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Nicolet nexus 6700 ftir spectrometer

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Nicolet Nexus 6700 FTIR spectrometer is a laboratory instrument used for infrared spectroscopy. It is designed to analyze the composition of materials by detecting and measuring the absorption, emission, or reflection of infrared radiation.

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3 protocols using nicolet nexus 6700 ftir spectrometer

1

Characterization of Porous Materials by TEM, Sorption, and NMR

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Transmission electron microscopy (TEM) images were taken using a JEOL 1010 operated at 100 kV. For TEM characterization, samples were dispersed in ethanol via ultrasonication, then dried on the carbon film on a copper grid. Nitrogen sorption analysis was conducted by a Micromeritcs Tristar II 3020 system at 77 K. The samples were degassed at 393 K for 12 h and 453 K for 6 h for MONs and MSNs, respectively, under a vacuum before measurement. The Barrett–Joyner–Halenda (BJH) method was used to calculate the pore size of samples from the adsorption branches of the isotherms, and the Brunauer Emmett–Teller method was utilized to calculate the specific surface areas. The total pore volume was derived from the adsorbed volume at the maximum relative pressure (P/P0) of 0.99, which attenuated total reflectance Fourier transform infrared spectroscopy (FTIR) analysis was conducted on a Thermo Nicolet Nexus 6700 FTIR spectrometer equipped with Diamond ATR Crystal. A solid-state Bruker Advance III spectrometer was used for 13C cross-polarization magic-angle spinning (CPMAS) and 29Si magic angle spinning (MAS) nuclear magnetic resonance (NMR) spectra with 7T (300 MHz for 1H) magnet, Zirconia rotor, 4 mm, rotated at 7 kHz. The zeta potential was measured three times using a Zetasizer Nano instrument by dispersing particles into deionized water under sonication.
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2

Comprehensive Characterization of Cr-based Catalysts

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The surface morphologies of the catalysts and elemental mappings (Cr, S) were observed using a JSM-6510LV scanning electron microscope (SEM) from JEOL Ltd., Japan. X-ray photoelectron spectroscopy (XPS) patterns of samples were determined with a monochromatic Al Kα X-rays from Thermo Scientific ESCALAB 250Xi. Fourier transform infrared (FTIR) spectra were recorded on a Nicolet NEXUS-6700 FTIR spectrometer from Thermo Fisher Scientific Inc., USA, in the wave number range of 400–4000 cm−1. Thermogravimetric (TG) analysis was conducted under nitrogen flow by using a TGA/SDTA851 thermal analyzer from Mettler-Toledo International Inc., USA. A sample was placed in a sample pan and heated from room temperature to 350 °C at a heating rate of 10 °C min−1. The N2 physisorption isotherms were recorded by an ASAP 2460 system surface analyzer from Micromeritics Instruments Corp., USA, at 77 K applying the Brunauer–Emmett–Teller (BET) and Barrett–Joyner–Halenda (BJH) method. The Cr and S contents in PCP(Cr)-BA and PCP(Cr)-NA were measured by ICP-AES (Agilent 725) analysis. The crystalline structures of the two catalysts were analyzed on a Bruker METALJET D8 Venture powder X-ray diffraction (XRD) with Cu Kα radiation (λ = 0.154 nm).
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3

Secondary Structure Analysis of RavA

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The secondary structure of full-length RavA and the isolated LARA domain were analyzed using a JASCO J-810 spectropolarimeter with a 1.0-mm path-length quartz cuvette. The temperature was raised at a rate of 1 C/min and spectra were typically collected at every 5 C (200-260 nm range) with a scanning speed of 50 nm/min. Attenuated Total Reflectance (ATR)-FTIR Spectroscopy A Nicolet Nexus 6700 FTIR spectrometer (Thermo Fisher Scientific) coupled with a Smart Orbit ATR unit was used to measure the infrared spectra. For each spectrum, 512 scans were collected with a resolution of 1 cm À1 over a scan range of 4,000-525 cm À1 using Ominic software. In the text, ATR-FTIR is referred to as FTIR.
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