Tecnai g2 20 microscope

XRPD investigation was carried out on the dry samples, using a PW3050/60 X’Pert Powder X-Ray Diffractometer (Malvern Panalytical, Malvern, UK) in a spinner configuration to eliminate the preferential orientation of the powder (1 rotation/s). Diffractograms were collected between 5–120° (2θ), using Cu-Kα radiation at 45 kV and 40 mA, a step size of 0.015°, a time per step of 200 s, and a scan speed of 0.0106°/s. The Rietveld refinement [49 ] of the measured diffraction patterns was performed with Materials Analysis Using Diffraction (MAUD) software [50 (link)]. The instrumental function was determined using the LaB₆ NIST standard (660b).
The crystallinity was also checked by High Resolution Transmission Electron Microscopy (HR-TEM) analysis of the particles that were dispersed and deposited on a Cu grid, as described above. The instrument used was a Philips Tecnai G2 20 microscope, with a LaB₆ source, operating at 200 keV. TEM micrographs were analyzed using the software ImageJ to individuate the d-spacing of the crystal lattice.

SEM images were obtained on an FESEM Hitachi S4800 microscope. TEM imaging was carried out on an FEI Tecnai G² 20 microscope operating at 200 kV. XRD patterns were acquired on Philips X’ Pert system equipped with Cu K α radiation (λ = 1.5419 Å, scanning rate = 1.0°/min). The HRTEM were taken on Tecnai G² 20 S-TWIN operated at 200 kV accelerating voltage. XPS was measured on a Thermo ESCALAB 250 system. The extinction spectra of the Au NCs were acquired on a Hitachi U-3900 with cuvettes with a 0.5-cm optical path length. ICP-AES was conducted by Optima 5300 DV (Perkin Elmer).