Uv vis nir spectrometer

SEM characterization was performed by a JEOL 7610 p thermal field emission scanning electron microscope. UV-vis absorption spectra were recorded on a Cary 5000 ultraviolet–visible–near infrared (UV–VIS–NIR) spectrometer (Agilent Technologies, Inc., Santa Clara, CA, USA). XRD testing was conducted by a Rigaku Smartlab X-ray diffractometer using CuKα radiation (λ = 1.5418 Å) at 45 kV and a 200 mA excitation light source. Raman spectroscopy was performed using a Jobin Yvon/Horiba LabRAM HR Evolution confocal micro-Raman spectrometer equipped with a multichannel air-cooled charge-coupled device (CCD) detector. A 532 nm laser was used as the excitation light source. A monocrystalline silicon wafer was used to calibrate the Raman spectrometer. All Raman spectra were measured with a 600 g/mm grating using a 50×, 0.50 NA (OLYMPUS LMPlanFLN, Tokyo, Japan) long-working-distance (LWD) microscope objective. The laser power reaching the sample surface was approximately 5 mW. The acquisition time of Raman spectra was 30 s for each window. For ultraviolet light degradation, a ZF-7 portable ultraviolet analyzer (including 254 nm and 365 nm ultraviolet radiation) produced by Shanghai Daluo Scientific Instrument Co., Ltd. (Shanghai, China) was used. The UV degradation experiment was performed under irradiation with a 254 nm UV lamp with a power of 8 W.