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Ems 575 x sputter coater

Sourced in Germany, United States

The EMS 575-X sputter coater is a laboratory instrument designed to deposit thin metal or carbon coatings onto samples for various microscopy and analytical applications. It utilizes a sputtering process to create uniform, high-quality coatings on specimen surfaces.

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4 protocols using ems 575 x sputter coater

1

Scanning Electron Microscopy Preparation

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Coverslip cultures were fixed in 2.5% glutaraldehyde, 1% paraformaldehyde, 0.12 M sodium cacodylate buffer, pH 7.3, postfixed with 1% OsO4 in the same buffer, dehydrated in an ethanol series and critical point dried out of CO2 in a Samdri-795 critical point dryer (Tousimis Research Corp, Rockville MD). The dried coverslip cultures were coated with 5nm of gold in an EMS 575-X sputter coater (Electron Microscopy Sciences, Hatfield PA) and imaged with a Hitachi S-3400 N1 scanning electron microscope (Hitachi High Technologies America, Inc., Pleasanton CA).
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2

Correlative Light and Electron Microscopy

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Optical imaging of fluorescent samples was performed with LSM 780 confocal laser scanning microscope (Carl Zeiss, USA). Once confocal images were obtained, culture dishes (MatTek glass bottom, P35G-1.5–14-CGR) were fixed in 2.5% glutaraldehyde, 1% paraformaldehyde, 0.1M sodium cacodylate buffer, pH 7.4, rinsed in cacodylate buffer, post fixed with 1% OsO4 in the same buffer, and dehydrated in an ethanol series. The coverslips were removed from the dish, dried using a Samdri-795 critical point dryer (Tousimis Research Corp, Rockville MD), coated with 5 nm gold in an EMS 575-X sputter coater (Electron Microscopy Sciences, Hatfield PA) and imaged with a Zeiss Crossbeam 540 (ZEISS, Jena Germany). Alignment of light and scanning electron microscopy images was done with the eC-CLEM plugin. Firstly, the LM image was aligned based on manually inserted landmarks. After this coarse alignment, a finer alignment was performed by registering the center of several (15 to 20) clearly identified labelled structures and their corresponding signals on the SEM micrographs.
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3

Scanning Electron Microscopy of Spray Dried Powder

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Electron micrographs were collected with a Teneo SEM (ThermoFisher Scientific, United States) under low vacuum conditions of 0.4 mbar, using a large field detector, 10 kV accelerating voltage, 0.1 nA and a working distance of 10 mm. For preparation, spray dried powder samples were fixed on aluminum stubs with adhesive carbon discs. The samples were sputter coated for 90 s with 60:40 gold:palladium in a EMS575X sputter coater (Electron Microscopy Sciences) with a final coating thickness of approximately 18 nm.
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4

Ultrastructural Characterization of Engineered NK Cells

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Ten million expanded NK cells were electroporated (as described above) with either CXCR4R334X mRNA or mock-transfected with vehicle alone. Non-transfected NK cells and mock-transfected (vehicle only) from the same donor were used as controls. Eight hours following transfection, 1 × 106 NK cells were fixed in 4% glutaraldehyde (0.1M calcium chloride, 0.1M sodium cacodylate buffer, pH 7.2) over night at 4°C and prepared as described previously (14 (link)). Subsequently, cells were washed twice in 0.1M cacodylate and post-fixed using 1% OsO4 in 0.1M cacodylate buffer for 1 h. Cells were than dehydrated in an ethanol gradient series (30, 50, 70, 85, 95, and 100%). Afterwards samples were critically point dried with the Samdri-795 critical point dryer (Tousimis Research Corp, USA), mounted on aluminum stubs, and coated with 7.5 nm gold/palladium with an EMS 575-X sputter coater (Electron Microscopy Sciences, USA). Samples were imaged using the Hitachi S-3400N1 SEM at 7.5kV.
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