Nova nanosem 230
The Nova NanoSEM 230 is a high-performance scanning electron microscope (SEM) designed for advanced materials analysis. It offers high-resolution imaging capabilities and a range of analytical tools to characterize a variety of samples. The Nova NanoSEM 230 is equipped with a field emission gun (FEG) electron source, providing high-quality images and precise data collection.
Lab products found in correlation
7 protocols using nova nanosem 230
Structural Characterization of K2V8O21
Comprehensive Material Characterization Protocol
Characterization of Si/void/SiO2/void/C Nanospheres
Comprehensive Structural Characterization of Materials
Preparation and Characterization of pDNA-Loaded Nanoparticles
Comprehensive Material Characterization
Comprehensive Materials Characterization
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