 6 nm of platinum before being examined using a FEI Helios Nanolab
G3 scanning electron microscope (SEM) equipped with a focused ion
beam. Chemical analysis of the precipitates was conducted during the
SEM analysis using energy dispersive X-ray spectroscopy (EDX). Lithium
cannot be analyzed using conventional EDX detectors; therefore, the
presence of C and O, but absence of a cation, was used to identify
the Li-carbonate phase. Crystal aspect analysis was conducted based
on the system described by Um et al.26 (link) for
ice crystals, which show a morphology similar to the crystals formed
in the synthesis experiments. Analysis of crystal morphology aspect
parameters: total length, total width, height from central face to
top of crystal, width of central face, and width of side faces, was
conducted in Adobe Photoshop. Crystals used in the aspect analysis
were chosen that were lying with the longest crystal axis parallel
to the electron beam to limit measurement errors due to image perspective
effects. In addition, only crystals where the entire length of the
crystal could be seen were chosen. These requirements limited the
number of crystals that were measurable, and thus aspect ratios for
10 crystals from each experiment without and with the highest concentration
of additional ions were obtained.
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2

Structural Characterization of Materials

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XRD measurements were performed
on a Bruker D2 PHASER diffractometer using Co Kα (1.789 Å)
radiation. SEM images were obtained on FEI Helios Nanolab G3 with
accelerating voltage of 5.0 keV and probe current of 25 pA.
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3

Cryo-EM Sample Preparation using FIB-SEM

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With the modified workflow, as Schaffer et al., 2017 (link) reported, cryo-EM grid was first transferred to Helios NanoLab G3 (FEI) system. A layer of Au was sputtered to the surface of cryo-EM sample to increase the conductivity. A layer of protective organometallic platinum was then deposited on the top of the sample with the GIS system. The working distance was 10 mm, and the GIS temperature was set to 46°C. Ga2+ ion beam was used to milling the cells at a 5° stage tilt. The beam current for rough milling was 0.79 nA and gradually decreased to 40 pA. The lamella was finally polished to about 150 nm in thickness with the beam current of 24 pA.
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4

Characterization of MnO2 Nanowires

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Crystallographic information was collected by Bruker D8 Discover X-ray diffractometer with a non-monochromate Cu Kα X-ray source (tube current: 40 mA, tube voltage: 40 kV). Raman spectra were obtained by Horiba LabRAM HR Evolution. The FESEM image was recorded using a JEOL JSM-7001F microscope at an acceleration voltage of 20 kV. The STEM images were collected in a CEOS probe corrected FEI Themis TEM with300 kV accelerating voltage and the cross-sectional MnO2 nanowire sample was prepared by a dual-beam FIB (FEI Helios Nanolab G3). AFM images were measured by AIST-NT SmartSPM 1000 Scanning Probe Microscope. XPS analysis was performed by Thermo Fisher Scientific ESCALAB 250Xi XPS System with Al Kα source. The binding energy was corrected by the C 1s peak (284.6 eV) for the adventitious carbon.
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5

Preparation of Cross-Sectional TEM Samples

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A cross-sectional specimen of the device was prepared by using a lift-out process in a dual-beam FEI Helios NanoLab G3 focus ion beam (FIB) system. A carbon layer of about 30 nm was first coated onto the samples' surface to increase the electrical conductivity using a Cressington 208carbon coating system. The TEM images of the sample were then obtained using Talos F200S high-resolution transmission electron microscopy.
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6

Structural Characterization of Tribofilm

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The cross-sectional samples for tribofilm and subsurface analysis and characterisation were prepared by FIB following standard procedures using the FEI Helios Nanolab G3 with a Ga + ion source operated at 30 kV. The structure and chemical composition of the interface, tribofilm and the subsurface were examined using a cold field emission gun (c-FEG) JEOL F200 TEM coupled with a twin, solid-state, ultra-sensitive large silicon drift detectors (SDD) EDX system operating at 200 kV.
Precession electron diffraction (PET) using the NanoMegas STAR TM PET and ASTAR TM ACOM-TEM systems integrated into the JEOL F200 TEM was used to acquire the orientation data for the calculation of the geometrically necessary dislocation (GND) density. A precession angle of 1.4 °was configured for all experiments. The precession frequency was 100 Hz and a beam spot size of 2 nm was used. A step size of 7 nm for both x and y directions was used for the OCP and -0.95V samples and 2 nm for the + 0.5V and PBS only samples. The diffraction patterns were collected at a camera length of 150 nm. Once collected, the dataset was matched against diffraction patterns in the database and indexed automatically by Index software (NanoMegas, Belgium). The data was then exported and post-processed by the customised MATLAB scripts (originally from MTEX [33] ) to calculate the grain boundary (GB) and GND density.
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