Labram hr evolution raman spectrometer

High-pressure Raman spectra were collected on the same samples as used for the single-crystal data collections of pyridine-h₅ phases II and III using a Horiba LabRAM HR Evolution Raman Spectrometer equipped with a CCD detector. Raman spectra were measured using a 633 nm excitation laser, with 1200 lines mm⁻¹ grating and a spectrometer focal length of 800 mm. Spectra were collected between 50 and 3400 cm⁻¹, with a resolution of 1 cm⁻¹. Raman spectra were collected from a ca 2 µm spot size on static pressure samples at 293 K. Spectra plotted over the complete range collected are shown in Figs. S1–S4 of the supporting information. Spectra extracted from the literature were analysed using getData Graph Digitizer (v2.26).

The UV-visible absorption spectra of the colloidal solution of NPs were measured in the spectral region of 200–800 nm using a Cary 300 (Agilent Technologies) double-beam spectrophotometer. The liquid samples were used for UV-visible measurements that were collected from the ablation vessel during dielectrophoretic deposition. X-ray diffraction (XRD) measurements of the MoS_x samples were done using a Bruker-D8-Focus X-ray diffractometer with $Cu-K\alpha (\lambda =1.5406\AA )$ line. The Raman spectra of different MoS_x samples were measured using a Labram HR Evolution Raman spectrometer (Horiba Jobin Yvon). The X-ray photoelectron spectra of MoS_x samples were recorded using Thermo Escalab 250XI X-ray photoelectron spectroscopy with AlKα X-ray source. For XRD, Raman and XPS measurements the electrophoretic deposition was done on ITO coated glass substrate during laser ablation. The HITACHI S4800 scanning electron microscope was used to take the SEM measurements of the MoS_x/NiF electrocatalysts under the acceleration voltage of 15 kV. All the energy-dispersive X-ray spectroscopy (EDS) spectra were also collected by mapping the electron beam at the same acceleration voltage.

Electrode morphologies were characterized using a field‐emission scanning electron microscopy (Zeiss Gemini 300, Germany). X‐ray diffraction method (Bruker D8 Advance, Germany) was used to investigate the phase composition of the electrocatalysts at a scan speed of 2° min⁻¹ from 20° to 80°. HRTEM and SAED were performed on JEOL JEM‐F200 at an acceleration voltage of 200 kV. Corresponding element mapping and energy spectrum were acquired by JED‐2300T. Mo grid was selected for avoiding the possible Cu contamination from normal Cu grid. FT‐IR spectroscopy was equipped with a diffuse‐reflectance cell and collected by Thermo Scientific Nicolet iS50 at room temperature. Surface composition and chemical states of the prepared electrodes were measured by XPS, which were acquired by a Thermo Scientific ESCALAB 250Xi spectrometer equipped with a 150 W monochromatic Al‐K radiation. Contact angles of drops on electrodes were measured by the sessile drop method (RAMÉ‐HART 290‐U1, USA). Raman spectra were obtained using Horiba LabRam HR Evolution Raman spectrometer. The wavelength and power of the laser were set at 532 nm and 2.5 mW, respectively.

Raman spectroscopy measurements
were performed using a LabRAM HR Evolution Raman spectrometer (Horiba
Scientific) and excited with laser (Torus MPC 3000) with a wavelength
of 532 nm (excitation energy E_L = hω_L = 2.33 e) through an optical fiber,
with an objective lens of 100×, NA = 0.8, and a laser spot of
0.4 μ. The laser power was kept below 2 mW and the diffraction
grating was 600 mm/groove. The range of the Raman spectra collected
spanned the wavenumber region 1200–3000 cm^–1. The Raman peak position was calibrated based on the first order
Raman signal of silicon, at 520.7 cm^–1.

All Raman spectra were recorded using a Raman spectrometer (LabRAM HR Evolution Raman Spectrometer, HORIBA Scientific Ltd.) in the range of 400–4000 cm⁻¹. An Ar+ laser with a wavelength of 532 nm and power of 50 mW was used for Raman excitation. Spectra were acquired using a 10 × objective within 3 s. Three spectra per location were recorded in the wavenumber interval of 400–4000 cm⁻¹. To exclude experimental interference and artifactual errors, three Raman spectra of each sample were recorded at different positions in the same plane.

Thermogravimetric analysis (TGA) was performed on Q500 equipment (TA Instruments^®, New Castle, DE, USA). EG, f-EG, and [(f-EG)+Ag] were placed in a platinum crucible and heated from 40–800 °C at 10 °C min⁻¹ under a nitrogen atmosphere of 50 mL min^‒1.
Raman spectra were acquired using a LabRAM HR Evolution Raman spectrometer with a microscope (Horiba Scientific, Piscataway, NJ, USA) using a laser with a wavelength of 532 nm and a grating of 600 gr mm^‒1. The results were analyzed with the Horiba Scientific’s Labspec 6 (version 6.4.4) Spectroscopy Suite Software (Horiba France SAS, Longjumeau, France) and the peak positions were determined by applying a baseline (in LabSpec 6).
Scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS) were carried out using a FEI Nova 200 FEG-SEM/EDS (FEI Europe Company, Hillsboro, OR, USA). The samples were previously sputtered with a gold layer, using a sputter coater 108A (Cressington, Watford, UK).