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178 protocols using s 3400

1

Yogurt Microstructure Characterization

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Small strips of 2 × 5 mm were cut from the center of yogurt stored for 21 d and fixed in 2.5% glutaraldehyde solution (pH 6.8) for 6 h. After fixation, the samples were rinsed three times with phosphate buffer (pH 6.8) and then dehydrated with 50%, 70% and 90% ethanol, respectively, and twice with 100% ethanol for 10 min each. The samples were frozen at −20 °C for 30 min and dried in a freeze dryer (ES-2030, Hitachi, Japan), and the dried samples were fixed on a sample table with tape and coated with an ion sputter coater. The samples were observed and photographed using a scanning electron microscope (SEM) S-3400 (S-3400, Hitachi, Japan).
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2

Visualizing Acinetobacter baumannii Biofilm Formation

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The biofilm formation ability of A. baumannii strains was visualized by scanning electron microscope (SEM) (Hitachi-S3400, Tokyo, Japan). Biofilm was formed on the minimum biofilm eliminating concentration device (MBEC™ P&G Physiology & Genetics Innovotech, Alberta, Canada). Briefly, A. baumannii suspensions (200 μL) were inoculated into each well and then incubated overnight at 37 °C. Biofilms that formed were then washed twice with PBS to remove any unattached and floating cells and were fixed with 2.5% glutaraldehyde in 0.1 M cacodylic acid (pH 7.2) at 4 °C for 24 h and post fixed with 0.1 M cacodylic acid for approximately 10 min. After incubation, the plates were washed twice with distilled water for 15 min, followed by gradual dehydration with ethanol, and air dry for a minimum of 24 h. The fixed biofilms were then coated with a layer of gold–palladium (7 nm thick) and examined with SEM (Hitachi-S3400) [36 ].
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3

Characterization of Polystyrene Microsphere Templates

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The textural and morphological properties of the polystyrene microsphere templates were observed on a scanning electron microscope (Hitachi High Technologies America Inc. S-3400 Los Angeles, CA, USA) operated at 10 kV. Samples deposited on the sample holder were coated with a conductive gold before morphological examination. Successful incorporation and removal of the microsphere template on the monolith were also confirmed by observing the monoliths using SEM. The average size of the polystyrene microsphere particles at different concentrations was determined using Dynamic Light Scattering (Nanoplus Micromeritics Instrument Corp, Tewkesbury, UK). The average pore size and the pore distribution of the monoliths obtained using different ratios were evaluated using Image J, 1.52 version software on the pre-captured image from SEM observation (Chan et al., [5 (link)]). The original SEM image was uploaded and binarized by altering the threshold. Particle size measurements were carried on based on the created particle outline. Fourier transform infrared spectroscopy (Agilents Technology Cary 630, Santa Clara, CA, USA) was used to characterize the functional groups in the monoliths after the incorporation and removal of the templates. The changes were observed by comparing the tested monoliths with a control monolith synthesized without the presence of a template.
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4

Scanning Electron Microscopy Sample Preparation

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Native and de-epithelialized samples were fixed overnight in a solution containing 2% formaldehyde and 0.5% glutaraldehyde in PBS at 4 °C. Samples were washed for 3 × 15 min in PBS to remove unfixed aldehydes and post-fixed in 1% osmium tetroxide solution for 30 min, followed by a secondary wash of 2 × 20 min in PBS. Serial ethanol dilutions (2 × 15 min in 30%, 2 × 20 min in 50%, 2 × 30 min in 70%, 2 × 45 min in 90%, 2 × 1 h in 100%, and overnight in 100% at 4 °C) were performed to dehydrate the samples. Samples were then critical point dried (purge phase of 30 min; Tousimis Autosamdri 810, USA), mounted with carbon colloid paint on scanning electron microscope stubs and gold-palladium sputter coated (2 min; Polaron SC7640 Sputter Coater; Quorum Technologies, Canada). Then, the stubs containing the samples were placed on a scanning electron microscope (S-3400, Hitachi High-Technologies, Canada) at 10 kV.
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5

Characterization of Synthesized Silica Particles

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The structures of the obtained silica particles were evaluated using TEM and scanning electron microscopy (SEM: S-3400 Hitachi High-Technologies Corporation, Tokyo, Japan) . Infrared absorption spectra of the silica particles before and after sintering were obtained using Fouriertransform infrared spectrometer (FT-IR: FT/IR-6100, JASCO Corporation, Tokyo, Japan) employing the KBr disk method. The specific surface area was determined using nitrogen adsorption/desorption measurements (Autosorb-3B, Quantachrome Instruments Florida, USA) operated at 77K.
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6

SEM Image Processing for Pattern Quantification

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The low-resolution SEM images in Fig. 1, 2a–c and S1 were acquired using a variable pressure SEM (S-3400, Hitachi) without additional metal coating. On the other hand, the high-resolution SEM images in Fig. 2d, e, 3 and 6 were acquired with sputtering of thin-film Au (less than 10 nm) to the samples before SEM imaging (XEIA, Tescan). The acquired SEM images were processed with OpenCV functions to measure the pattern area as follows. First, the SEM images were converted into grayscale images (cv2.Color_BGR2GRAY). Then, the contrast of the grayscale images was improved through histogram equalization (cv2.equalizeHist), which helped clarify the pattern boundary. Further, Gaussian blurring was applied to the processed images to reduce noise in the images (cv2.GaussianBlur). The blurred images were then binarized with a predefined threshold (cv2.THRESH_OTSU). Next, the area of patterns was calculated in a pixel scale using a contour function (cv2.contourArea). Finally, the area in the pixel scale was converted into a μm scale based on the scale bar in the original SEM image.
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7

Multimodal Characterization of Substrate Surfaces

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Functional groups of the substrates were determined by Fourier-transform infrared spectroscopy (FTIR) (FTIR-8300 Shimadzu Co. Tokyo, Japan) analysis using a KBr disk. The samples were fixed on the holder, and the transmittance spectrum from 400 to 4,000 cm−1 was scanned.
The existence of elements in the substrate and morphology of substrates were analyzed by Energy-dispersive X-ray spectroscope (Hitachi S3400) and scanning electron microscope (SEM; JEOL JSM-6510LV). The surface roughness of the substrates was characterized by a 3D laser scanning microscope (LSM) (OLS 4000, Olympus Corporation, Tokyo, Japan). Wettability of the substrates was examined by evaluate of water contact angle (WCA) using a Dataphysics OCA 15 plus (Filderstadt, Germany). The surfaces of the substrate samples were characterized using sessile drop technique and Gaosuo software. The average of six CAs was obtained. H2O, C3H8O3, and CH3NO with specified factors (Table S1) were applied to compute the surface free energy (SFE) of the samples by Van Oss method.37 (link),38
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8

Comprehensive Characterization of CIS/Mg(OH)2 Composites

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CIS/Mg(OH)2 composites were analyzed examined by X-ray diffraction (XRD, Bruker D8), field emission scanning electron microscopy (FE-SEM, Hitachi S-3400), transmission electron microscopy (TEM, FEI Tecnai G2 F20), X-ray photoelectron spectroscopy (XPS, Escalab 250), atomic force microscope (AFM, NT-MDT model BL222RNTE), N2 adsorption-desorption curves (NOVA-2020), inductively coupled plasma optical emission spectrometer (ICP-OES, Varian 710-ES), UV–Vis diffuse reflectance spectra (UV-Vis DRS, Hitachi U-4100) and Photoluminescence (PL, FLSP 920). The photoelectrochemical behaviors of these samples were investigated by a photoelectric instrument (CEL-PECX2000, Beijing CEL Tech. Co., Ltd., China) equipped with a Vertex. C. EIS (electrochemical impedance spectroscopy) electrochemistry workstation (Ivium Technologies B.V., Holland) and a Xe lamp of 240 mW cm−2. In addition, the electron spin resonance (ESR, JES-FA200) was performed for the photoexcited radicals of obtained composites. The radicals trapped with 5,5-dimethyl-l-pyrrolineN-oxide (DMPO) were carried out in water for hydroxyl radical (•O2) and methanol for superoxide radical (•O2) in visible light region.
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9

Sperm Ultrastructure Analysis by SEM and TEM

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For scanning electron microscopy (SEM) assay, the spermatozoa samples were fixed onto slides of 1 cm diameter using 2.5% glutaraldehyde for 4 h at 4 °C. After washing the slides with 1× PBS three times and post-fixing in 1% osmic acid for 1 h at 4 °C, dehydration was performed using 30, 50, 75, 95, and 100% ethanol sequentially, and the slides were dried using a CO2 critical-point dryer (Eiko HCP-2, Hitachi). Finally, the slides were mounted on aluminum stubs, sputter-coated by an ionic sprayer meter (Eiko E-1020, Hitachi), and analyzed by SEM (Hitachi S3400) under an accelerating voltage of 10 kV.
For the transmission electron microscopy (TEM) assay, each semen sample was rinsed in Sperm Washing Medium. The semen samples were pre-fixed in 3% glutaraldehyde, post-fixed in 1% buffered OsO4, dehydrated through gradient acetone solutions, and embedded in Epon 812. Before ultrathin-sectioning, a half-thin section was made to enable sperm location under a light microscope. The ultrathin sections were double-stained with both lead citrate and uranyl acetate and then analyzed under a TEM (TECNAI G2 F20, Philips) with an accelerating voltage of 80 kV.
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10

Characterization of Synthesized MIPs and NIPs

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The synthesized MIPs and NIPs were characterized with scanning electron microscope (SEM) (S-3400, Hitachi Ltd., Tokyo, Japan) and Fourier transform infrared spectroscopy (FTIR, Vector 22, Bruker, Germany).
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