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Phenom prox electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Phenom ProX is a desktop scanning electron microscope designed for high-resolution imaging of samples. It features a high-brightness electron source, advanced optics, and a user-friendly interface for easy operation. The Phenom ProX is capable of providing detailed images of a variety of materials, including metals, ceramics, and biological samples.

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2 protocols using phenom prox electron microscope

1

Nanofibrous Scaffold Characterization via SEM

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A scanning electron microscopy (SEM) was performed to characterize the nanofibrous scaffolds. The nanofibers were cut into pieces, placed on SEM holders using conductive tape, and sputtered with a 10nm layer of gold. The SEM analysis using SED detector at −10 kV potential was performed on Phenom ProX electron microscope (ThermoScientific).
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2

Characterization of Gold-Polymer Composite Films

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The structure and morphology of the polymer films and the local content of gold immobilized in the polymer film were studied using a PHENOM pro-X electron microscope (Thermo Fisher Scientific, Waltham, MA, USA), and a Zeiss Libra-200 FE transmission electron microscope (Carl Zeiss, Oberkochen, Germany). Thin cross-sections of the composite film were examined using an Axioplan 2 Imaging optical microscope (Carl Zeiss, Mannheim, Germany) with a Sony NV-GS330EE-S (Panasonic, Osaka, Japan) photographic accessory.
The X-ray diffraction (XRD) patterns of the composite films were recorded using a D8 ADVANCE X-ray diffractometer (Bruker, Karlsruhe, Germany) in the CuKα-radiation. The EVA search program with the PDF-2 database (Powder Diffraction File; Kabekkodu, 2007) was used for the X-ray patterns processing.
The size distribution of gold particles was estimated by the small angle X-ray scattering (SAXS) on a HECUS S3-MICRO-PIX diffractometer (Hecus X-Ray Systems, Graz, Austria).
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