100 u tem microscope

For UV-Vis analysis, the measurements were performed at 1 nm resolution, and the wavelength range between 350 and 700 nm (Analytik Jena Specord 210 Plus190—UV-Vis-1100 nm, Germany). The samples were measured at the initial moment and after 1, 2, and 3 hours.
FTIR analysis involves mixing the AgNPs powder with KBr in agate mortar (1:100). The spectra for spruce bark extract and tested solutions were observed with FTIR Thermo Nicolet 380 Spectrophotometer (Thermo Scientific, Waltham, USA, range 4000–400 cm⁻¹).
The morphology and size of the synthesized AgNPs were characterized by transmission electron microscopy using a JEOL 100 U TEM microscope (Japan Electron Optics Laboratory, Tokyo, Japan) at 100 kV on nitrocellulose substrates. The surface-enhanced Raman spectroscopy was recorded with Raman Systems R3000 CN, equipped with a 785 nm diode. The laser power was 200 mV, and the integration time was 30 s. The images were processed with ImageJ program (Wayne Rasband, MD, USA).

The nanoparticles in the solution were characterized morphologically and dimensionally using conventional electron transmission microscopy, using a JEOL 100 U TEM microscope (Japan Electron Optics Laboratory, Tokyo, Japan) at 100 kV. The nitrocellulose substrates coated with amorphous carbon layers, prepared on a 300 mesh copper microgrid, served as the substrate used for nanoparticle investigation. The thickness of the thermally evaporated carbon layer was about 4 nm. The SERS (Surface-Enhanced Raman Scattering) spectra were recorded in solution with a portable spectrometer (Raman Systems R3000 CN, Edinburgh, United Kingdom) equipped with a 785 nm diode coupled to a 100 km optical fiber. The laser power was 200 mV and the integration time was 30 s.
The obtained images were processed with the ImageJ software to determine the AgNP size and the histograms were made for each experimental version with Excel.