S 3000
The S-3000 is a scanning electron microscope (SEM) produced by Hitachi. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The S-3000 features advanced optics, intuitive software, and a compact design for versatile laboratory applications.
Lab products found in correlation
22 protocols using s 3000
Characterization of N, S Co-doped Graphene/Fe3O4 Nanocomposite
Structural and Mechanical Analysis of Polymer Samples
Fabrication of Model Microplastic Fibers
SEM Characterization of Hair Samples
SEM Imaging of GXMs Solutions
Grazer Mouthpart Morphology Analysis via SEM
Comprehensive Nanoparticle Characterization
Comprehensive Characterization of Electrode Materials
recorded on a Shimadzu IRPrestige 21 spectrometer at rt. The samples
were measured as KBr discs in the range of 4500–500 cm–1. XRD was used to determine the crystallinity of the
electrode materials on an automatic Philips powder diffractometer
with nickel-filtered Cu Kα radiation. The XRD patterns were
recorded from 10° to 80°. The morphology, size, and microstructure
of the products were investigated by SEM (S-3000 and SU-70, Hitachi).
The BET and the Barrett–Joyner–Halenda methods (NOVA
3200e system, Quantachrome Instrument, USA) were employed to investigate
the BET specific surface area and pore size distribution of the samples. 1H (400 MHz) and 13C (100 MHz) NMR spectra were
recorded on a Varian INOVA 400 NMR spectrometer at rt. The chemical
shifts of the protons were relative to tetramethylsilane (Me4Si). The data are presented as follows: chemical shift (ppm), multiplicity
(s = singlet, d = doublet, t = triplet, m = multiplet), and coupling
constant J (Hz). The elemental analysis of the BIMs
was performed with an Elementar Vario EL III element analyzer (Elementar
Analysensysteme GmbH, Germany) for C, H, N, and S determination at
Korea Basic Science Institute (Busan, Korea).
Fabricated Structure Characterization
Mollusk Shell and Radula Characterization
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