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Cb 340

Manufactured by Zeiss
Sourced in Germany

The CB 340 is a high-precision microscope camera system from Zeiss. It features a large sensor size and advanced optics to capture detailed, high-quality images of microscopic samples.

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9 protocols using cb 340

1

Platinum Coating for SEM Imaging

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Scanning electron microscopy (SEM) images were recorded with the scanning electron microscope CB 340 from Zeiss (Oberkochen, Germany) at an acceleration voltage of 2.0 kV. For a better electrical conductivity, surfaces of the samples were sputtered with a 4 nm thick platinum layer using the High Vacuum Coater Leica EM ACE 600 (Emitech, Molfetta, Italy).
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2

Scanning Electron Microscopy Cell Analysis

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After 48 h of culture, cells were washed with PBS- for four times, fixed in 6% glutardialdehyde in PBS- at 4 °C for 15 min and washed five times with chilled PBS for 5 min each. Samples were dehydrated in an ascending acetone series at room temperature. After critical point drying (Critical Point Dryer CPD 030, Bal-Tec, Witten, Germany) and coating with 2 nm of platinum (EM ACE600, Leica, Vienna, Austria), samples were analyzed by SEM (Zeiss CB 340).
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3

Characterization of Synthesized β-TCP

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The phase structure of synthesized β-TCP was evaluated using an x-ray diffractometer (XRD, miniflex600, Rigaku Corporation, Japan) with a scanning rate of 2° 2θ per min over a range of 2θ = 10°–90°. Transmission electron microscopy (TEM, TECNAI G2 Spirit TWIN, Thermo Fisher Scientific Inc., United States) was used to determine the size and morphology of the β-TCP powders.
The crosslinked starch microspheres were analyzed using Fourier transform infrared (FTIR, Nicolet iS50 + iN10, Thermo Fisher Scientific Inc., United States) spectra and scanning electron microscopy (SEM, CB 340, Carl Zeiss Microscopy GmbH, Oberkochen, Germany).
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4

Characterization of Nanotube Surface Morphology

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The surface morphology of all samples was determined by scanning electron microscopy (Zeiss CB 340, Oberkochen, Germany) and atomic force microscopy (Nanosurf FlexAFM, Nanosurf GmbH, Langen, Germany). The average values of the inner diameters obtained by analysis of scanning electron microscopy (SEM) images of the different nanotube surfaces are arithmetic mean values of 20 nanotubes per specimen. For the analysis and quantification of surface roughness, the standard atomic force microscopy (AFM) instrument software Nanosurf Easyscan 2 was applied. The line roughness values of three different positions on each sample were analyzed with scan field sizes of approximately 5 µm × 5 µm. The measurements were performed in air under tapping mode, using a scan speed of 0.3 s/line, and a silicon cantilever Tap190-Al G (Innovative Solutions Bulgaria Ltd, Sofia, Bulgaria) with a tip radius of about 10 nm or smaller [36 ].
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5

Mechanical Characterization of Dental Laminates

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The prefabricated laminates were cut into bars with a size of 4 × 45 mm2 using two parallel cutter blades (n = 10), stored for 24 h at 37 °C and >90% humidity and finally cured in water for another 24 h at 37 °C.
Force-displacement curves were recorded in a 4-point-bending test setup according to ISO 6872 on a universal testing machine with a crosshead speed of 1 mm/min and a 2.5 kN load cell and used to calculate bending strength σb (MPa) and bending modulus E (MPa) as follows (Equations (1) and (2)): σb=3×lA×Fmaxb×a2
E=3×lA×lB2×(FHFL)4×X×b×a3
where lA = 10 mm is the span length, lB = 20 mm is the length of the reference bar, Fmax (N) is the maximum occurring force, FH (N) is the end and FL (N) the starting force of the bending modulus calculation, X (mm) is the bar bending, b (mm) is the bar width and a (mm) is the bar height. The areas under the stress-displacement-curves were calculated up to σb as a measure for fracture energy.
Scanning electron microscopy (SEM) of the fiber mats and the cement laminates was performed with a crossbeam scanning electron microscope (SEM, CB 340, Carl Zeiss Microscopy GmbH, Oberkochen, Germany) with an acceleration voltage of 2 kV. Before analysis, the samples were sputtered with a 4 nm platinum layer.
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6

Scanning Electron Microscopy Sample Preparation

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Scanning electron microscopy (SEM) images were recorded with a scanning electron
microscope (CB 340, Zeiss, Oberkochen, Germany) with an acceleration voltage of
2.0–5.0 kV. The samples were prepared using a ceramic knife and sticking small
pieces on self-adhesive stripes on the SEM plates. For a better electrical
conductivity, the surface of the samples was sputtered with a 4-nm-thick
platinum layer using the High Vacuum Coater Leica EM ACE 600 (Emitech, Molfetta,
Italy).
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7

Topographic Visualization of TiN Coating in Stainless Steel Tubes

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In order to observe the topography of the TiN coating inside of the stainless steel tubes they were first cut to quarters. The pieces were washed with acetone (Carl Roth, Karlsruhe, Germany) and finally coated with a 2 nm layer of platinum in a sputter coater (EM ACE600; Leica, Vienna, Austria). The image of the TiN coating inside of the stainless steel tube was then taken on a scanning electrode microscope (SEM; CB 340; Zeiss, Oberkochen, Germany), (Figure 3f).
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8

Platinum-Coated SEM Imaging Protocol

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Images were obtained using SEM (Zeiss CB 340, Carl Zeiss Microscopy
GmbH, Göttingen, Germany), accelerating voltage = 2.0 kV. Prior to imaging,
samples were coated with platinum (≈2 nm thick) (EM ACE600, Leica, Germany).
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9

Platinum-Coated SEM Imaging Protocol

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Images were obtained using SEM (Zeiss CB 340, Carl Zeiss Microscopy
GmbH, Göttingen, Germany), accelerating voltage = 2.0 kV. Prior to imaging,
samples were coated with platinum (≈2 nm thick) (EM ACE600, Leica, Germany).
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