A drop (10 µL) of sample—nanoemulsion diluted in ultra-pure water in 1:1000, v/v ratio—was deposited onto circular mica plate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum in order to remove the excess of water. Detailed investigation of the morphology of the samples, as well as of the shape, distribution and size of the droplets was accomplished with NTEGRA prima atomic force microscope (NT-MDT). Due to the fragility of the thin layers of the AFM samples, intermittent-contact AFM mode was implemented. For this purpose, NT-MDT NSGO1 rectangular silicon cantilevers with Au reflective film were used. Nominal resonant frequency of these cantilevers is 150 kHz, while nominal force constant is 5.1 N/m. Image Analysis 2.2.0 (NT-MDT) software was implemented for processing of the obtained AFM data.
Highest grade v1 afm mica discs
Manufactured by Ted Pella
Sourced in United States
The Highest Grade V1 AFM Mica Discs are a type of laboratory equipment used for atomic force microscopy (AFM) applications. They are made from high-quality mica and are designed to provide a smooth, flat surface for imaging and analysis with an AFM.
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Lab products found in correlation
Ntegra prima atomic force microscope, by NT-MDT (5 mentions)
Nsgo1 silicon cantilevers, by NT-MDT (4 mentions)
Image analysis 2, by NT-MDT (3 mentions)
Nsgo1 rectangular silicon cantilevers, by NT-MDT (2 mentions)
Cellsens entry version 1, by Olympus (1 mentions)
Mfp 3d atomic force microscope, by Oxford Instruments (1 mentions)
Hq nsc14 al bs, by MikroMasch (1 mentions)
Ntegra prima afm, by NT-MDT (1 mentions)
11 protocols using highest grade v1 afm mica discs
1
Nanoemulsion Morphology Characterization using AFM
2
Nanocrystal Morphology Analysis via AFM
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Morphology and size of the nanocrystals in developed dispersions were analyzed using an NTEGRA Prima Atomic Force Microscope (NT-MDT, Moscow, Russia). The sample preparation included dilution of the dispersion F5, F6, or F8 in ultra-purified water (1:100 v/v), after which the 10 µL of the sample was placed on the circular mica substrate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried in a vacuum dryer (30 min, 25 °C). The measurements were conducted using intermittent-contact AFM mode using NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating), with a nominal force constant of 5.1 N/m. The cantilever driving frequency was around 150 kHz during the measurements. For the analysis of the taken topography and “error signal” AFM images, the software Image Analysis 2.2.0 (NT-MDT) was used.
3
Microscopic Analysis of Nanoemulsion Microstructure
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Optical microscopy under polarized light was employed to investigate the signs of anisotropy in the transient phases and nanoemulsion samples (×100 magnification) with Olympus BX53P polarizing microscope, and the obtained images were analyzed with the cellSens Entry version 1.14 software (Olympus, Tokyo, Japan).
To gain a direct access into the microstructure, i.e., to determine its morphological properties and to confirm the mean droplet size data, the representative nanoemulsion samples F1 and F2 prepared with different cosurfactants were investigated using Ntegra prima atomic force microscope (NT-MDT). Prior to measurements, 10 μL of diluted nanoemulsions (1:100 or 1:1000 v/v) were placed on the circular mica substrate discs (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum for 24 h at 25 °C. Measurements were carried out in the air using intermittent-contact AFM mode. For this purpose, NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating) were used. The nominal force constant of these cantilevers was 5.1 N/m. During the measurements cantilever driving frequency was around 150 kHz. Both topography and “error signal” AFM images were taken, and later analyzed using Image Analysis 2.2.0 (NT-MDT) software.
To gain a direct access into the microstructure, i.e., to determine its morphological properties and to confirm the mean droplet size data, the representative nanoemulsion samples F1 and F2 prepared with different cosurfactants were investigated using Ntegra prima atomic force microscope (NT-MDT). Prior to measurements, 10 μL of diluted nanoemulsions (1:100 or 1:1000 v/v) were placed on the circular mica substrate discs (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum for 24 h at 25 °C. Measurements were carried out in the air using intermittent-contact AFM mode. For this purpose, NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating) were used. The nominal force constant of these cantilevers was 5.1 N/m. During the measurements cantilever driving frequency was around 150 kHz. Both topography and “error signal” AFM images were taken, and later analyzed using Image Analysis 2.2.0 (NT-MDT) software.
4
Atomic Force Microscopy Sample Preparation
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The sample preparation for AFM was performed on mica (Highest Grade V1 AFM Mica Discs, 10 mm, Ted Pella). The protein samples were diluted to a 1 to 2 μg/ml, and 50 μl was deposited onto freshly cleaved mica. After a 30-s incubation, the excess of unbound proteins was washed off with the ultrapure water for ∼10 s, and the mica was immediately dried under filtered air. All proteins were imaged under dry conditions, and the solution conditions of the samples refer to the conditions in which they were deposited onto mica. AFM imaging was performed on Asylum Research MFP-3D atomic force microscope using the AC tapping mode in air. AFM tips with a 160-kHz resonance frequency and 5 N/m force constant (MikroMasch, HQ: NSC14/AL BS) were used.
5
Atomic Force Microscopy of Nanosuspensions
6
Atomic Force Microscopy of Nanoparticle Emulsion
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For the atomic force microscopy, NE sample (diluted in ultra-pure water in 1:1000, v/v ratio) was placed onto mica plate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, CA, USA) and dried under vacuum to remove the excess water. NTEGRA prima atomic force microscope (NT-MDT) was used to inspect the morphology, shape, size, and distribution of the NE droplets. The intermittent-contact AFM mode was used, due to the samples’ fragility. NT-MDT NSGO1 rectangular silicon cantilevers with Au-reflective film were used for this purpose. Nominal resonant frequency of these cantilevers is 150 kHz, while nominal force constant is 5.1 N/m. Image Analysis 2.2.0 (NT-MDT) software was used to process the obtained data.
7
Nanocrystal Morphology by Atomic Force Microscopy
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For direct observation of the obtained nanocrystals and morphological evaluation, atomic force microscopy was performed applying AutoProbe CP-Research SPM (TM Microscopes-Bruker, Germany). 10 µl of each sample was directly placed on the circular mica substrate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, California, USA) and dried in vacuum. AFM measurements were performed in air, using noncontact probes Bruker Phosphorous (n) doped silicon Tap300, model MPP-11123-10 with Al reflective coating and symmetric tip. Driving frequency of the cantilever was about 300 kHz. Topography and "error signal" images were captured and analyzed.
8
Atomic Force Microscopy Characterization of Nanoemulsions
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To confirm the size measurements results and to visualize the morphology of the oil droplets in the nanoemulsions, atomic force microscopy (AFM) was employed using NTEGRA prima atomic force microscope (NT-MDT, Moscow, Russia). A drop (10 μL) of diluted nanoemulsion sample (1:100, v/v in ultra-pure water) was directly deposited onto circular mica substrate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, California, USA) and dried in vacuum to remove excess water. Measurements were carried out with the AFM operating in an intermittent-contact mode in air. NT-MDT NSGO1 silicon, N-type, Antimony doped, with Au reflective coating, cantilevers were used with the following parameters: nominal force constant 5.1 N/m, resonance frequency 87-230 kHz, driving frequency 150 kHz, and the line scanning frequency 0.5 Hz. Post-acquisition processing of the obtained topography and "error signal" images was performed using the software Image Analysis 2.2.0 (NT-MDT, Moscow, Russia).
9
Nanoemulsion Droplet Morphology Characterization
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To visualize dispersed nanodroplets of optimal low-energy nanoemulsionsto determine their morphological properties and to confirm data obtained on mean droplet size, atomic force microscopy was carried out applying AutoProbe CP-Research SPM (TM Microscopes-Bruker), using 90 µm large area scanner. Formulations were diluted with ultra-pure water (1:50 v/v), and 10 µL of diluted sample was placed on circular mica substrate (Highest Grade V1 AFM Mica Discs, Ted Pella Inc., Redding, California, USA) and dried in vacuum. Due to the nature of the samples, noncontact mode was applied. AFM measurements were performed in air, using noncontact probes Bruker Phosphorous (n) doped silicon Tap300, model MPP-11123-10 with Al reflective coating and symmetric tip. Driving frequency of the cantilever was about 300 kHz.
Both topography and -error signal‖ AFM images were taken and later analyzed.
Both topography and -error signal‖ AFM images were taken and later analyzed.
10
Morphological Analysis of Microemulsions by AFM
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Morphology of blank and AC-loaded microemulsions was observed using AFM. 48 h prior to the investigation, 10 μL of the sample was directly deposited onto a small, circular mica disc (Highest Grade V1 AFM Mica Discs; Ted Pella Inc., Redding, California) and dried in desiccator. Measurements were performed with NTEGRA prima AFM (NT-MDT, Moscow, Russia) operating in intermittent-contact AFM mode in air. For this purpose, NT-MDT NSGO1 silicon cantilevers (N-type, Antimony doped, Au reflective coating) were used.
Nominal force constant of these cantilevers is 5.1 N/m, while their resonance frequency lies in the range 87-230 kHz. During the measurements cantilever driving frequency was 156 kHz, and line scanning frequency was 1 Hz. Both topography and "error signal" AFM images were taken and later analyzed using the software Image Analysis 2.2.0 (NT-MDT, Moscow, Russia).
Nominal force constant of these cantilevers is 5.1 N/m, while their resonance frequency lies in the range 87-230 kHz. During the measurements cantilever driving frequency was 156 kHz, and line scanning frequency was 1 Hz. Both topography and "error signal" AFM images were taken and later analyzed using the software Image Analysis 2.2.0 (NT-MDT, Moscow, Russia).
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