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Nova nanosem 230

Manufactured by JEOL
Sourced in United States

The Nova NanoSEM 230 is a high-performance scanning electron microscope (SEM) designed for advanced materials analysis. It offers high-resolution imaging capabilities and a range of analytical tools to characterize a variety of samples. The Nova NanoSEM 230 is equipped with a field emission gun (FEG) electron source, providing high-quality images and precise data collection.

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7 protocols using nova nanosem 230

1

Structural Characterization of K2V8O21

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The crystal phase of the as-prepared K2V8O21 were characterized by X-ray diffraction (XRD, Rigaku D/Max 2500) with non-monochromated Cu Kα radiation (λ = 1.54178 Å). The microscopic morphology of the products was investigated by scanning electron microscopy (SEM, FEI Nova Nano SEM 230) and transmission electron microscopy (TEM, JEOL JEM-2100 F). Thermogravimetric analysis (TGA) was carried out on a NETZSCH STA 449C analyzer in air from room temperature to 700°C with a heating rate of 10°C min−1.
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2

Comprehensive Material Characterization Protocol

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The morphology and crystal structure of the samples were characterized by scanning electron microscopy (SEM, FEI Nova Nano SEM230), energy dispersive X-ray spectroscopy (EDX, FEI Nova Nano SEM230), transmission electron microscopy (TEM, JEOL JEM-2010), and X-ray diffraction (XRD, Rigaku Dmax/2550 VB + 18 kW). The surface chemical composition of the samples was identified by X-ray photoelectron spectroscopy (XPS) using a multifunctional imaging electron spectrometer (Thermo ESCALAB 250XI) with monochromatic Al Kα radiation. The specific surface areas and pore size distribution of the samples were evaluated from nitrogen adsorption–desorption isotherms using a Quadrasorb SI surface characterization analyzer.
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3

Characterization of Si/void/SiO2/void/C Nanospheres

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The morphology and diameter of the Si/void/SiO2/void/C nanospheres were characterized with a scanning electron microscope (SEM, FEI Nova Nano SEM 230) and a transmission electron microscope (TEM, JEOLJEM-2100F). Powder X-ray diffraction (XRD) patterns were obtained using an X-ray diffractometer (XRD, Rigaku D/max 2500 XRD with Cu-Kα radiation, λ = 1.54178 Å). The amount of C in the Si/void/SiO2/void/C nanoparticles was confirmed by a combined differential scanning calorimetry (DSC) and thermogravimetric analysis (TGA) instrument (SDT, Q600) in air atmosphere with a heating rate of 5 °C/min. Raman (LabRam HR-800) and Fourier transform infrared spectroscopy (FTIR) (NICOLET 6700) were also conducted.
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4

Comprehensive Structural Characterization of Materials

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Crystallographic phases of all the products were investigated by powder X-ray diffraction (XRD, Rigaku D/max2500) with Cu Kα (λ = 1.5406 Å) radiation. The morphologies of the samples were examined by field-emission scanning electron microscopy (SEM, FEI Nova NanoSEM 230) and transmission electron microscopy (TEM; JEOL-JEM-2100F transmission electron microscope). A combined Differential Scanning Calorimetry (DSC)/Thermogravimetric Analysis (TGA) instrument (Netzsch STA449C, Germany) was used to study the reactions during the annealing process and measure the carbon content in CW-LVP. Raman spectra were obtained using a Renishaw INVIA micro-Raman spectroscopy system. Nitrogen adsorption-desorption measurements were conducted at 77K (NOVA 4200e, Quantachrome Instruments).
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5

Preparation and Characterization of pDNA-Loaded Nanoparticles

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The pDNA‐NPs were prepared by the double emulsion solvent evaporation method (w/o/w). Briefly, 400 μl of diethylpyrocarbonate (DEPC) water containing 100 μg of plasmid DNA was added to 1 ml of dichloromethane containing PEI25000‐C14 (2 mg) and PLGA (10 mg). The above mixture was sonicated for 2 min at 60 W in an ice bath to form a primary W/O emulsion. Then, 3 ml DEPC water was added to the primary emulsion and further emulsified by ultrasound for 2 min at 60 W to form a secondary W/O/W emulsion. Subsequently, the dichloromethane was removed by a rotary evaporator (RE‐52AA, Shanghai), and the pDNA‐NPs were finally obtained. The morphology and size of the nanoparticles were characterized by scanning electron microscopy (SEM, Nova NanoSEM 230, USA) and transmission electron microscopy (TEM, JEOL, Japan). Nano ZS (Malvern Instruments, Malvern, UK) was used to investigate the hydrodynamic size (DLS) and zeta potential of pDNA‐NPs.
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6

Comprehensive Material Characterization

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The crystal structure and the composition of the samples were investigated by X-ray diffraction (XRD, Rigaku Dmax/2550VB + 18 kW) and energy dispersive X-ray spectroscopy (EDX, FEI Nova Nano SEM230). The morphology and microstructure of samples was observed through scanning electron microscopy (SEM, FEI Nova Nano SEM230) and transmission electron microscopy (TEM, JEOL JEM-2010). The thermogravimetric analysis (TGA) was tested in air at a ramp rate of 10°C min−1. The Raman spectrum test was conducted on a Renishaw in Via 2000. The specific surface areas and the pore size distribution were measured by the Brunauer-Emmett-Teller (BET) test and Barrett-Joyner-Halenda (BJH) method, respectively. The surface chemical composition of the sample was tested by the X-ray photoelectron spectroscopy (XPS, Thermo Scientific ESCALAB 250XI).
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7

Comprehensive Materials Characterization

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The crystalline structure was tested using the X-ray diffractometer (XRD, Rigaku3014) with Cu-Kα1 radiation (λ = 0.15418 nm). The morphologies of the samples were observed by using a Nova NanoSEM 230 and a JEOL JEM-2100 TEM. The chemical composition of the samples was investigated by using X-ray photoelectron spectroscopy (XPS, Thermo ESCALAB 250) with an Al-Kα radiation. The Brunauer–Emmett–Teller (BET) surface area was tested by V-Sorb 2800P in an N2 atmosphere.
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