Cb 340
The CB 340 is a high-precision microscope camera system from Zeiss. It features a large sensor size and advanced optics to capture detailed, high-quality images of microscopic samples.
9 protocols using cb 340
Platinum Coating for SEM Imaging
Scanning Electron Microscopy Cell Analysis
Characterization of Synthesized β-TCP
The crosslinked starch microspheres were analyzed using Fourier transform infrared (FTIR, Nicolet iS50 + iN10, Thermo Fisher Scientific Inc., United States) spectra and scanning electron microscopy (SEM, CB 340, Carl Zeiss Microscopy GmbH, Oberkochen, Germany).
Characterization of Nanotube Surface Morphology
Mechanical Characterization of Dental Laminates
Force-displacement curves were recorded in a 4-point-bending test setup according to ISO 6872 on a universal testing machine with a crosshead speed of 1 mm/min and a 2.5 kN load cell and used to calculate bending strength σb (MPa) and bending modulus E (MPa) as follows (Equations (1) and (2)):
where lA = 10 mm is the span length, lB = 20 mm is the length of the reference bar, Fmax (N) is the maximum occurring force, FH (N) is the end and FL (N) the starting force of the bending modulus calculation, X (mm) is the bar bending, b (mm) is the bar width and a (mm) is the bar height. The areas under the stress-displacement-curves were calculated up to σb as a measure for fracture energy.
Scanning electron microscopy (SEM) of the fiber mats and the cement laminates was performed with a crossbeam scanning electron microscope (SEM, CB 340, Carl Zeiss Microscopy GmbH, Oberkochen, Germany) with an acceleration voltage of 2 kV. Before analysis, the samples were sputtered with a 4 nm platinum layer.
Scanning Electron Microscopy Sample Preparation
microscope (CB 340, Zeiss, Oberkochen, Germany) with an acceleration voltage of
2.0–5.0 kV. The samples were prepared using a ceramic knife and sticking small
pieces on self-adhesive stripes on the SEM plates. For a better electrical
conductivity, the surface of the samples was sputtered with a 4-nm-thick
platinum layer using the High Vacuum Coater Leica EM ACE 600 (Emitech, Molfetta,
Italy).
Topographic Visualization of TiN Coating in Stainless Steel Tubes
Platinum-Coated SEM Imaging Protocol
Platinum-Coated SEM Imaging Protocol
GmbH, Göttingen, Germany), accelerating voltage = 2.0 kV. Prior to imaging,
samples were coated with platinum (≈2 nm thick) (EM ACE600, Leica, Germany).
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