A JEM-2100 High Resolution Transmission Electron Microscope (HR-TEM) (JEOL Ltd., Tokyo, Japan) was used to determine the morphology and size of the nanoconjugates. The samples were sonicated for 15 min and loaded, in a dropwise manner, onto carbon-coated 200-mesh Cu TEM grids (Lot# 1261229, SPI Supplies). The grids were left to dry overnight in the dark. Thereafter, the dried grids were loaded onto the microscope, and the images were captured and measured for their size using ImageJ v1.53 software (National Institutes of Health and Laboratory for Optical and Computational Instrumentation (LOCI), University of Wisconsin, Madison, WI, USA). The same instrument is endowed with an energy-dispersive X-ray spectroscopy (EDS) device for detecting individual elements present on the Cu grids. The EDS spectroscopic method allowed for both elemental and qualitative studies of the compounds found in the sample. Hence, this feature was incorporated to validate the specific element forming the compounds.
Jem 2100 high resolution transmission electron microscope hr tem
Manufactured by JEOL
Sourced in Japan, United States
The JEM-2100 High Resolution Transmission Electron Microscope (HR-TEM) is a versatile instrument designed for high-resolution imaging and analysis of materials at the nanoscale. The JEM-2100 utilizes an electron beam to generate images with a high degree of magnification and resolution, enabling detailed examination of a wide range of samples.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250 spectrometer, by Thermo Fisher Scientific (2 mentions)
200 mesh cu tem grids, by SPI Supplies (1 mentions)
Xenon flash lamp, by Agilent Technologies (1 mentions)
Nicolet is10 ft ir spectrometer, by Thermo Fisher Scientific (1 mentions)
Cary eclipse fluorescence spectrophotometer, by Agilent Technologies (1 mentions)
Lambda 750s uv vis nir spectrophotometer, by PerkinElmer (1 mentions)
Avance 3 nmr spectrophotometer, by Bruker (1 mentions)
Ftir spectrophotometer, by Bruker (1 mentions)
Quanta 250f, by Thermo Fisher Scientific (1 mentions)
Uv 2550 uv vis spectrophotometer, by Shimadzu (1 mentions)
7 protocols using jem 2100 high resolution transmission electron microscope hr tem
1
Nanoconjugate Characterization via HR-TEM
2
Nanoparticle Morphology Analysis by HR-TEM
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The morphology and size of the nanoconjugates were analyzed using a JEM-2100 High Resolution Transmission Electron Microscope (HR-TEM) (manufactured in JEOL Ltd. in Tokyo, Japan). To prepare the samples, they were first sonicated for a duration of 15 min and then carefully deposited onto carbon-coated TEM grids with a mesh size of 200 (Lot# 1261229, provided by SPI Supplies) in a dropwise manner. Subsequently, these grids were allowed to air-dry in a light-protected environment. Once dry, the prepared grids were placed into the microscope, and images were acquired.
3
Isolation and Characterization of Cellulose Nanofibrils from Sugar Beet Pulp
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Isolation of CNFs from the de-pectinated SBP was carried out according to the previously published protocol [31 (link)]. In brief, after bleaching with acetic acid/chlorite mixture, the bleached de-pectinated SBP was suspended in water at 2 wt.% consistency and subjected to high shear mixing using ESR-500x laboratory high shear homogenizer (ELE, Shanghai, China) at 10,000 rpm for 15 min. The suspension was then passed twice through a two-chamber Homolab 2.2 high-pressure homogenizer (FBF, Parma, Italy). The CNF suspension was then kept in fridge at 4 °C until use. The chemical composition of isolated CNFs was 87.8% α-cellulose, 6.96% pentosans, 0.45% lignin, 1.10% ash, 2.44% galacturonic acid content, and 0.31% protein content, as determined according to standard methods of chemical analyses [56 ,57 (link),58 (link)].
A JEM-2100 high-resolution transmission electron microscope (HRTEM) (JEOL, Tokyo, Japan) was used for characterizing the microstructure of the isolated CNFs after being stained with phosphotungstic acid solution.
A JEM-2100 high-resolution transmission electron microscope (HRTEM) (JEOL, Tokyo, Japan) was used for characterizing the microstructure of the isolated CNFs after being stained with phosphotungstic acid solution.
4
Characterization of N-CQDs using Spectroscopic Techniques
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- A double-beam spectrophotometer (PG Instrument, UK) was utilized in spectrophotometric measurements.
- A Cary Eclipse fluorescence spectrophotometer operated with a Xenon flash lamp from Agilent Technologies (Santa Clara, CA 95051, United States) was used. It was operated at 750 V.
- All pH measurements were performed using a Jenway pH-meter 3510 (Jenway, UK).
- FT-IR spectra were obtained using the Thermo-Fisher Scientific Nicolet – iS10 FT-IR spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). The instrument had a Ge/KBr beam splitter and a 4000 to 1000 cm−1 DTGS detector. The measurements were acquired with a resolution of 4 cm−1 in 32 scans.
- The morphology of N-CQDs was studied using a JEM-2100 high-resolution transmission electron microscope (HRTEM) (JEOL, Tokyo) operating at 200 kV.
- An ultrasonic bath (SS 101H 230, USA).
- A cooling centrifuge (2–16P, Germany).
- A vortex mixer (IVM-300p, Taiwan).
- Membrane filters (0.45 μm, Phenomenex, USA).
- A domestic Microwave (GE614ST, 2800 W, 2450 MHz, Samsung, Malaysia).
- A Cary Eclipse fluorescence spectrophotometer operated with a Xenon flash lamp from Agilent Technologies (Santa Clara, CA 95051, United States) was used. It was operated at 750 V.
- All pH measurements were performed using a Jenway pH-meter 3510 (Jenway, UK).
- FT-IR spectra were obtained using the Thermo-Fisher Scientific Nicolet – iS10 FT-IR spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). The instrument had a Ge/KBr beam splitter and a 4000 to 1000 cm−1 DTGS detector. The measurements were acquired with a resolution of 4 cm−1 in 32 scans.
- The morphology of N-CQDs was studied using a JEM-2100 high-resolution transmission electron microscope (HRTEM) (JEOL, Tokyo) operating at 200 kV.
- An ultrasonic bath (SS 101H 230, USA).
- A cooling centrifuge (2–16P, Germany).
- A vortex mixer (IVM-300p, Taiwan).
- Membrane filters (0.45 μm, Phenomenex, USA).
- A domestic Microwave (GE614ST, 2800 W, 2450 MHz, Samsung, Malaysia).
5
Characterization of Bismuth(III) Dithiocarbamate
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The complex, bismuth(III) tris(N-methyl-N-phenyldithiocarbamate), was characterized using Alpha Bruker FTIR spectrophotometer for the identification of functional groups. Elementar, Vario EL Cube for the analysis of the percentage C, H, N, and S, and a Bruker Avance III NMR spectrophotometer (600 MHz) for the (1H and 13C) NMR measurement in chloroform. The as-synthesized nanostructures were characterized by X-ray diffraction using a Bruker AXS D8 Discover XRD (Cu K˛ = 1.5406A) X-ray diffractometer operated at 40 KV and 40 mA. The UV-vis-NIR absorption spectra of the nanostructures solutions were measured in toluene using a Perkin Elmer Lambda 750S UV-vis-NIR spectrophotometer. A JEOL JEM 2100 High Resolution Transmission Electron Microscope (HRTEM) was used for TEM imaging. This was done at an accelerating voltage of 200 kV. Spatula tips of samples were dispersed in ethanol and sonicated for 30 min and allowed to dry for a few minutes prior to analysis. Scanning electron microscope (SEM) analysis was carried out using a FEI Quanta FEG 250 Environmental Scanning electron microscope (ESEM), and the elemental composition was determined using Oxford X-map 20 detector at 15 kV and using INCA software for energy dispersive X-ray analysis (EDAX).
6
High-Resolution TEM Elemental Analysis
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TEM investigations were carried out on a JEM-2100 High Resolution Transmission Electron Microscope (HR-TEM) (JEOL Ltd.) equipped with Energy Dispersive X-ray Spectroscopy (EDX) detector beams was used.to obtain images and analyse elemental composites of the sample respectively, where samples were loaded onto carbon-coated 200-mesh copper grid, air dried in the dark and analysed using the microscope.
7
Comprehensive Characterization of Photocatalysts
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Powder X-ray diffraction (XRD) patterns
of the photocatalysts were conducted on an XD-3 diffractometer (Beijing
Purkinje General Instrument Co., Ltd., China). Fourier transform infrared
(FT-IR) spectra were analyzed on an IS10 FT-IR spectrometer (Nicolet,
U.S.A.) by mixing the samples with KBr. The morphologies of the photocatalysts
were observed through a Quanta 250F field-emission scanning electron
microscope (FE-SEM) (FEI, U.S.A.) and JEM-2100 high-resolution transmission
electron microscope (HR-TEM) (JEOL, Japan). The energy-dispersive
X-ray spectra (EDS) and elemental mappings were also collected on
the SEM instrument. X-ray photoelectron spectroscopy (XPS) was applied
to collect the electron states on the surface of the catalysts, which
were obtained on an ESCALAB 250 spectrometer (Thermo, U.S.A.). Diffuse
reflectance spectroscopy (DRS) on a Shimadzu UV-2550 UV–vis
spectrophotometer (Shimadzu, Japan) was carried out for the characterization
of UV–vis absorption spectra of catalysts. The photoluminescence
spectra (PL) were studied by ELabram-HR800.
of the photocatalysts were conducted on an XD-3 diffractometer (Beijing
Purkinje General Instrument Co., Ltd., China). Fourier transform infrared
(FT-IR) spectra were analyzed on an IS10 FT-IR spectrometer (Nicolet,
U.S.A.) by mixing the samples with KBr. The morphologies of the photocatalysts
were observed through a Quanta 250F field-emission scanning electron
microscope (FE-SEM) (FEI, U.S.A.) and JEM-2100 high-resolution transmission
electron microscope (HR-TEM) (JEOL, Japan). The energy-dispersive
X-ray spectra (EDS) and elemental mappings were also collected on
the SEM instrument. X-ray photoelectron spectroscopy (XPS) was applied
to collect the electron states on the surface of the catalysts, which
were obtained on an ESCALAB 250 spectrometer (Thermo, U.S.A.). Diffuse
reflectance spectroscopy (DRS) on a Shimadzu UV-2550 UV–vis
spectrophotometer (Shimadzu, Japan) was carried out for the characterization
of UV–vis absorption spectra of catalysts. The photoluminescence
spectra (PL) were studied by ELabram-HR800.
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