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12 protocols using escalab xi instrument

1

Comprehensive Characterization of Polymeric Particles

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The morphologies of PPMs were observed by electron microscopy (FESEM, SU-8010), atomic force microscopy (AFM, SPM-9700), Ultra-Depth 3D Microscope (VHX-1000C) and Cryogenic scanning electron microscopy (Cryo-SEM, FEI Quanta 450). Fourier transform infrared spectroscopy (FT-IR) were obtained by a BRUKER Vertex 80 FT-IR (Germany). The interfacial tension of droplets and contact angle of films were measured by a contact angle meter (DATAPPHYSICS, OCA20). Element analyses (C, N, S, and H) were analyzed by an element analyzer (PerkinElmer, Optima 5300-DV). UV-Vis-NIR was conducted on a spectrophotometer (Lambda 750 S). Raman microscopy (LabRam HR Evolution) was recorded at 532 nm. X-ray photon spectroscopy (XPS) was recorded on ESCALAB Xi+ instrument (Thermo Fischer, Al Ka irradiation, 12.5 kV working voltage). For depth-dependent XPS measurements, PPM2.25 was etched using argon-ions (3000 eV) for different time. Differential scanning calorimeter (DSC) was done with DSC2500. Inductively coupled plasma emission (ICP-OES) was conducted with a PerkinElmer 8300 spectrometer. pH values were measured by a digital pH meter (SARTORIUS, pB-10).
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2

Characterization of VMT Nanosheets and Membranes

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The VMT crystals and the d-spacing of the VMT membrane were characterized by X-ray diffraction (XRD, UltimqlV, Japan) with Cu Kα radiation at a step of 0.02° and a collection time of 5°/step. The microstructures and elemental distribution characteristics of the nanosheets and membranes were measured by scanning electron microscope (SEM Zeiss Gemini 300, Germany). The morphology of the VMT nanosheets was characterized by transmission electron microscopy (TEM Talos F200X, USA). Atomic force microscopy (AFM Bruker Multimode 8) was used to obtain morphological images of the nanosheets and membranes in tapping mode. The colloidal solution zeta potential was measured using a Zetasizer Nano ZS 90. FTIR spectra of the VMT membrane was performed using a Bruker VERTEX 33 unit with the wavenumber range of 400–4000 cm−1. The chemistry property of the VMT membrane was analyzed by X-ray photoelectron spectroscopy (XPS) using a Thermo Fisher ESCALAB Xi+ instrument with monochromated Al-Kα radiation.
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3

Characterization of Au19Ag6 Cluster

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UV-Vis-NIR absorption spectra were recorded on a Cary 5000. The mass spectrum was recorded on an ABI4800plus ESI-TOF-MS and a Waters Q-TOF mass spectrometer. Crystals of Au19Ag6 were dissolved in CH2Cl2 for ESI-MS measurement. X-ray photoelectron spectroscopy was performed using a Thermo ESCALAB Xi+ instrument. Intensity data of Au19Ag6 were collected on an Oxford Gemini S Ultra system (Cu Kα). Absorption corrections were applied by using the program CrysAlis (multi-scan). The structure was solved by direct methods, and non-hydrogen atoms except solvent molecules and counteranions were refined anisotropically by least-squares on F2 using the SHELXTL program. The diffuse electron densities resulting from the residual solvent molecules were removed from the data set using the Olex2 solvent mask.
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4

Comprehensive Material Characterization Techniques

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The particle size and morphological features were studied using scanning electron microscopy (Neo-Scope JCM-6000PLUS system) and transmission electron microscopy (JEOL-JEM 2100). The phase purity and crystal structure were determined by the X-ray diffraction patterns and were acquired using Rigaku Smartlab X-ray diffractometer (Cu-Kα, λ = 1.5406 Å) operating at 40 kV and 30 mA. The infrared spectrum was recorded using a Fourier Transform Infrared Spectrometer (Bruker Alpha P) in the range of 400 to 4000 cm−1. The photoluminescence (PL) of the samples were recorded with an Agilent Technology-Cary-60 and their optical properties were analysed using LABINDIA technologies UV 3092 spectrophotometer. The specific surface area and pore size of the catalyst was studied using Quanta Chrome Nova 2200E—BET Surface Area Analyser. The different states and valence of material was analysed by X-ray photoelectron spectroscopy (XPS) using Thermo Fisher ESCALAB Xi+ instrument. The radicals formed during degradation process was confirmed and analysed by ESR-JEOL, Japan spectrometer.
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5

Comprehensive Characterization of Electrocatalysts

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X-ray diffraction (XRD) patterns of the materials were obtained using a Rigaku-Ultima IV fully automatic high-resolution X-ray diffractometer equipped with an X-ray generator operating at 40 kV and 40 mA. The measurements were performed in a step of 0.01° (2θ) at room temperature. The as-prepared electrocatalysts were characterized by FE-SEM (JEOL-Japan) equipped with an energy dispersive X-ray analysis (EDAX) attachment. High-resolution transmission electron microscopy (HR-TEM) was performed using a JEOL JEM 2100 instrument. Fourier transform infrared (FTIR) spectroscopy was recorded in the range of 4000–500 cm−1 on a PerkinElmer Spectrum-I spectrometer. Field emission scanning electron microscopy and Raman spectroscopy were performed using a Raman spectrometer with a microscope (Seki Technotron Corp., Tokyo) with a 532 nm laser. UV-visible spectroscopy of the samples was done using a Jasco V-750 spectrometer. X-ray photoelectron spectroscopy (XPS) was analyzed by a Thermo Fischer Scientific ESCALAB Xi+ instrument. All electrochemical studies were performed using a CHI-660E potentiostat (CH-instrument, USA) and a three-electrode cell comprising a saturated calomel (SCE) reference electrode, a Pt wire counter electrode, and a working electrode.
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6

Comprehensive Characterization of Nanomaterials

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The obtained samples were characterized by XRD analysis on D8 advance X-ray diffractometer (Bruker AXS, Karlsruhe, Germany) with filtered Cu Kα radiation. The functional groups of the samples were analyzed by FTIR (Thermo Scientific, Nicolet 67000, Madison, WI, USA). The detailed microstructure and morphology of samples were observed using SEM (ZEISS Gemini SEM 300, Oberkochen, Germany) and TEM (FEI Tecnai F20, Hillsboro, OR, USA). Nitrogen adsorption–desorption isotherms were recorded by Micromeritics ASAP 2460 adsorption apparatus at 77 K (ASAP 2460, Micromeritics, Norcross, GA, USA). The magnetic property of the sample was measured using VSM (LakeShore, Westerville, OH, USA). XPS was conducted at room temperature on an ESCALAB Xi+ instrument (Thermo Fisher Scientific, Waltham, MA, USA) equipped with an Al Kα source.
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7

Spectroscopic Analysis of Hydrogel Sheets

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Fourier transform infrared (FTIR) spectra of the GA-PAA and PVA/GA-PAA hydrogel sheets samples were measured to confirm the expected chemical structure. Samples for FTIR measurements were ground with 1 wt% KBr and pressed into pellets, and absorption peaks were measured in the spectral range of 4000 to 400 cm−1 using an FTIR spectrometer (Avatar 360, USA). High-resolution X-ray photoelectron spectroscopy (XPS) of C and N was conducted using the Escalab Xi+ instrument (ThermoFisher, U.S.). The detection conditions were 23.5 eV pass energy utilizing Ar+ gun neutralization to compensate.
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8

Purification and Characterization of CALB Lipase

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All chemicals and solvents were purchased from commercial suppliers and used without any further purification. Lipase enzyme (EC 3.1.1.3) Candida antarctica lipase B (CALB) was purchased from commercial sources. The reaction progress was monitored using thin layer chromatography (TLC, thin silica layer coated on glass slide). The compounds were purified by column chromatography using silica (particle size 200–400) as the stationary phase and ethyl acetate in hexane as the mobile phase. NMR spectra were collected on a JEOL or Bruker NMR using deuterated DMSO solvent with TMS as an internal reference. The coupling constant (J) is expressed in hertz (Hz) and the chemical shift (δ) is expressed in parts per million (ppm). Multiplicities are abbreviated as s: singlet, d: doublet, dd: doublet of doublet, t: triplet, br s: broad singlet, and m: multiplet. The Fourier transform infrared (FT-IR) spectrum was collected using PerkinElmer Spectrum software, version 10.4.00. The X-ray analysis was done using an X-ray diffractometer (PanAlytical). The high resolution transmission electron microscopy (HR-TEM) was done using a JEOL JEM 2100 PLUS. The X-ray photon spectroscopy (XPS) was done using a Thermo Fisher Scientific ESCALAB Xi+ instrument.
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9

Characterization of Zinc-Doped Mesoporous Silica Nanoparticles

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Transmission electron microscopy (TEM) images were observed by an FEI Tecnai G2 F20 field-emission transmission electron microscope (FEI, Oregon, USA). The morphology of the nanoparticles was acquired using a Magellan 400 field-emission scanning electron microscope (FEI, Oregon, USA). The size and zeta potential of the nanoparticles were measured in deionized water with dynamic light scattering (DLS) using a Nano ZS90 zetasizer (Malvern Panalytical, Shanghai, China). X-ray photoelectron spectroscopy (XPS) spectra were observed to analyze the valence of the zinc component of Zn-DMSNs by a Thermo Scientific ESCALAB Xi+ instrument (Thermo Fisher, Massachusetts, USA). Analyses of quantitative elemental composition were performed on an Agilent 720 ES (OES) with inductively coupled plasma and optical emission spectrometry (Agilent, California, USA).
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10

Nanomaterial Characterization Techniques

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The morphological and structural analysis was determined by TEM (JEOL, JEM‐2100plus, 200 kV). The aberration‐corrected HRTEM, HADDF‐STEM, and EDS mapping were recorded on Titan Cubed Themis G2300. The SEM and corresponding EDS mapping were conducted on ZEISS Gemini 300. The XRD patterns were collected on a Rigaku D/max‐2200 PC diffractometer with Cu Kα radiation (λ = 1.5418 Å). The XPS data of different catalysts were tested using a Thermo ESCALAB Xi+ instrument equipped with an Al‐Kα radiation source (1486.6 eV). The thickness of different catalysts was determined by AFM (Bruker, Multimode 8). The XAS of the samples were collected at the beamline BL14W1 of the Shanghai Synchrotron Radiation Facility (SSRF, China). The ICP‐MS was conducted on a PerkinElmer NexION 350D.
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