S 3400
The S-3400 is a Scanning Electron Microscope (SEM) produced by Hitachi. It is designed for high-resolution imaging of a wide range of materials and samples. The S-3400 features a large chamber size, a variable pressure mode, and a high-performance electron optical system.
Lab products found in correlation
178 protocols using s 3400
Yogurt Microstructure Characterization
Visualizing Acinetobacter baumannii Biofilm Formation
Characterization of Polystyrene Microsphere Templates
Scanning Electron Microscopy Sample Preparation
Characterization of Synthesized Silica Particles
SEM Image Processing for Pattern Quantification
Multimodal Characterization of Substrate Surfaces
The existence of elements in the substrate and morphology of substrates were analyzed by Energy-dispersive X-ray spectroscope (Hitachi S3400) and scanning electron microscope (SEM; JEOL JSM-6510LV). The surface roughness of the substrates was characterized by a 3D laser scanning microscope (LSM) (OLS 4000, Olympus Corporation, Tokyo, Japan). Wettability of the substrates was examined by evaluate of water contact angle (WCA) using a Dataphysics OCA 15 plus (Filderstadt, Germany). The surfaces of the substrate samples were characterized using sessile drop technique and Gaosuo software. The average of six CAs was obtained. H2O, C3H8O3, and CH3NO with specified factors (
Comprehensive Characterization of CIS/Mg(OH)2 Composites
Sperm Ultrastructure Analysis by SEM and TEM
For the transmission electron microscopy (TEM) assay, each semen sample was rinsed in Sperm Washing Medium. The semen samples were pre-fixed in 3% glutaraldehyde, post-fixed in 1% buffered OsO4, dehydrated through gradient acetone solutions, and embedded in Epon 812. Before ultrathin-sectioning, a half-thin section was made to enable sperm location under a light microscope. The ultrathin sections were double-stained with both lead citrate and uranyl acetate and then analyzed under a TEM (TECNAI G2 F20, Philips) with an accelerating voltage of 80 kV.
Characterization of Synthesized MIPs and NIPs
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